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Journal Articles

Dynamics of water in a catalyst layer of a fuel cell by quasielastic neutron scattering

Ito, Kanae; Yamada, Takeshi*; Shinohara, Akihiro*; Takata, Shinichi; Kawakita, Yukinobu

Journal of Physical Chemistry C, 125(39), p.21645 - 21652, 2021/10

 Times Cited Count:0

Journal Articles

Water distribution in Nafion thin films on hydrophilic and hydrophobic carbon substrates

Ito, Kanae; Harada, Masashi*; Yamada, Norifumi*; Kudo, Kenji*; Aoki, Hiroyuki; Kanaya, Toshiji*

Langmuir, 36(43), p.12830 - 12837, 2020/11

 Times Cited Count:2 Percentile:21.55(Chemistry, Multidisciplinary)

Journal Articles

Experimental investigation of the glass transition of polystyrene thin films in a broad frequency range

Inoue, Rintaro*; Kanaya, Toshiji*; Yamada, Takeshi*; Shibata, Kaoru; Fukao, Koji*

Physical Review E, 97(1), p.012501_1 - 012501_6, 2018/01

 Times Cited Count:8 Percentile:75.32(Physics, Fluids & Plasmas)

In this study, we investigate the $$alpha$$ process of a polystyrene thin film using inelastic neutron scattering (INS), dielectric relaxation spectroscopy (DRS), and thermal expansion spectroscopy (TES). The DRS and TES measurements exhibited a decrease in glass transition temperature ($$T_{rm g}$$) with film thickness. On the other hand, an increase in $$T_{rm g}$$ was observed in INS studies. In order to interpret this contradiction, we investigated the temperature dependence of the peak frequency ($$f_{rm m}$$) of the $$alpha$$ process probed by DRS and TES. The experiments revealed an increase in the peak frequency ($$f_{rm m}$$) with decreasing film thickness in the frequency region. This observation is consistent with the observed decrease in $$T_{rm g}$$ with thickness. The discrepancy between INS and DRS or TES descriptions of the $$alpha$$ process is likely to be attributed to a decrease in the apparent activation energy with film thickness and reduced mobility, due to the impenetrable wall effect.

Journal Articles

MCD measurement at the Tb $$M$$$$_{4,5}$$-edges of Tb$$_{17}$$Fe$$_{x}$$Co$$_{(83-x)}$$ perpendicular magnetization films

Agui, Akane; Mizumaki, Masaichiro*; Asahi, Toru*; Sayama, Junichi*; Matsumoto, Koji*; Morikawa, Tsuyoshi*; Nakatani, Takeshi; Matsushita, Tomohiro*; Osaka, Tetsuya*; Miura, Yoshimasa*

Transactions of the Magnetics Society of Japan, 4(4-2), p.326 - 329, 2004/11

The electronic and spin state of the perpendicular magnetization film Tb$$_{17}$$Fe$$_{x}$$Co$$_{(83-x)}$$ was investigated by means of magnetic circular dichroism spectroscopy for each element. The samples are Tb$$_{17}$$Fe$$_{x}$$Co$$_{(83-x)}$$ while the ratio of a rare-earth metal Tb to transition metals Fe and Co is constant, the composition ratio of Fe and Co is changed. Changing the ratio, we estimated the expected orbital moments $$<$$$$L$$$$_{z}$$$$>$$ of Tb 4f electrons. The macroscopic magnetic property is studied from the microscopic point of view.

Journal Articles

Structure of sub-monolayered silicon carbide films

Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Nath, K. G.

Applied Surface Science, 237(1-4), p.176 - 180, 2004/10

 Times Cited Count:7 Percentile:38.81(Chemistry, Physical)

no abstracts in English

Journal Articles

3-45MeV/u ion beam dosimetry using thin film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*

Radiation Physics and Chemistry, 68(6), p.975 - 980, 2003/12

 Times Cited Count:2 Percentile:19.75(Chemistry, Physical)

Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm$$^{2}$$) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than $$pm$$5%(1$$sigma$$) including uncertainty in fluence measurement($$pm$$2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10 $$mu$$m, respectively.

Journal Articles

RHEED observation of BaTiO$$_3$$ thin films grown by MBE

Yoneda, Yasuhiro; Sakaue, Kiyoshi*; Terauchi, Hikaru*

Surface Science, 529(3), p.283 - 287, 2003/04

 Times Cited Count:8 Percentile:44.11(Chemistry, Physical)

Ferroelectric BaTiO$$_3$$ thin filmwith a thickness of 10ML were epitaxally grown on SrTiO$$_3$$ (001) substrate by very slow deposition using MBE. The investigation were carried out by two growth methods: (i) codeposition and (ii) alternate deposition. In-situ observation of RHEED confirmed that an epitaxial cube-on-cube structure was prepared. After the deposition, X-ray diffraction measurements were carried out. The 10-ML-thick BaTiO$$_3$$ films were highly ${it c}$-axis oriented single crystals with good film quality.

Journal Articles

Recent activities and progress on PORE reflectometer

Takeda, Masayasu; Torikai, Naoya*; Ino, Takashi*; Tasaki, Seiji*

KENS Report-XIV, p.205 - 206, 2003/00

no abstracts in English

Journal Articles

Dosimetry for 3-45 MeV/u ion beams using thin film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Hanaya, Hiroaki; Tachibana, Hiroyuki*

JAERI-Review 2002-035, TIARA Annual Report 2001, p.123 - 124, 2002/11

Thin film dosimeters of about 10-200 mm in thickness, which were well -characterized for $$^{60}$$Co $$gamma$$-rays or 2-MeV electrons, have been applied to dosimetry for ion beams. For development of dosimetry covering the dose range of 0.005 to 200 kGy with high precision within $$pm$$5%, the linear energy transfer (LET) characteristics of thin films were studied involving development of precise fluence measurement. Dose mapping technique was also developed achieving high spatial resolution values of about 1$$mu$$m and $$<$$10$$mu$$m for lateral and depth directions respectively. The outline of the recent development is summarized in this paper.

