JOPSS - Search Results

Journal Articles

Relationship between the current direction in the inversion layer and the electrical characteristics of metal-oxide-semiconductor field effect transistors on 3C-SiC

Oshima, Takeshi; Lee, K. K.; Ishida, Yuki*; Kojima, Kazutoshi*; Tanaka, Yasunori*; Takahashi, Tetsuo*; Yoshikawa, Masahito; Okumura, Hajime*; Arai, Kazuo*; Kamiya, Tomihiro

Materials Science Forum, 457-460(Part2), p.1405 - 1408, 2004/06

The electrical characteristics of cubic silicon carbide (3C-SiC) Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) with the current direction in the inversion layer perpendicular to [-110] ([-110]-perpendicular MOSFETs) were compared to those of 3C-SiC MOSFETs with the current direction in the inversion layer parallel to [-110] ([-110]-parallel MOSFETs). The threshold voltage (V $_{T}$ ) for both MOSFETs shows -0.5 V although enhancement type MOSFETs were designed. The values of channel mobility which was estimated from linear region of drain current (I $_{D}$ ) - drain voltage (V $_{D}$ ) curves are 230 cm $^{2}$ /Vs for [-110]-perpendicular MOSFETs and 215 cm $^{2}$ /Vs for [-110]-parallel MOSFETs, indicating no significant difference between both MOSFETs. The value of I $_{D}$ for [-110]-perpendicular MOSFETs is of order of 10-8 A at V $_{D}$ = 10V and gate voltage (V $_{G}$ ) of -2V. However, for [-110]-parallel MOSFETs, I $_{D}$ shows of order of -10-6 A at V $_{D}$ = 10V and V $_{G}$ = -2V.

Journal Articles

The Electrical characteristics of metal-oxide-semiconductor field effect transistors fabricated on cubic silicon carbide

Oshima, Takeshi; Lee, K. K.; Ishida, Yuki*; Kojima, Kazutoshi*; Tanaka, Yasunori*; Takahashi, Tetsuo*; Yoshikawa, Masahito; Okumura, Hajime*; Arai, Kazuo*; Kamiya, Tomihiro

Japanese Journal of Applied Physics, Part 2, 42(6B), p.L625 - L627, 2003/06

https://doi.org/10.1143/JJAP.42.L625

Times Cited Count：40 Percentile：77.53(Physics, Applied)

The n-channel Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs) were fabricated on cubic silicon carbide (3C-SiC) epitaxial layers grown on 3C-SiC substrates. The gate oxide of the MOSFETs was formed using pyrogenic oxidation at 1100 $^{circ}$ C. The 3C-SiC MOSFETs showed enhancement type behaviors after annealing at 200 $^{circ}$ C for 30 min in argon atmosphere. The maximum value of the effective channel mobility of the 3C-SiC MOSFETs was 260 cm $^{2}$ /Vs. The leakage current of gate oxide was of a few tens of nA/cm $^{2}$ at an electric field range below 8.5 MV/cm, and breakdown began around 8.5 MV/cm.

Journal Articles

Characterizatin of Au Schottky contacts on p-type 3C-SiC grown by low pressure chemical vapor deposition

Kojima, Kazutoshi; Yoshikawa, Masahito; Oshima, Takeshi; Ito, Hisayoshi; Okada, Sohei

Materials Science Forum, 338-342, p.1239 - 1242, 2000/00

no abstracts in English

Journal Articles

Effects of steam annealing on electrical characteristics of 3C-SiC metal-oxide-semiconductor structures

Yoshikawa, Masahito; Kojima, Kazutoshi; Oshima, Takeshi; Ito, Hisayoshi; Okada, Sohei; Ishida, Yuki*

Materials Science Forum, 338-342, p.1129 - 1132, 2000/00

no abstracts in English

Journal Articles

Study of residual defects in ion-implanted and subsequently annealed 3C-SiC

Oshima, Takeshi; Ito, Hisayoshi; Uedono, Akira*; Suzuki, Ryoichi*; Ishida, Yuki*; Takahashi, Tetsuo*; Yoshikawa, Masahito; Kojima, Kazutoshi; Odaira, Toshiyuki*; Nashiyama, Isamu; et al.

