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Suzuki, Tomoya*; Otsubo, Ukyo*; Ogata, Takeshi*; Shiwaku, Hideaki; Kobayashi, Toru; Yaita, Tsuyoshi; Matsuoka, Mitsuaki*; Murayama, Norihiro*; Narita, Hirokazu*
Separation and Purification Technology, 308, p.122943_1 - 122943_7, 2023/03
Times Cited Count：3 Percentile：17.46(Engineering, Chemical)HNO
leaching is used in recycling Pd metal from spent products that primarily contain Ag, and most Pd residues are separated from solutions containing Ag(I). However, a small amount of Pd(II) often remains in these Ag(I) solutions. Therefore, the separation of Pd(II) and Ag(I) in HNO solutions is essential to promote efficient Pd recycling. In this study, the separation of Pd(II) and Ag(I) in HNO solutions was investigated using four N-donor-type adsorbents functionalized with amine (R-Amine), iminodiacetic acid (R-IDA), pyridine (R-Py), or bis-picolylamine (R-BPA). R-Amine, R-IDA, and R-Py selectively adsorbed Pd(II) over Ag(I), Cu(II), Ni(II), and Fe(III) from HNO solutions (0.3-7 M), but R-Amine exhibited a lower Pd adsorption efficiency. In contrast, 
90% of Pd(II), Ag(I), and Cu(II) were adsorbed by R-BPA over the entire range of HNO concentrations. Structural analyses of the adsorbed metal ions using Fourier transform infrared spectroscopy and extended X-ray absorption fine structure spectroscopy revealed the separation mechanisms of the N-donor-type adsorbents. Pd(II) adsorption on R-IDA, R-Py, and R-BPA occurred via Pd(II) coordination of the functional groups (iminodiacetic acid, pyridine, and bis-picolylamine, respectively), whereas that on R-Amine occurred via anion exchange of NO
with [Pd(NO)
]
. The coordinative adsorption mechanisms resulted in the higher Pd(II) adsorption behaviors of R-IDA, R-Py, and R-BPA. HCl (5.0 M) and thiourea (0.1 M) eluents desorbed 83% of Pd(II) from R-IDA and 95% from R-Py, respectively. R-Py was the most effective Pd(II) adsorbent based on adsorption selectivity and desorption efficiency.
decay of 
USun, M. D.*; Liu, Z.*; Huang, T. H.*; Zhang, W. Q.*; Andreyev, A. N.; Ding, B.*; Wang, J. G.*; Liu, X. Y.*; Lu, H. Y.*; Hou, D. S.*; et al.
Physics Letters B, 800, p.135096_1 - 135096_5, 2020/01
Times Cited Count：12 Percentile：74.96(Astronomy & Astrophysics)Strasser, P.*; Abe, Mitsushi*; Aoki, Masaharu*; Choi, S.*; Fukao, Yoshinori*; Higashi, Yoshitaka*; Higuchi, Takashi*; Iinuma, Hiromi*; Ikedo, Yutaka*; Ishida, Katsuhiko*; et al.
EPJ Web of Conferences, 198, p.00003_1 - 00003_8, 2019/01
Times Cited Count：15 Percentile：98.44(Quantum Science & Technology)
-irradiated graphite surfaces using photon-stimulated desorption spectroscopySekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Nath, K. G.
Surface and Interface Analysis, 38(4), p.352 - 356, 2006/04
Times Cited Count：3 Percentile：6.96(Chemistry, Physical)We investigated the orientation nature at the top-most layers of F-irradiated graphite using polarization dependent near-edge X-ray absorption fine structure (NEXAFS) spectroscopy which incorporates partial electron yield (PEY) detection and photon-stimulated ion desorption (PSID) techniques. The fluorine K-edge NEXAFS spectra conducted in PEY mode show no significant dependence on polarization angles. In contrast, NEXAFS spectra recorded in F ion yield mode show enhanced yields at a feature of 
689.4 eV assigned as a 
*(C-F) state relevant to =C-F sites, which depend on polarization angles. The C-F bonds prefer relatively tilting down the surface at the top-most layer, while the C-F bonds are randomly directed at deeper regions. We conclude that the difference in the orientation structures between the top surface and bulk is reflected in the NEXAFS recorded in the two different detection modes. It was also found that H- and F
- PSID NEXAFS spectra are helpful in understanding desorption mechanism, thus in analysing NEXAFS data.
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro; Baba, Yuji; Imamura, Motoyasu*; Matsubayashi, Nobuyuki*; Shimada, Hiromichi*
Surface Science, 593(1-3), p.303 - 309, 2005/11
Times Cited Count：5 Percentile：25.30(Chemistry, Physical)no abstracts in English
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Wu, G.*; Kitajima, Yoshinori*
Surface Science, 593(1-3), p.310 - 317, 2005/11
Times Cited Count：2 Percentile：11.14(Chemistry, Physical)Using a newly developed rotatable time-of-flight mass spectrometer(R-TOF-MS) and polarized synchrotron radiation, orientation effect on fragmentation and desorption pathways occurring at the top-most layers of molecular solids have been investigated. Reported will be polarization-angle dependencies of TOF mass spectra, high-resolution electron- and ion-NEXAFS in condensed chlorobenzene.
