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論文

Defect engineering in silicon carbide; Single photon sources, quantum sensors and RF emitters

Kraus, H.; Simin, D.*; Fuchs, F.*; 小野田 忍; 牧野 高紘; Dyakonov, V.*; 大島 武

Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.176 - 179, 2015/11

Quantum centers in silicon carbide (SiC) have already transcended their former reputation as mere performance-hampering defects. Especially the silicon vacancies, but also other point defects offer a variety of quantum applications, completing and complementing the successful NV centers in diamond. We aim to provide an overview over the research activities on quantum centers in silicon carbide, from fundamental knowledge on the 3/2 spin multiplicity, over microwave emission and single photon sources, to axis-aware magnetic field sensing and temperature sensing. Finally, we discussed creating tailored defects in SiC using different radiation parameters.

論文

Room temperature quantum emission from cubic silicon carbide nanoparticles

Castelletto, S.*; Johnson, B. C.*; Zachreson, C.*; Beke, D.*; Balogh, I.*; 大島 武; Aharonovich, I.*; Gali, A.*

ACS Nano, 8(8), p.7938 - 7947, 2014/08

Single Photon Sources (SPSs) in cubic (3C) Silicon Carbide (SiC) Nano Particles (NPs) were investigated. As a result, photo luminescence (PL) with broad emission at wavelength ranges between 600 and 800 nm was observed from 3C-SiC NPs at room temperature. The second order photon auto-correlation measurements revealed that defect with the PL characteristic is SPSs. The intensity and stability of the PL increased when samples were irradiated with electrons and subsequently annealed at 500 $$^{circ}$$C. From PL measurements at low temperature and theoretical analysis using spin-polarized density functional theory, the defect can be identified as carbon-antisite carbon-vacancy pair (C$$_{Si}$$V$$_{C}$$).

口頭

高温熱処理したSiC中に存在する単一光子源

大島 武; Lohrmann, A.*; Johnson, B. C.*; Castelletto, S.*; 小野田 忍; 牧野 高紘; 武山 昭憲; Klein, J. R.*; Bosi, M.*; Negri, M.*; et al.

no journal, , 

量子スピントロニクスや量子フォトニクスへの応用が期待される炭化ケイ素半導体(SiC)中の単一光子源(SPS)に関して、デバイス作製の際に用いる高温熱処理といったプロセス後にも安定に存在するSPSの探索を行った。共焦点蛍光顕微鏡(CFM)観察の結果、1600$$^{circ}$$C以上での熱処理後も550$$sim$$600nmの波長帯に室温においても高輝度で発光特性を示すSPSが存在することが確認された。加えて、未熱処理のSiC基板のCFM観察を行ったところ、非常に少量ではあるが同様なSPSが存在することも判明したが、発光は不安定であり、数秒間の観察中に発光が消失してしまうことが見いだされた。そこで、熱処理温度(酸素中、5分間)とSPSの発光の安定性の関係を調べたところ、550$$^{circ}$$C以上の熱処理で発光が安定化することが明らかとなった。

口頭

Visible range photoluminescence from single photon sources in 3C, 4H and 6H silicon carbide

Lohrmann, A.*; Castelletto, S.*; Klein, J. R.*; Bosi, M.*; Negri, M.*; Lau, D. W. M.*; Gibson, B. C.*; Prawer, S.*; McCallum, J. C.*; 大島 武; et al.

no journal, , 

The single photon sources (SPSs) in the visible spectral region were fabricated near the surface of semi-insulating (SI) 4H-silicon carbide (SiC), SI 6H-SiC substrates and 3C-SiC epitaxial films by annealing in dry oxygen. The photoluminescence (PL) with high intensity was observed from samples after oxygen annealing above 550 $$^{circ}$$C although blinking characteristics of PL were observed from samples annealed below 550 $$^{circ}$$C. Also, the samples annealed above 550 $$^{circ}$$C showed blinking characteristics after removing oxygen atoms terminating the surface by HF-etching. Therefore, we can conclude that the oxygen termination is important to obtain stable PL characteristics from the SPSs near the surface of SiC.

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