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Pyeon, C. H.*; Talamo, A.*; Fukushima, Masahiro
Journal of Nuclear Science and Technology, 57(2), p.133 - 135, 2020/02
Times Cited Count：3 Percentile：96.32(Nuclear Science & Technology)Abderrahmane, A.*; Tashiro, Tatsuya*; Takahashi, Hiroki*; Ko, P. J.*; Okada, Hiroshi*; Sato, Shinichiro; Oshima, Takeshi; Sandhu, A.*
Applied Physics Letters, 104(2), p.023508_1 - 023508_4, 2014/01
Times Cited Count：6 Percentile：26.59(Physics, Applied)The effect of annealing on the magnetoelectrical properties of proton-irradiated micro-Hall sensors at an energy of 380 keV and very high proton fluences was studied. Recovery of the electron mobility and a decrease in the sheet resistance of the annealed micro-Hall sensors, as well as an enhancement in their magnetic sensitivity were reported. Trap removal and an improvement in the crystal quality by removing defects were confirmed through current-voltage measurements and Raman spectroscopy, respectively.
Abderrahmane, A.*; Koide, Shota*; Okada, Hiroshi*; Takahashi, Hiroki*; Sato, Shinichiro; Oshima, Takeshi; Sandhu, A.*
Applied Physics Letters, 102(19), p.193510_1 - 193510_4, 2013/05
Times Cited Count：10 Percentile：40.93(Physics, Applied)The magnetoelectric properties of AlGaN/GaN micro-Hall effect sensors were studied after 380 keV proton irradiation. After irradiation the current-voltage measurements, stability of the magnetic sensitivity of the sensors, and the sheet electron density were degraded with a dramatic decrease of the electron mobility at high temperatures. Raman spectroscopy showed a degradation in the crystalline quality of GaN crystal, but there was no change in the strain.
Meigo, Shinichiro; Nakashima, Hiroshi; Takada, Hiroshi; Kasugai, Yoshimi; Ino, Takashi*; Maekawa, Fujio; Hastings, J.*; Watanabe, Noboru; Oyama, Yukio; Ikeda, Yujiro
JAERI-Data/Code 2001-014, 23 Pages, 2001/03
JAERI-Data-Code-2001-014.pdf:1.55MB
no abstracts in English
and N centers in NaF crystals irradiated with protons at liquid nitrogen temperatureOzawa, K.;
Phys.Lett., 27A(7), p.443 - 444, 1968/00
no abstracts in English
Ozawa, K.; ;
Phys.Lett.,A, 26A(5), p.201 - 202, 1968/00
no abstracts in English
Yamaguchi, Ichiro; Hayakawa, Naohiro
Bulletin of the Chemical Society of Japan, 33(8), p.1128 - 1132, 1960/00
Times Cited Count：18no abstracts in English
