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Journal Articles

A Multi-reflection time-of-flight mass spectrograph for superheavy nuclei

Schury, P.*; Ito, Yuta; Wada, Michiharu*

Nihon Butsuri Gakkai-Shi, 80(2), p.72 - 78, 2025/02

The multi-reflection time-of-flight mass spectrograph has recently become of great utility in the study of superheavy nuclei. The device efficiently uses each ion and its operation is amenable to the inclusion of a decay detector being coupled into the time-of-flight (TOF) ion impact detector. In this way, TOF-decay correlation can be measured to unambiguously differentiate low-yield radioactive ions from stable molecular ions or dark counts. This will eventually allow the technique to be applied to the study of extremely low-yield nuclei such as those of $$_{113}$$Nh and $$_{115}$$Mc isotopes.

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