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Li, H.*; Liu, Y.*; Zhao, W.*; Liu, B.*; Tominaga, Aki; Shobu, Takahisa; Wei, D.*
International Journal of Plasticity, 165, p.103612_1 - 103612_20, 2023/06
Times Cited Count:0 Percentile:75.64(Engineering, Mechanical)In order to clarify the strength properties of Co-free maraging steel, tensile experiment using high energy synchrotron X-ray diffraction was performed. Diffraction profiles from the martensitic and austenitic phases were obtained, and their strength and width were observed to vary as loading. Analysis of the diffraction profiles showed that the content of martensite in the as-aged material decreased slowly at low stress levels and decreased rapidly at high stress levels. On the other hand, the austenite phase in the as-solution materials was significantly transformed the martensite phase as the stress increased. It was clarified to be responsible for their respective strength properties.
Iyota, Muneyoshi*; Matsuda, Tomoki*; Sano, Tomokazu*; Shigeta, Masaya*; Shobu, Takahisa; Yumoto, Hirokatsu*; Koyama, Takahisa*; Yamazaki, Hiroshi*; Semba, Yasunori*; Ohashi, Haruhiko*; et al.
Journal of Manufacturing Processes, 94, p.424 - 434, 2023/05
Times Cited Count:1 Percentile:76.66(Engineering, Manufacturing)Yamazaki, Yasuhiro*; Shinomiya, Keisuke*; Okumura, Tadaharu*; Suzuki, Kenji*; Shobu, Takahisa; Nakamura, Yuiga*
Quantum Beam Science (Internet), 7(2), p.14_1 - 14_12, 2023/05
Im, S.*; Jee, H.*; Suh, H.*; Kanematsu, Manabu*; Morooka, Satoshi; Choe, H.*; Nishio, Yuhei*; Machida, Akihiko*; Kim, J.*; Lim, S.*; et al.
Construction and Building Materials, 365, p.130034_1 - 130034_18, 2023/02
Times Cited Count:3 Percentile:95.05(Construction & Building Technology)Inami, Toshiya*; Shobu, Takahisa; Ishii, Kenji*
IEEE Transactions on Magnetics, 57(3, Part2), p.6400105_1 - 6400105_5, 2021/03
Times Cited Count:0 Percentile:0(Engineering, Electrical & Electronic)Suzuki, Kenji*; Shobu, Takahisa
E-Journal of Advanced Maintenance (Internet), 10(4), p.9 - 17, 2019/02
In materials with an elastic anisotropy, a stress difference is generated between crystals when plastic deformation occurs, and it is known that this is deeply involved in material fracture. In this study, the residual stress for load direction in the plastically deformed material was investigated for each crystal orientation using the high-energy synchrotron radiation diffraction method. As a result, it was found that the residual stress is a tensile residual stress at an index with a high X-ray elastic constant (Young's modulus obtained for each diffraction surface) and a compressive residual stress at an index with a low X-ray elastic constant. We believe that this result will be useful for the technique of controlling the crystal orientation like the texture as improving the material strength.
Yoneda, Yasuhiro; Tsuji, Takuya; Matsumura, Daiju; Okamoto, Yoshihiro; Takaki, Seiya; Takano, Masahide
Transactions of the Materials Research Society of Japan, 42(2), p.23 - 26, 2017/04
ZnN is a possible candidate for the diluent material for nitride fuels containing transuranium elements. Pellets of inert matrix material ZrN, and surrogate nitride fuel material DyZr
N, are fabricated for the purpose of investigating the crystal structure. Lattice parameters of Dy
Zr
N followed the Vegard's low, in spite of the large lattice mismatch (
7%) between DyN and ZrN. Local structure analysis was performed by X-ray absorption fine structure (XAFS) and atomic pair-distribution function (PDF) methods. The Zr-N nearest neighbor bond distance changed as changing the Dy composition. The complex local structure of DyN and ZrN is related to the preferable effects of ZrN.
Toyokawa, Hidenori*; Saji, Choji*; Kawase, Morihiro*; Wu, S.*; Hurukawa, Yukihito*; Kajiwara, Kentaro*; Sato, Masugu*; Hirono, Toko*; Shiro, Ayumi*; Shobu, Takahisa; et al.
Journal of Instrumentation (Internet), 12(1), p.C01044_1 - C01044_7, 2017/01
Times Cited Count:4 Percentile:22.16(Instruments & Instrumentation)We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200 micro-meter by 200 micro-meter and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photon-counting mode selecting X-ray energy with the window comparator and stable operation was realized at 20C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position.
