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Search Results: Records 1-13 displayed on this page of 13
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Journal Articles

Inverse odd-even staggering in nuclear charge radii and possible octupole collectivity in $$^{217,218,219}$$At revealed by in-source laser spectroscopy

Barzakh, A. E.*; Cubiss, J. G.*; Andreyev, A. N.; Seliverstov, M. D.*; Andel, B.*; Antalic, S.*; Ascher, P.*; Atanasov, D.*; Beck, D.*; Biero$'n$, J.*; et al.

Physical Review C, 99(5), p.054317_1 - 054317_9, 2019/05

https://doi.org/10.1103/PhysRevC.99.054317
 Times Cited Count：15 Percentile：73.32(Physics, Nuclear)

Journal Articles

Vortex charge in the superconducting state

Machida, Masahiko; Koyama, Tomio*

Physica C, 378-381(Part1), p.443 - 447, 2002/12

no abstracts in English

Journal Articles

Depth profiling of oxide-trapped charges in 6H-SiC MOS structures by slant etching method

Saito, Kazunari; Yoshikawa, Masahito; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Takahashi, Yoshihiro*; Onishi, Kazunori*

JAERI-Conf 97-003, p.243 - 248, 1997/03

no abstracts in English

Journal Articles

Precision determination of charge dispersion and distribution in the proton-induced fission of $$^{238}$$U at 13.9MeV excitation

Yokoyama, Akihiko*; ; ; ; ; ; ; Takamiya, Koichi*; Shinohara, Nobuo; Tsukada, Kazuaki; et al.

Z. Phys., A, 356(1), p.55 - 60, 1996/00

no abstracts in English

Journal Articles

Abrupt changes of the characteristics of the proton-induced fission of $$^{238}$$U around 14-MeV excitation

; Yokoyama, Akihiko*; ; ; ; ; ; Takamiya, Koichi*; Shinohara, Nobuo; Tsukada, Kazuaki; et al.

Z. Phys., A, 356(1), p.61 - 70, 1996/00

no abstracts in English

Journal Articles

Test structure for determining the charge distribution in the oxide of MOS structure

Takahashi, Yoshihiro*; Imaki, Shunsaku*; Onishi, Kazunori*; Yoshikawa, Masahito

Proceedings of IEEE 1995 International Coferece on Microelectronic Test Structures, Vol.8, p.243 - 246, 1995/03

no abstracts in English

Journal Articles

The Change of the charge distribution in the oxide layer of MOS structure with NH$$_{3}$$ annealing due to $$gamma$$-ray irradiation; Gate voltage dependence

Imaki, Shunsaku*; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*

Heisei-7-Nendo Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Rombunshu, 0, p.151 - 152, 1995/00

no abstracts in English

Journal Articles

Evaluation of distributed charge in the insulators of MNOS structure by slanted etching method

; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*

Heisei-7-Nendo Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Rombunshu, 0, p.153 - 154, 1995/00

no abstracts in English

Journal Articles

Evaluation of the charge distribution in the oxide of MOS structure before and after $$gamma$$-ray radiation

; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*

Denshi Joho Tsushin Gakkai Gijutsu Kenkyu Hokoku, 93(172), p.23 - 27, 1993/07

no abstracts in English

Journal Articles

Evaluation of charge distribution in insulators by means of slanted etching

Imaki, Shunsaku*; ; Takahashi, Yoshihiro*; Yoshikawa, Masahito; Onishi, Kazunori*

Heisei-5-Nendo (Dai-37-Kai) Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Koen Rombunshu; Zairyo, Bussei, p.135 - 136, 1993/00

no abstracts in English

Journal Articles

Ionic charge of ions in plasma generated at electron beam evaporation source

Shibata, Takemasa; Ogura, Koichi; Oba, Hironori

Shinku, 36(12), p.928 - 931, 1993/00

https://doi.org/10.3131/jvsj.36.928

no abstracts in English

Journal Articles

Statistical emission of complex fragments produced in the reaction $$^{37}$$Cl + $$^{68}$$Zn

Nagame, Yuichiro; Ikezoe, Hiroshi; ; ; Sekine, Toshiaki; ; ; Ideno, K.; Yokoyama, Akihiko*; ; et al.

Nuclear Physics A, 510, p.518 - 532, 1990/00

https://doi.org/10.1016/0375-9474(90)90064-S
 Times Cited Count：10 Percentile：56.29(Physics, Nuclear)

no abstracts in English

Journal Articles

Radiochemistry of nuclear fission

Umezawa, Hirokazu

Kagaku, 19(7), p.681 - 685, 1964/00

https://ci.nii.ac.jp/naid/40017541812

no abstracts in English

13 (Records 1-13 displayed on this page)
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