Journal Articles

Preparation of TiO$$_{2}$$-anatase film on Si(001) substrate with TiN and SrTiO$$_{3}$$ as buffer layers

Sugiharuto; Yamamoto, Shunya; Sumita, Taishi; Miyashita, Atsumi

Journal of Physics; Condensed Matter, 13(13), p.2875 - 2881, 2001/04

 Times Cited Count:14 Percentile:61.06(Physics, Condensed Matter)

An epitaxial TiO$$_{2}$$-anatase thin film was grown on the Si(001) substrate with SrTiO$$_{3}$$/TiN as the buffer layers by pulsed laser deposition technique under an oxygen gas supply. The characterization of the epitaxial TiO$$_{2}$$-anatase film was performed using the X-ray diffraction method. The crystallographic relationships between the TiO$$_{2}$$-anatase film and SrTiO$$_{3}$$/TiN buffer layers were analyzed by the $$theta$$-2$$theta$$ scan and pole figure measurement. The growth direction of the films was determined as $$rm TiO_{2}langle 001rangle$$ / $$rm SrTiO_{3}langle 001rangle$$ / $$rm TiNlangle 001rangle$$ / $$rm Silangle 001rangle$$ and their in-plane relationship $$rm TiO_{2}{110}$$ // $$rm SrTiO_{3}{100}$$ // $$rm TiN{100}$$ // $$rm Si{100}$$. The crystalline quality of TiO$$_{2}$$-anatase was examined by the rocking curve analysis. The composition of the thin film packaging was characterized by Rutherford backscattering spectrometry (RBS) using 2.0 MeV $$^{4}$$He beam.

Journal Articles

Application of thin film dosimeters for 3-45MeV/amu ion beams

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki

JAERI-Conf 2000-001, p.310 - 313, 2000/03

no abstracts in English

Journal Articles

A Three-step process for epitaxial growth of (111)-oriented C$$_{60}$$ films on alkali-halide substrates

Dai, Z.*; Naramoto, Hiroshi; Narumi, Kazumasa; Yamamoto, Shunya; Miyashita, Atsumi

Thin Solid Films, 360(1), p.28 - 33, 2000/02

 Times Cited Count:2 Percentile:16.19(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Dosimetry systems for characteristics study of thin film dosimeters, 4; Fluence measurement and LET characteristics study of film dosimeters

Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki

JAERI-Review 99-025, TIARA Annual Report 1998, p.100 - 102, 1999/10

no abstracts in English

Journal Articles

Structural, optical and electrical properties of laser deposited FeTiO$$_{3}$$ films on C- and A-cut sapphire substrates

Dai, Z.*; Naramoto, Hiroshi; Narumi, Kazumasa; Yamamoto, Shunya; Miyashita, Atsumi

Journal of Applied Physics, 85(10), p.7433 - 7437, 1999/05

 Times Cited Count:21 Percentile:67.64(Physics, Applied)

no abstracts in English

Journal Articles

Self-mediated growth of single-crystal and entirely(111)-oriented C$$_{60}$$ films on alkali halide substrates

Dai, Z.*; Naramoto, Hiroshi; Narumi, Kazumasa; Yamamoto, Shunya; Miyashita, Atsumi

Applied Physics Letters, 74(12), p.1686 - 1688, 1999/03

 Times Cited Count:5 Percentile:29.14(Physics, Applied)

no abstracts in English

Journal Articles

Semiconductor-metal phase transition in VO$$_{2}$$ films synthesized on $$alpha$$-Al$$_{2}$$O$$_{3}$$ by oxygen-reactive deposition using a neodymium-doped yttrium aluminium garnet laser

P.Zhu*; Yamamoto, Shunya; Miyashita, Atsumi; Wu, Z.*; Narumi, Kazumasa; Naramoto, Hiroshi

Philos. Mag. Lett., 79(8), p.603 - 608, 1999/00

 Times Cited Count:5 Percentile:46.5(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Study on ferroelectric domains in BaTiO$$_3$$ crystalline films and bulk crystals by atomic force and scanning electron microscopies

Tsunekawa, Shin*; Fukuda, Tsuguo*; Ozaki, Toru*; Yoneda, Yasuhiro; Okabe, Toru*; Terauchi, Hikaru*

Journal of Applied Physics, 84(2), p.999 - 1002, 1998/06

 Times Cited Count:15 Percentile:58.6(Physics, Applied)

no abstracts in English

Journal Articles

Polymerisation process of 1,6-di(N-carbazolyl)-2,4-hexadiyne epitaxially grown films studied by high-resolution electron microscopy

*; Isoda, S.*; Kurata, Hiroki; *; *; Kobayashi, Takashi*

Polymer, 39(3), p.591 - 597, 1998/00

 Times Cited Count:5 Percentile:27.27(Polymer Science)

no abstracts in English

Journal Articles

FTIR reflection absorption spectroscopy for organic thin film on ITO substrate

Tamada, Masao; Koshikawa, Hiroshi; Hosoi, Fumio; Suwa, Takeshi

Thin Solid Films, 315(1-2), p.40 - 43, 1998/00

 Times Cited Count:12 Percentile:56.56(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Neutron Reflectometer

Soyama, Kazuhiko

Radioisotopes, 46(11), p.852 - 858, 1997/11

no abstracts in English

32 (Records 1-20 displayed on this page)