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Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Tanaka, Hitoshi*; Takao, Masaru*; Takeuchi, Masao*; Matsushita, Tomohiro*; Aoyagi, Hideki*
JAERI-Tech 2005-027, 29 Pages, 2005/05
We measured the orbit fluctuation caused by APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring by using the developed real time measurement system of electron and photon beam position monitors. We quantitatively found two characteristic fluctuations correlating with the ID23 motion by wavelet transform which is a kind of frequency analysis. One originates from the variation of error field during the ID drive. The other originates from the stray magnetic field leaked from the servomotors for the phase drive. Using these results, we tried to get rid of the effect of error fields on the beam orbit by the precise feed-forward correction table and the stray field shield. Consequently we succeeded in suppressing the orbit fluctuation down to sub-micron during the gap drive, which is observed by photon beam position monitors installed in downstream 20m from each light source point.
Agui, Akane; Mizumaki, Masaichiro*; Matsushita, Tomohiro*; Kawamura, Naomi*; Nakatani, Takeshi
Physica Scripta, T115, p.611 - 613, 2005/00
no abstracts in English
Tanaka, Masahito*; Nakagawa, Kazumichi*; Agui, Akane; Fujii, Kentaro; Yokoya, Akinari
Physica Scripta, T115, p.873 - 876, 2005/00
no abstracts in English
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Takeuchi, Masao*; Aoyagi, Hideki*; Tanaka, Hitoshi*
JAERI-Tech 2004-013, 16 Pages, 2004/12
We observed two characteristic electron orbit fluctuations caused when the phase of ID23 (APPLE-2 type undulator) installed at SPring-8 was driven. One was caused by the variation of magnetic error filed of ID23 when the phase was driven. The other was caused by the noise from the phase drive system which adoped AC servomotors. We measured these orbit fluctuations synchronized with the phase motion using the real-time electron beam position measurement system. The part of the orbit fluctuation was supressed by the correction table which was made referring to the obtained data.
Yoshigoe, Akitaka; Moritani, Kosuke; Teraoka, Yuden
Japanese Journal of Applied Physics, Part 1, 42(7B), p.4676 - 4679, 2003/07
Times Cited Count:1 Percentile:5.54(Physics, Applied)Many studies of the thermal oxidation on Si(001) surface by O gas have been already carried out from both experimental and theoretical methods. The oxidation reaction kinetics have been studied by real time photoemission spectroscopy. Most reports, however, were performed at a fixed electron binding energy. We present the study of initial stage of thermal oxidation on Si(001) surface at the O
pressure of 1x10
Pa performed by real time O-1s synchrotron radiation photoemission spectroscopy.All experiments were performed at SUREAC2000 at BL23SU in the SPring-8. The pure O
gas of 1x10
Pa was fed into the reaction analysis chember through a variable leak valve. The results of oxygen uptake curves obtained by O-1s peak area intensities at the substrate temperature of 855K and 955K indicate that the Langmuir adsorption model provided the best fitting result for the 855K oxidation, whereas the oxidation at 955K was well explained by the autocatalytic reaction model.
Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Agui, Akane; Yoshigoe, Akitaka; Takeuchi, Masao*; Aoyagi, Hideki*; Okuma, Haruo*
JAERI-Tech 2003-048, 29 Pages, 2003/05
no abstracts in English
Kawatsura, Kiyoshi*; Yamaoka, Hitoshi*; Oura, Masaki*; Hayaishi, T.*; Sekioka, T.*; Agui, Akane; Yoshigoe, Akitaka; Koike, Fumihiro*
Journal of Physics B; Atomic, Molecular and Optical Physics, 35(20), p.4147 - 4153, 2002/10
Times Cited Count:21 Percentile:64.80(Optics)no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Fujii, Kentaro; Yokoya, Akinari
JAERI-Tech 2002-064, 57 Pages, 2002/08
no abstracts in English
Yoshigoe, Akitaka; Teraoka, Yuden
Applied Surface Science, 190(1-4), p.60 - 65, 2002/05
Times Cited Count:10 Percentile:47.25(Chemistry, Physical)no abstracts in English
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*
Hoshako, 15(5), p.303 - 307, 2002/05
no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Matsushita, Tomohiro*; Saito, Yuji; Mizumaki, Masaichiro*; Yokoya, Akinari; Tanaka, Hitoshi*; Miyahara, Yoshikazu*; Shimada, Taihei; et al.
Hoshako, 14(5), p.339 - 348, 2001/11
no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Saito, Yuji; Teraoka, Yuden; Yokoya, Akinari
JAERI-Tech 2001-043, 64 Pages, 2001/07
no abstracts in English
Yoshigoe, Akitaka; Teraoka, Yuden
JAERI-Tech 2001-026, 17 Pages, 2001/03
no abstracts in English
Yoshigoe, Akitaka; Agui, Akane; Nakatani, Takeshi*; Matsushita, Tomohiro*; Saito, Yuji; Yokoya, Akinari
Journal of Synchrotron Radiation, 8(Part2), p.502 - 504, 2001/03
no abstracts in English
Teraoka, Yuden; Yoshigoe, Akitaka
Applied Surface Science, 169-170, p.738 - 741, 2001/01
Times Cited Count:70 Percentile:92.04(Chemistry, Physical)no abstracts in English
Oura, Masaki*; Yamaoka, Hitoshi*; Kawatsura, Kiyoshi*; Kimata, Junichi*; Hayaishi, T.*; Takahashi, Takehisa*; Koizumi, Tetsuo*; Sekioka, T.*; Terasawa, Michitaka*; Ito, Yo*; et al.
Physical Review A, 63(1), p.014704_1 - 014704_4, 2001/01
Times Cited Count:15 Percentile:59.32(Optics)no abstracts in English
Teraoka, Yuden; Yoshigoe, Akitaka*
Japanese Journal of Applied Physics, 38(Suppl.38-1), p.642 - 645, 1999/00
Times Cited Count:17 Percentile:60.15(Physics, Applied)no abstracts in English
Teraoka, Yuden; Yokoya, Akinari; Saito, Yuji; Nakatani, Takeshi; Okane, Tetsuo; Yoshigoe, Akitaka; Fujimori, Shinichi; ; Shimada, Taihei*; ; et al.
Dai-2-Kai SPring-8 Shinpojium Houbunsyu, p.215 - 239, 1998/00
no abstracts in English
Teraoka, Yuden
no journal, ,
no abstracts in English
Teraoka, Yuden
no journal, ,
no abstracts in English