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Journal Articles

Study of chemical etching conditions for alpha-particle detection and visualization using solid state nuclear track detectors

Yamada, Ryohei; Odagiri, Taiki*; Iwaoka, Kazuki*; Hosoda, Masahiro*; Tokonami, Shinji*

Radiation Environment and Medicine, 8(1), p.21 - 25, 2019/02

We evaluate radon/thoron and its progeny concentration using passive-type monitors using CR-39 plates. After exposure, it is necessary to do chemical etching for CR-39 plates. In the present study, we considered shortening of chemical etching time for CR-39 and enlargement of the track diameter (i.e. etch pit diameter) aiming for introduction of automatic counting system in the future. Optimum conditions were determined by changing solution concentration, solution temperature and etching time. As a result, the optimized conditions (concentration, temperature and etching time) were determined to be 8 M NaOH solution, 75 degrees Celsius and 10 hours. This result of etching time showed that the chemical etching was completed in less than half of conventional etching time. Furthermore, it was suggested that shorter etching time would be possible if we do not consider the enlargement of conventional track diameter.

Journal Articles

Development of CdTe pixel detectors combined with an aluminum Schottky diode sensor and photon-counting ASICs

Toyokawa, Hidenori*; Saji, Choji*; Kawase, Morihiro*; Wu, S.*; Hurukawa, Yukihito*; Kajiwara, Kentaro*; Sato, Masugu*; Hirono, Toko*; Shiro, Ayumi*; Shobu, Takahisa; et al.

Journal of Instrumentation (Internet), 12(1), p.C01044_1 - C01044_7, 2017/01

 Times Cited Count:1 Percentile:83.2(Instruments & Instrumentation)

We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200 micro-meter by 200 micro-meter and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photon-counting mode selecting X-ray energy with the window comparator and stable operation was realized at 20$$^{circ}$$C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position.

Journal Articles

New approach to measure double-differential charged-particle emission cross sections of several materials for a fusion reactor

Kondo, Keitaro; Takagi, Satoshi*; Murata, Isao*; Miyamaru, Hiroyuki*; Takahashi, Akito*; Kubota, Naoyoshi; Ochiai, Kentaro; Nishitani, Takeo

Fusion Engineering and Design, 81(8-14), p.1527 - 1533, 2006/02

 Times Cited Count:12 Percentile:29.89(Nuclear Science & Technology)

In a fusion reactor development, double-differential charged-particle emission cross sections(DDXc) are necessary to estimate nuclear heating and material damages of candidate materials irradiated with neutrons. Especially in light nuclei such as Be, Li, and C, nuclear reactions are complicated and difficult to estimate energy spectra of emitted particles based only on theoretical calculations Therefore development of a new technique for precise measurements of DDXc is quite important. Recently we successfully developed a new spectrometer for measurement of DDXc using a pencil-beam DT neutron source of FNS in JAERI. In the present study we carried out measurements of DDXc of $$^{9}$$Be, $$^{12}$$C, $$^{19}$$F, and $$^{27}$$Al using the spectrometer. The present technique was valid from the result of measurement for the $$^{27}$$Al(n,x$$alpha$$) reactions. Slight differences appeared between measured data and evaluation or previous experimental values for $$^{9}$$Be(n,x$$alpha$$) reactions at backward scattering angle and in lower energy region.

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