)SiX (X = F, Cl, Br, I, NCO) as studied using NEXAFS spectroscopySekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Nath, K. G.*; Uddin, M. N.*
Journal of Physics; Condensed Matter, 17(36), p.5453 - 5466, 2005/09
Times Cited Count：1 Percentile：5.90(Physics, Condensed Matter)The orientation nature of multilayer organosilicon compounds has been investigated by measuring the dependence of the Si K-shell near-edge X-ray absorption fine structures (NEXAFS) on the polarization angle. Two approaches helped to elucidate the orientation mechanism: the substitution effect and the deposition-rate dependence. The orientation angles of Si-X bond axes were obtained for trimethylsilyl halides, (CH)SiX (X =F Cl Br I NCO, condensed on Cu(111) at a low (82 K) temperature: the angles are 60, 73, 61, 55, and 55 degrees with respect to the surface normal, for X =F, Cl, Br, I, and NCO, respectively. Chloride (X =Cl) produces the most parallel tilt angle. The specific orientation nature of chloride is attributed to its strong dipole moment as well as the regular tetrahedron shape of the molecule. The molecular volumes calculated verify this view. Furthermore, deposition rates are found to greatly influence the growth manner: namely, high deposition rates led to a slightly perpendicular orientation of Si-X bond axis.
Nath, K. G.; Shimoyama, Iwao; Sekiguchi, Tetsuhiro; Baba, Yuji
Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.323 - 326, 2005/06
Times Cited Count：5 Percentile：26.99(Spectroscopy)The effect of laser annealing on electronic atructures and molecular orientation for poly(dimethylsilane), {PDMS, [Si(CH)
]
} has been studied by synchrotron radiation photoemission and photoabsorption spectroscopy. Prior to annealing, PDMS powder was mounted on the basal plane of highly oriented pyrolytic graphite. Both Si 1s X-ray photoemission spectroscopy and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy at Si 1s edge show that electronic structures have been modified due to annealing. Furthermore, the angle-dependent NEXAFS spectra clearly indicate that the annealed products maintain a specific orientation. Interestingly, no such kind of orientation is present in as-received PDMS powder as no angle-dependency is observed before annealing.
Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao
Surface Review and Letters, 9(1), p.77 - 83, 2002/02
Times Cited Count：4 Percentile：25.47(Chemistry, Physical)no abstracts in English
Oba, Masaki; Wakaida, Ikuo; Miyabe, Masabumi
Japanese Journal of Applied Physics, Part 1, 40(1), p.357 - 358, 2001/01
Times Cited Count：1 Percentile：5.97(Physics, Applied)no abstracts in English
Ideno, K.
Proc. of Int. Conf. on Neutrons in Research and Industry, 2867, p.398 - 403, 1996/06
no abstracts in English
Okubo, Makio
Physical Review C, 53(3), p.1325 - 1335, 1996/03
Times Cited Count：6 Percentile：37.69(Physics, Nuclear)no abstracts in English
Fe
Al
at 65KS.Ridwan*; H.Mujamilah*; M.Gunawan*; P.Marsongkohadi*; Q.W.Yan*; P.L.Zhang*; X.D.Sun*; Z.H.Cheng*; Minakawa, Nobuaki;
Journal of the Physical Society of Japan, 65(2), p.348 - 350, 1996/02
Times Cited Count：1 Percentile：36.26(Physics, Multidisciplinary)no abstracts in English
fine-structure components of Ti XXII in the JT-60 tokamak plasmaKubo, Hirotaka; Sakasai, Akira; Koide, Yoshihiko; Sugie, Tatsuo
Physical Review A, 46(12), p.7877 - 7881, 1992/12
Times Cited Count：10 Percentile：54.01(Optics)no abstracts in English
Akaoka, Katsuaki; Oba, Masaki; Wakaida, Ikuo; Miyabe, Masabumi; Arisawa, Takashi
Laser Advanced Materials Processing,Vol. 2, p.1233 - 1237, 1992/06
no abstracts in English
M
CuO
(M=Sr,Ba and Ca) studied by electron energy loss spectroscopy; ; ; ; Hojo, Kiichi; Furuno, Shigemi
Mater. Trans. JIM, 32(9), p.872 - 874, 1991/00
Times Cited Count：1 Percentile：58.06(Materials Science, Multidisciplinary)no abstracts in English
5d 
G-4f6pH in PrII by collinear laser-ion-beam spectroscopy; Nakahara, Yoshinori; ; ; ;
Journal of the Physical Society of Japan, 59(12), p.4208 - 4210, 1990/12
Times Cited Count：11 Percentile：72.26(Physics, Multidisciplinary)no abstracts in English
Fujimura, Takashi;
Journal of Chemical Physics, 65(6), p.2333 - 2338, 1976/06
Times Cited Count：4no abstracts in English
Sasuga, Tsuneo; Araki, Kunio; ; Kuriyama, Isamu
Reports on Progress in Polymer Physics in Japan, 15, p.515 - 518, 1972/00
no abstracts in English
and hyperfine structure of absorption spectrumJournal of the Physical Society of Japan, 18(7), p.925 - 935, 1963/00
Times Cited Count：20no abstracts in English