Liss, K.-D.*; Funakoshi, Kenichi*; Dippenaar, R. J.*; Higo, Yuji*; Shiro, Ayumi*; Reid, M.*; Suzuki, Hiroshi; Shobu, Takahisa; Akita, Koichi
Metals, 6(7), p.165_1 - 165_22, 2016/07
Times Cited Count:18 Percentile:66.33(Materials Science, Multidisciplinary)Titanium aluminides find application in modern light-weight, high-temperature turbines, such as aircraft engines, but suffer from poor plasticity during manufacturing and processing. Huge forging presses enable materials processing in the 10 GPa range and hence, it is necessary to investigate the phase-diagrams of candidate materials under these extreme conditions. Here we report on an in-situ synchrotron X-ray diffraction study in a large-volume-press of a modern ( +
) two-phase material, Ti-45Al-7.5Nb-0.25C, under pressures up to 9.6 GPa and temperatures up to 1686 K. At room temperature, the volume response to pressure is accommodated by the transformation
rather than volumetric strain, expressed by apparently high bulk moduli of both constituent phases. Crystallographic aspects, specifically lattice strain and atomic order are discussed in detail. It is interesting to note that this transformation takes place despite an increase in atomic volume, which is due to the high ordering energy of
. Upon heating under high pressure, both the eutectoid and
-solvus transition temperatures are elevated, and a third, cubic
-phase is stabilized above 1350 K. Earlier research has shown that this
-phase is very ductile during plastic deformation, essential in near-conventional forging processes. Here, we were able to identify an ideal processing window for near-conventional forging, while the presence of the detrimental
-phase is not present under operating conditions. Novel processing routes can be defined from these findings.
Sato, Shigeo*; Shobu, Takahisa; Sato, Kozue*; Ogawa, Hiromi*; Wagatsuma, Kazuaki*; Kumagai, Masayoshi*; Imafuku, Muneyuki*; Tashiro, Hitoshi*; Suzuki, Shigeru*
ISIJ International, 55(7), p.1432 - 1438, 2015/07
Times Cited Count:13 Percentile:55.29(Metallurgy & Metallurgical Engineering)To characterize the distribution and anisotropy of dislocations in cold-drawn pearlitic steel wires, X-ray diffraction line-profile analysis was performed using synchrotron radiation micro-beams. The plastic shear strain was generally more severe near the surface than the center of the wire, whereas the dislocation density distribution was almost constant from the center to the surface. On the other hand, the dislocation rearrangement, which evolves the dislocation cell structure, progressed closer to the surface. It was also revealed that a difference between the hardness in axial and transverse wire directions could be explained by anisotropic dislocation density. Line-profile analysis based on diffraction data at elevated temperatures was performed. Whereas the cementite recovery progressed at a constant rate, the ferrite phase recovery rate was temperature-dependent, suggesting that the ferrite phase recovery was less related to that of the cementite phase.
Saito, Hiroyuki; Takagi, Shigeyuki*; Matsuo, Motoaki*; Iijima, Yuki*; Endo, Naruki*; Aoki, Katsutoshi*; Orimo, Shinichi*
APL Materials (Internet), 2(7), p.076103_1 - 076103_7, 2014/07
Times Cited Count:23 Percentile:68.76(Nanoscience & Nanotechnology)Shibano, Junichi*; Kajiwara, Kentaro*; Tsukamoto, Takuya*; Kawai, Hirokazu*; Miura, Setsuo*; Zhang, S.*; Shobu, Takahisa; Kobayashi, Michiaki*
Materials Science Forum, 777, p.176 - 181, 2014/02
Times Cited Count:1 Percentile:54.62Takahashi, Masamitsu; Kratzer, P.*; Penev, E.*; Mizuki, Junichiro
Surface Science, 600(18), p.4099 - 4102, 2006/09
Times Cited Count:1 Percentile:6.7(Chemistry, Physical)The GaAs(001)-c(44) has been studied by synchrotron surface X-ray diffraction. The atomic coordinates and Debye-Waller factors were determined up to the sixth layer from the surface. The results support the formation of the Ga-As heterodimers. The resultant atomic coordinates were compared with those given by a first-principle calculation. In spite of the theoretical prediction of the stability of the single-heterodimer structure, our data fit best a three-heterodimer model where three heterodimers are present in one unit cell. The preference of the formation of the three heterodimers will be discussed in the relationship with the transition process from the 2
4 to the c(4
4) structures.
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Nath, K. G.
Surface and Interface Analysis, 38(4), p.352 - 356, 2006/04
Times Cited Count:3 Percentile:7.26(Chemistry, Physical)We investigated the orientation nature at the top-most layers of F-irradiated graphite using polarization dependent near-edge X-ray absorption fine structure (NEXAFS) spectroscopy which incorporates partial electron yield (PEY) detection and photon-stimulated ion desorption (PSID) techniques. The fluorine K-edge NEXAFS spectra conducted in PEY mode show no significant dependence on polarization angles. In contrast, NEXAFS spectra recorded in F
ion yield mode show enhanced yields at a feature of
689.4 eV assigned as a
*(C-F) state relevant to =C-F sites, which depend on polarization angles. The C-F bonds prefer relatively tilting down the surface at the top-most layer, while the C-F bonds are randomly directed at deeper regions. We conclude that the difference in the orientation structures between the top surface and bulk is reflected in the NEXAFS recorded in the two different detection modes. It was also found that H
- and F
- PSID NEXAFS spectra are helpful in understanding desorption mechanism, thus in analysing NEXAFS data.
