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Journal Articles

AFM observation of nanosized SiC dots prepared by ion beam deposition

Xu, Y.; Narumi, Kazumasa; Miyashita, Kiyoshi*; Naramoto, Hiroshi

Surface and Interface Analysis, 35(1), p.99 - 103, 2003/01

https://doi.org/10.1002/sia.1502
 Times Cited Count：9 Percentile：24.52(Chemistry, Physical)

no abstracts in English

Journal Articles

Modification of carbon related films with ion beams

Naramoto, Hiroshi; Xu, Y.; Narumi, Kazumasa; Zhu, X.; Vacik, J.; Yamamoto, Shunya; Miyashita, Kiyoshi*

JAERI-Review 2001-039, TIARA Annual Report 2000, p.183 - 185, 2001/11

https://doi.org/10.11484/jaeri-review-2001-039

no abstracts in English

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