3-45MeV/u ion beam dosimetry using thin film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*

Radiation Physics and Chemistry, 68(6), p.975 - 980, 2003/12

https://doi.org/10.1016/j.radphyschem.2003.02.001

Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than 5%(1) including uncertainty in fluence measurement(2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10 m, respectively.