Suzuki, Hiroshi
Netsu Shori, 46(1), p.11 - 18, 2006/02
no abstracts in English
Otani, Eiji*; Suzuki, Akio*; Ando, Ryota*; Urakawa, Satoru*; Funakoshi, Kenichi*; Katayama, Yoshinori
Advances in High-Pressure Technology for Geophysical Applications, p.195 - 209, 2005/09
This paper summarizes the techniques for the viscosity and density measurements of silicate melt and glasses at high pressure and temperature by using the X-ray radiography and absorption techniques in the third generation synchrotron radiation facility, SPring-8, Japan. The falling sphere method using in situ X-ray radiography makes it possible to measure the viscosity of silicate melts to the pressures above 6 GPa at high temperature. We summarize the details of the experimental technique of the viscosity measurement, and the results of the measurements of some silicate melts such as the albite and diopside-jadeite systems. X-ray absorption method is applied to measure the density of the silicate glasses such as the basaltic glass and iron sodium disilicate glass up to 5 GPa at high temperature. A diamond capsule, which is not reactive with the glass, is used for the density measurement of the glasses. The present density measurement of the glasses indicates that this method is useful for measurement of the density of silicate melts at high pressure and temperature.
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Nath, K. G.*; Uddin, M. N.*
Journal of Physics; Condensed Matter, 17(36), p.5453 - 5466, 2005/09
Times Cited Count:1 Percentile:6.3(Physics, Condensed Matter)The orientation nature of multilayer organosilicon compounds has been investigated by measuring the dependence of the Si K-shell near-edge X-ray absorption fine structures (NEXAFS) on the polarization angle. Two approaches helped to elucidate the orientation mechanism: the substitution effect and the deposition-rate dependence. The orientation angles of Si-X bond axes were obtained for trimethylsilyl halides, (CH)
SiX (X =F Cl Br I NCO, condensed on Cu(111) at a low (82 K) temperature: the angles are 60, 73, 61, 55, and 55 degrees with respect to the surface normal, for X =F, Cl, Br, I, and NCO, respectively. Chloride (X =Cl) produces the most parallel tilt angle. The specific orientation nature of chloride is attributed to its strong dipole moment as well as the regular tetrahedron shape of the molecule. The molecular volumes calculated verify this view. Furthermore, deposition rates are found to greatly influence the growth manner: namely, high deposition rates led to a slightly perpendicular orientation of Si-X bond axis.
Fons, P.*; Kolobov, A.*; Tominaga, Junji*; Katayama, Yoshinori
Nuclear Instruments and Methods in Physics Research B, 238(1-4), p.160 - 162, 2005/08
Times Cited Count:5 Percentile:41.31(Instruments & Instrumentation)Super-resolution (SR) media offer up to a factor of ten increase in areal storage density over conventional DVD media. Although SR has been realized, there is a strong need for a deeper understanding of structural and electronic changes in GeSb
Te
(GST), a principal optical memory component, with external perturbations. Recording of SR disks leads to the formation of gas-phase bubbles that in turn lead to the development of large stresses on the underlying GST layer. In this paper we report on XAFS of nominally hydrostatic (0-10 GPa) compressive stress-induced structural changes of the metastable crystalline phase of GST. An analysis showed that the initial splitting of Ge Te bond lengths of the room-temperature distorted rocksalt structure decreased to a small but finite splitting for
6 GPa. The implications of this upon the proposed ferroelectric catastrophe super-RENS readout mechanism are discussed.
Nath, K. G.; Shimoyama, Iwao; Sekiguchi, Tetsuhiro; Baba, Yuji
Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.323 - 326, 2005/06
Times Cited Count:5 Percentile:27.53(Spectroscopy)The effect of laser annealing on electronic atructures and molecular orientation for poly(dimethylsilane), {PDMS, [Si(CH)
]
} has been studied by synchrotron radiation photoemission and photoabsorption spectroscopy. Prior to annealing, PDMS powder was mounted on the basal plane of highly oriented pyrolytic graphite. Both Si 1s X-ray photoemission spectroscopy and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy at Si 1s edge show that electronic structures have been modified due to annealing. Furthermore, the angle-dependent NEXAFS spectra clearly indicate that the annealed products maintain a specific orientation. Interestingly, no such kind of orientation is present in as-received PDMS powder as no angle-dependency is observed before annealing.
Mitsui, Takaya; Takei, Fumihiko*; Kitao, Shinji*; Seto, Makoto; Harami, Taikan; Zhang, X.*; Yoda, Yoshitaka*; Kikuta, Seishi*
Transactions of the Materials Research Society of Japan, 30(1), p.7 - 10, 2005/03
no abstracts in English