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Toyokawa, Hidenori*; Saji, Choji*; Kawase, Morihiro*; Wu, S.*; Hurukawa, Yukihito*; Kajiwara, Kentaro*; Sato, Masugu*; Hirono, Toko*; Shiro, Ayumi*; Shobu, Takahisa; et al.
Journal of Instrumentation (Internet), 12(1), p.C01044_1 - C01044_7, 2017/01
Times Cited Count:7 Percentile:29.63(Instruments & Instrumentation)We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200 micro-meter by 200 micro-meter and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photon-counting mode selecting X-ray energy with the window comparator and stable operation was realized at 20
C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position.
Li glass scintillator for wide energy rangeKim, E.; Endo, Akira; Yamaguchi, Yasuhiro; Yoshizawa, Michio; Nakamura, Takashi*; Rasolonjatovo, D. R. D.*
Nihon Genshiryoku Gakkai Wabun Rombunshi, 1(3), p.317 - 319, 2002/09
no abstracts in English
Kim, E.; Endo, Akira; Yamaguchi, Yasuhiro
Journal of Nuclear Science and Technology, 39(Suppl.2), p.693 - 696, 2002/08
no abstracts in English
Kim, E.; Endo, Akira; Yamaguchi, Yasuhiro; Yoshizawa, Michio; Tanaka, Susumu; Shiomi, T.*; Nakamura, Takashi*; Rasolonjatovo, D. R. D.*
JAERI-Tech 2002-041, 73 Pages, 2002/03
no abstracts in English