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Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*
Radiation Physics and Chemistry, 68(6), p.975 - 980, 2003/12
Times Cited Count:2 Percentile:18.58(Chemistry, Physical)Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than
5%(1
) including uncertainty in fluence measurement(
2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10
m, respectively.
Okayasu, Satoru; Sasase, Masato; Hojo, Kiichi; Chimi, Yasuhiro; Iwase, Akihiro; Ikeda, Hiroshi*; Yoshizaki, Ryozo*; Kambara, Tadashi*; Sato, H.*; Hamatani, Yutaro*; et al.
Physica C, 382(1), p.104 - 107, 2002/10
Times Cited Count:29 Percentile:75.59(Physics, Applied)no abstracts in English
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki
IAEA-TECDOC-1070, p.197 - 202, 1999/03
no abstracts in English
; Tomimitsu, Hiroshi; ; ; ; Aizawa, Kazuya; Okayasu, Satoru; ; Kazumata, Yukio*; Y.C.Jiang*; et al.
Japanese Journal of Applied Physics, Part 1, 36(12A), p.7296 - 7301, 1997/12
Times Cited Count:6 Percentile:36.52(Physics, Applied)no abstracts in English
Goppelt-Langer, P.*; Yamamoto, Shunya; Aoki, Yasushi; Takeshita, Hidefumi; Naramoto, Hiroshi
Nuclear Instruments and Methods in Physics Research B, 118(1), p.7 - 10, 1996/09
Times Cited Count:7 Percentile:54.96(Instruments & Instrumentation)no abstracts in English
Nakane, Yoshihiro; Furihata, Shiori*; Iwai, Satoshi*; Tanaka, Shunichi
JAERI-M 93-152, 178 Pages, 1993/08
no abstracts in English
; ; ;
Appl.Radiat.Isot., 37(2), p.121 - 125, 1986/00
no abstracts in English
Ono, Shinichi; ;
Bulletin of the Chemical Society of Japan, 59(6), p.1947 - 1951, 1986/00
Times Cited Count:2 Percentile:25.06(Chemistry, Multidisciplinary)no abstracts in English
; Ono, Shinichi
Bulletin of the Chemical Society of Japan, 58, p.1831 - 1832, 1985/00
Times Cited Count:1 Percentile:22.34(Chemistry, Multidisciplinary)no abstracts in English
; ; ;
Journal of the Physical Society of Japan, 54(5), p.1750 - 1756, 1985/00
Times Cited Count:7 Percentile:58.68(Physics, Multidisciplinary)no abstracts in English
;
Int.J.Appl.Radiat.Isot., 32, p.233 - 237, 1981/00
no abstracts in English
JAERI-M 9151, 36 Pages, 1980/10
no abstracts in English
; ; Nakai, Y.
Oyo Butsuri (Sosetsu), 45(1), p.2 - 17, 1976/01
None
Ono, Shinichi
Bulletin of the Chemical Society of Japan, 48(7), p.2229 - 2230, 1975/07
Times Cited Count:1no abstracts in English