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能田 洋平*; 熊田 高之; 他7名*
Journal of Applied Crystallography, 59, 21 Pages, 2026/00
We elucidated the polymer adsorption layer structure in filler-rubber systems by using spin-contrast-variation small-angle neutron scattering on partially and fully swollen filler rubber samples with and without a silane coupling agent. The difference in polymer volume fraction between the polymer adsorption layer and the outside matrix was very small in less swollen states but significant in the fully swollen state.
熊田 高之
水素科学技術の将来のために, 3(1), p.2 - 6, 2025/10
Spin-contrast variation (SCV) is a technique that exploits the strong dependence of the coherent scattering length of thermal and cold neutrons from protons on their relative spin orientation. By analyzing the proton-polarization dependent scattering of polarized neutrons, SCV enables the elucidation of the structure of individual components as well as the degree of interpenetration between them in composite materials. Recently, we applied SCV small-angle neutron scattering (SCV-SANS) to determine the nanostructure of ice crystals formed in rapidly frozen sugar solutions. We also employed SCV neutron reflectivity (SCV-NR) to reveal the interpenetration between a silane coupling agent layer on inorganic substrates and rubber, which plays a crucial role in their adhesion.
熊田 高之; 阿久津 和宏*; 大石 一城*; 森川 利明*; 河村 幸彦*; 佐原 雅恵*; 鈴木 淳市*; 三浦 大輔*; 鳥飼 直也*
J-PARC 20-02; J-PARC MLF Annual Report 2019, p.38 - 40, 2021/00
Neutron reflectivity (NR) is used to determine the nanostructure of surfaces and interfaces of thin film samples. NR has an ad-vantage over X-ray reflectivity for measuring deeply-buried interface of materials. However, it is difficult to determine the structure of complex multiple surface and interfaces of the thin film from a single reflectivity curve. To overcome the problem, we developed a new technique called spin-contrast-variation neutron reflectometry (SCV-NR), which utilizes the property that coherent polarized-neutron scattering length of a proton remarkably varies as a function of the proton polarization, PH, against the neutron polarization direction. As PH increases, the scattering length density (SLD) of each layer proportionally increases with the number density of protons, resulting in the variation of NR curves. The structure of multiple surface and interfaces of a thin film can be determined from the multiple curves.