Denshi Gijutsu Sogo Kenkyujo Iho, 62(10-11), p.469 - 476, 1999/00

no abstracts in English

Journal Articles

Silicon vacancies in 3C-SiC observed by positron lifetime and electron spin resonance

Kawasuso, Atsuo; Morishita, Norio; Oshima, Takeshi; Okada, Sohei; Ito, Hisayoshi; Yoshikawa, Masahito; Nashiyama, Isamu; Yoshida, Sadafumi*; Okumura, Hajime*

Applied Physics A, 67(2), p.209 - 212, 1998/00

https://doi.org/10.1007/s003390050759

Times Cited Count：47 Percentile：84.67(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Study of thermal annealing of vacancies in ion implanted 3C-SiC by positron annihilation

Oshima, Takeshi; Uedono, Akira*; Ito, Hisayoshi; Abe, Koji*; Suzuki, Ryoichi*; ; Aoki, Yasushi; Tanigawa, Shoichiro*; Yoshikawa, Masahito; Mikado, Tomohisa*; et al.

Mater. Sci. Forum, 264-268, p.745 - 748, 1998/00

no abstracts in English

Journal Articles

Characterization of residual defects in cubic silicon carbide subjected to hot-implantation and subsequent annealing

Ito, Hisayoshi; Oshima, Takeshi; Aoki, Yasushi; Abe, Koji*; Yoshikawa, Masahito; Nashiyama, Isamu; Okumura, Hajime*; Yoshida, Sadafumi*; Uedono, Akira*; Tanigawa, Shoichiro*

Journal of Applied Physics, 82(11), p.5339 - 5347, 1997/12

https://doi.org/10.1063/1.366301

Times Cited Count：13 Percentile：57.14(Physics, Applied)

no abstracts in English

Journal Articles

Annealing properties of defects in ion-implanted 3C-SiC studied using monoenergetic positron beams

Uedono, Akira*; Ito, Hisayoshi; Oshima, Takeshi; Suzuki, Ryoichi*; ; Tanigawa, Shoichiro*; Aoki, Yasushi; Yoshikawa, Masahito; Nashiyama, Isamu; Mikado, Tomohisa*; et al.

Japanese Journal of Applied Physics, Part 1, 36(11), p.6650 - 6660, 1997/11

https://doi.org/10.1143/JJAP.36.6650

Times Cited Count：16 Percentile：62.92(Physics, Applied)

no abstracts in English

Journal Articles

Positron annihilation studies of defects in 3C-SiC hot-implanted with nitrogen and aluminum ions

Ito, Hisayoshi; Uedono, Akira*; Oshima, Takeshi; Aoki, Yasushi; Yoshikawa, Masahito; Nashiyama, Isamu; Tanigawa, Shoichiro*; Okumura, Hajime*; Yoshida, Sadafumi*

Applied Physics A, 65(3), p.315 - 323, 1997/00

https://doi.org/10.1007/s003390050585

Times Cited Count：16 Percentile：62.92(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Thermal annealing of interface traps and trapped charges induced by irradiation in oxides of 3C-SiC metal-oxide-semiconductor structures

Yoshikawa, Masahito; Nemoto, N.*; Ito, Hisayoshi; Okumura, Hajime*; ; Yoshida, Sadafumi*; Nashiyama, Isamu

Mater. Sci. Eng., B, 47(3), p.218 - 223, 1997/00

https://doi.org/10.1016/S0921-5107(97)00034-2

Times Cited Count：1 Percentile：11.51(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Intrinsic defects in cubic silicon carbide

Ito, Hisayoshi; Kawasuso, Atsuo; Oshima, Takeshi; Yoshikawa, Masahito; Nashiyama, Isamu; Tanigawa, Shoichiro*; ; Okumura, Hajime*; Yoshida, Sadafumi*

Physica Status Solidi (A), 162, p.173 - 198, 1997/00

https://doi.org/10.1002/1521-396X(199707)162:1<173::AID-PSSA173>3.0.CO;2-W

Times Cited Count：132 Percentile：97.83(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Defects in ion-implanted 3C-SiC probed by a monoenergetic positron beam

Uedono, Akira*; Ito, Hisayoshi; Oshima, Takeshi; Aoki, Yasushi; Yoshikawa, Masahito; Nashiyama, Isamu; Okumura, Hajime*; Yoshida, Sadafumi*; ; ; et al.

