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Sn
S submicrometer-wide wire devices塩貝 淳一*; 池田 絢哉*; 藤原 宏平*; 関 剛斎*; 高梨 弘毅; 塚崎 敦*
Physical Review Materials (Internet), 6(11), p.114203_1 - 114203_9, 2022/11
被引用回数：5 パーセンタイル：34.44(Materials Science, Multidisciplinary)Microscopic understanding of magnetization switching via domain nucleation and/or domain-wall propagation is fundamental knowledge for developing magnetic and spintronic devices. Here, we explore the underlying mechanism of the large coercivity of the magnetic Weyl semimetal CoSnS thin films, which is roughly ten times larger than that of CoSnS bulk single crystal, by measuring Hall resistance in constricted wire devices. The discretized steplike variations appear in the hysteresis loops of the Hall resistance in 0.6 micrometers wide and narrower devices, indicating that the size of the reversed magnetic domain is comparable to the active area of the Hall devices. By counting the number of discrete features, the average diameter of the reversed magnetic domain is estimated to be 80 nm. Individually, the diameter of the reversed domain nucleus is evaluated to be roughly 2 nm. Considering the difference in the diameters of the reversed magnetic domain and the reversed domain nucleus, we ascribed the large coercivity of the CoSnS thin films to a large nucleation field owing to the uniform crystallinity within grains and strong domain-wall pinning at grain boundaries specific to the thin films. With the large nucleation field in the films, an engineering of the domain-wall pinning sites is a promising approach to control the nucleation, manipulation, and detection of the single domain wall in CoSnS thin-film devices.
稲見 俊哉*; 菖蒲 敬久; 石井 賢司*
IEEE Transactions on Magnetics, 57(3, Part 2), p.6400105_1 - 6400105_5, 2021/03
被引用回数：0 パーセンタイル：0.00(Engineering, Electrical & Electronic)Although the observation of magnetic domains well below the surface of a sample appears to be relatively easy, in reality, magnetic domains inside metallic samples have not been investigated in detail due to a lack of adequate techniques. Non-resonant magnetic X-ray diffraction (NRMXRD) is a candidate for such 3-D magnetic microscopy. A relatively small focus size of less than 100 nm and a relatively long attenuation length of more than 100 
m can be obtained by using high-energy synchrotron X-rays. However, NRMXRD has a disadvantage in that the magnetic contrast is low. It is known that the magnetic contrast in NRMXRD increases with increasing the total polarization of the incident X-rays. In this feasibility study, we carried out NRMXRD experiments on a metallic iron sample to examine whether the magnetic contrast can be sufficiently enhanced even for high-energy X-rays.
武井 弘次*; 鈴木 淳市; 前田 安*; 森井 幸生
IEEE Transactions on Magnetics, 30(6), p.4029 - 4031, 1994/11
被引用回数：10 パーセンタイル：66.08(Engineering, Electrical & Electronic)高密度磁気記録材料Co-22at.%Crにおいて組成分離に伴う微細磁気構造が存在することを中性子散乱により明らかにした。組成分離は150
Cから400Cの作成基板温度で顕著となる。200Cの基板温度では10nm程度の最も微細な磁気ドメイン構造が観測され、より高密度な磁気記録材料としての応用の可能性を示す。
