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Widmann, M.*; Lee, S.-Y.*; Rendler, T.*; Son, N. T.*; Fedder, H.*; Paik, S.*; Yang, L.-P.*; Zhao, N.*; Yang, S.*; Booker, I.*; et al.
Nature Materials, 14(2), p.164 - 168, 2015/02
被引用回数:594 パーセンタイル:99.64(Chemistry, Physical)Single silicon vacancy (V
) in silicon carbide (SiC) was studied from the point of view of single photon source for quantum computing. The V
centers were created in high purity semi-insulating hexagonal (4H)-SiC by 2 MeV electron irradiation with fluences up to 5
10
/cm
. No subsequent annealing was carried out. A couple of solid immersion lens (SIL) with 20
m diameter were created on samples by ion milling using 40 keV Ga focused ion beam. A typical home-built confocal setup was used after optimizing for emission in the wavelength range around 900 nm. As a result, optically detected electron spin resonance (ODMR) for V
was observed at room temperature (RT). Using ODMR, Rabi oscillations were also observed, and the Rabi frequency increased with increasing applied-magnetic field. In addition, spin relaxation time T
and T
were detected to be 500
s and 160
s, respectively.
A.Li*; H.Huang*; D.Li*; S.Zheng*; H.Du*; S.Zhu*; 岩田 忠夫
Japanese Journal of Applied Physics, 32(3), p.1033 - 1038, 1993/03
被引用回数:8 パーセンタイル:44.03(Physics, Applied)中性子照射したSiについて陽電子寿命測定を行い、100~800
Cにおける欠陥のアニーリングを調べた。陽電子寿命スペクトルの2成分フィッティングを行った。第1成分は完全結晶中のfreeな陽電子及びmonovacancy-substitutional oxygen complexesに捕獲された陽電子の平均に対応し、第2成分はdivacancyまたはdivacancy-substitutional oxygen complexes及びquadrivacancy-substitutional oxygen complexesに捕獲された陽電子の平均に対応するものであることを示した。2成分データをトラッピング模型によって解析し、これらのvacancy型欠陥による陽電子捕獲率(欠陥濃度に比例する)を求めた。これらの欠陥のアニーリングを議論した。