Japanese Journal of Applied Physics, Part 1, 35(12A), p.5986 - 5990, 1996/12

no abstracts in English

Journal Articles

Effects of gamma-ray irradiation and thermal annealing on electrical characteristics of SiC MOSFETs

Oshima, Takeshi; Yoshikawa, Masahito; Ito, Hisayoshi; Takahashi, Tetsuo*; Okumura, Hajime*; Yoshida, Sadafumi*; Nashiyama, Isamu

Silicon Carbide and Related Materials 1995 (Institute of Physics Conf. Series,No. 142), 0, p.801 - 804, 1996/00

no abstracts in English

Journal Articles

Effects of gamma-ray irradiation on formation of oxide-trapped charges in SiC MOS capacitors

Yoshikawa, Masahito; Ito, Hisayoshi; Oshima, Takeshi; Nashiyama, Isamu; Okumura, Hajime*; Yoshida, Sadafumi*

Silicon Carbide and Related Materials 1995 (Institute of Physics Conf. Series,No. 142), p.741 - 744, 1996/00

no abstracts in English

Journal Articles

Thermal annealing effects on build-up of oxide trapped charge in -ray irradiated 3C-SiC MOS structure

Nemoto, Norio*; Yoshikawa, Masahito; Nashiyama, Isamu; Yoshida, Sadafumi*; Onishi, Kazunori*

Heisei-5-Nendo (Dai-37-Kai) Nihon Daigaku Riko Gakubu Gakujutsu Koenkai Koen Rombunshu; Zairyo, Bussei, p.149 - 150, 1993/00

no abstracts in English

Journal Articles

Characterization of defects in As-grown and electron-irradiated 3C-SiC epilayers by using slow positrons

Ito, Hisayoshi; Yoshikawa, Masahito; Nashiyama, Isamu; L.Wei*; ; ; Okumura, Hajime*; Yoshida, Sadafumi*

Mater. Sci. Forum, 117-118, p.501 - 506, 1993/00

no abstracts in English

Journal Articles

Gamma-ray irradiation effects on cubic silicon carbide metal-oxide-semiconductor structure

Yoshikawa, Masahito; Morita, Yosuke; Ito, Hisayoshi; Nashiyama, Isamu*; ; Okumura, Hajime*; Yoshida, Sadafumi*

Amorphous and Crystalline Silicon Carbide IV, p.393 - 398, 1992/00

no abstracts in English

Journal Articles

Effects of gamma-ray irradiation on cubic silicon carbide metal-oxide-semiconductor structure

Yoshikawa, Masahito; Ito, Hisayoshi; Morita, Yosuke; Nashiyama, Isamu*; ; Okumura, Hajime*; Yoshida, Sadafumi*

Journal of Applied Physics, 70(3), p.1309 - 1312, 1991/08

https://doi.org/10.1063/1.349587

Times Cited Count：41 Percentile：85.37(Physics, Applied)

no abstracts in English

Journal Articles

Effects of gamma-ray radiation on 3C-SiC MOS structure

Yoshikawa, Masahito; Morita, Yosuke; Ito, Hisayoshi; ; Nashiyama, Isamu*; Yoshida, Sadafumi*

EIM-90-130, p.47 - 55, 1990/12

no abstracts in English

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Relationship between the current direction in the inversion layer and the electrical characteristics of metal-oxide-semiconductor field effect transistors on 3C-SiC

The Electrical characteristics of metal-oxide-semiconductor field effect transistors fabricated on cubic silicon carbide

Characterizatin of Au Schottky contacts on p-type 3C-SiC grown by low pressure chemical vapor deposition

Effects of steam annealing on electrical characteristics of 3C-SiC metal-oxide-semiconductor structures

Study of residual defects in ion-implanted and subsequently annealed 3C-SiC

Silicon vacancies in 3C-SiC observed by positron lifetime and electron spin resonance

Study of thermal annealing of vacancies in ion implanted 3C-SiC by positron annihilation

Characterization of residual defects in cubic silicon carbide subjected to hot-implantation and subsequent annealing

Annealing properties of defects in ion-implanted 3C-SiC studied using monoenergetic positron beams

Positron annihilation studies of defects in 3C-SiC hot-implanted with nitrogen and aluminum ions

Thermal annealing of interface traps and trapped charges induced by irradiation in oxides of 3C-SiC metal-oxide-semiconductor structures

Intrinsic defects in cubic silicon carbide

Defects in ion-implanted 3C-SiC probed by a monoenergetic positron beam

Effects of gamma-ray irradiation and thermal annealing on electrical characteristics of SiC MOSFETs

Effects of gamma-ray irradiation on formation of oxide-trapped charges in SiC MOS capacitors

Thermal annealing effects on build-up of oxide trapped charge in -ray irradiated 3C-SiC MOS structure

Characterization of defects in As-grown and electron-irradiated 3C-SiC epilayers by using slow positrons

Gamma-ray irradiation effects on cubic silicon carbide metal-oxide-semiconductor structure

Effects of gamma-ray irradiation on cubic silicon carbide metal-oxide-semiconductor structure

Effects of gamma-ray radiation on 3C-SiC MOS structure