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Journal Articles

Identification of small point defect clusters by high resolution electron microscopy

; Izui, Kazuhiko

Point Defects and Defect Interactions in Metals, p.705 - 707, 1982/00

no abstracts in English

Journal Articles

Electron optical conditions for the formation of structure images of silicon oriented in (110)

Japanese Journal of Applied Physics, 19(5), p.799 - 806, 1980/00

https://doi.org/10.1143/JJAP.19.799
 Times Cited Count：3 Percentile：20.43(Physics, Applied)

no abstracts in English

Journal Articles

Crystal structure images of silicon at some elevated voltages

; Izui, Kazuhiko; ; ;

Proc.5th Int.Conf.on High Voltage Electron Microscopy, p.301 - 304, 1977/08

no abstracts in English

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