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Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao
Surface Review and Letters, 9(1), p.77 - 83, 2002/02
Times Cited Count:4 Percentile:25.49(Chemistry, Physical)no abstracts in English
Wu, G.; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao
Journal of Synchrotron Radiation, 8(Part.2), p.469 - 471, 2001/03
no abstracts in English
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro; Kitajima, Yoshinori*; Baba, Yuji
Applied Surface Science, 169-170, p.282 - 286, 2001/01
Times Cited Count:8 Percentile:44.14(Chemistry, Physical)Carbon and nitrogen K-shell excitation and dissociation of condensed formamide at 96 K were studied by near edge X-ray absorption fine structure (NEXAFS) recorded by total electron yield (TEY), total ion yield (TIY) and photon-stimulated desorption (PSD) yield of H+ measurements. It was found that electronic transitions from the C1s or the N1s to the *(C-H) and/or (N-H) enhanced ion yield of H+ from the C-H and/or N-H functional group. This selective dissociation indicates that the corresponding unoccupied molecular orbital has an antibonding character of the C-H and/or N-H. To investigate the molecular orientation of condensed formamide, incidence-angle-dependent TEY-NEXAFS spectra were measured. The CNO plane of the adsorbed formamide molecule is determined to be tilted away from the surface by an averaged angle of about 42 degrees.
Sekiguchi, Tetsuhiro; Sekiguchi, Hiromi*; Baba, Yuji
Surface Science, 454-456, p.363 - 368, 2000/05
Times Cited Count:23 Percentile:71.94(Chemistry, Physical)no abstracts in English
Baba, Yuji; Sekiguchi, Tetsuhiro
Journal of Vacuum Science and Technology A, 18(2), p.334 - 337, 2000/03
Times Cited Count:4 Percentile:22.71(Materials Science, Coatings & Films)no abstracts in English
Baba, Yuji; Sekiguchi, Tetsuhiro
Photon Factory Activity Report 1998, P. 34, 1999/11
no abstracts in English
Baba, Yuji; Sekiguchi, Tetsuhiro
Surface Science, 433-435, p.843 - 848, 1999/00
Times Cited Count:6 Percentile:37.36(Chemistry, Physical)no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Surface Science, 402-404, p.115 - 119, 1998/00
Times Cited Count:4 Percentile:26.97(Chemistry, Physical)no abstracts in English
Sekiguchi, Hiromi*; Sekiguchi, Tetsuhiro; Tanaka, Kenichiro*
Journal de Physique, IV, 7, p.499 - 500, 1997/00
no abstracts in English
Baba, Yuji; Sekiguchi, Tetsuhiro
Photon Factory Activity Report 1997, P. 91, 1997/00
no abstracts in English
Baba, Yuji; Yoshii, Kenji; Yamamoto, Hiroyuki; Sasaki, Teikichi; W.Wurth*
Surface Science, 377-379(1-3), p.699 - 704, 1997/00
no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Surface Science, 376(1-3), p.330 - 338, 1997/00
Times Cited Count:25 Percentile:78.17(Chemistry, Physical)no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Journal of Chemical Physics, 105(19), p.8858 - 8864, 1996/11
Times Cited Count:32 Percentile:72.45(Chemistry, Physical)no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Photon Factory Activity Report, (14), P. 146, 1996/00
no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Photon Factory Activity Report, (14), P. 424, 1996/00
no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Surface Science, 357-358, p.302 - 306, 1996/00
Times Cited Count:9 Percentile:49.39(Chemistry, Physical)no abstracts in English
Baba, Yuji; Yoshii, Kenji; Yamamoto, Hiroyuki; Sasaki, Teikichi; W.Wurth*
Photon Factory Activity Report, (13), P. 354, 1995/00
no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Photon Factory Activity Report, (13), P. 353, 1995/00
no abstracts in English
Baba, Yuji; Yoshii, Kenji; Sasaki, Teikichi
Surface Science, 341, p.190 - 195, 1995/00
Times Cited Count:14 Percentile:64.07(Chemistry, Physical)no abstracts in English