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Takanashi, Koki; Seki, Takeshi*
Magune, 19(3), p.100 - 106, 2024/06
Perpendicular magnetic anisotropy of thin films currently plays an important role in spintronics as well as magnetic recording. Regarding perpendicular magnetic anisotropy, in this article, the fundamentals, the research history, and the recent research trends are reviewed, showing specific examples with perpendicular magnetization such as magnetic multilayers, ordered alloy films, rare earth-transition metal amorphous alloy films, and inhomogeneous or granular films. The physical origins for perpendicular magnetic anisotropy, including interface anisotropy due to structural symmetry breaking, magnetoelastic anisotropy due to strain, bulk-type magnetocrystalline anisotropy, and directional pair ordering of atoms, are discussed in each example.
Nabialek, A.*; Chumak, O.*; Seki, Takeshi*; Takanashi, Koki; Baczewski, L. T.*; Szymczak, H.*
IEEE Transactions on Magnetics, 59(11), p.2501405_1 - 2501405_5, 2023/11
Times Cited Count:2 Percentile:34.69(Engineering, Electrical & Electronic)Ito, Kanae; Yamada, Takeshi*; Shinohara, Akihiro*; Takata, Shinichi; Kawakita, Yukinobu
Journal of Physical Chemistry C, 125(39), p.21645 - 21652, 2021/10
Times Cited Count:8 Percentile:40.09(Chemistry, Physical)Ito, Kanae; Harada, Masashi*; Yamada, Norifumi*; Kudo, Kenji*; Aoki, Hiroyuki; Kanaya, Toshiji*
Langmuir, 36(43), p.12830 - 12837, 2020/11
Times Cited Count:14 Percentile:52.48(Chemistry, Multidisciplinary)Inoue, Rintaro*; Kanaya, Toshiji*; Yamada, Takeshi*; Shibata, Kaoru; Fukao, Koji*
Physical Review E, 97(1), p.012501_1 - 012501_6, 2018/01
Times Cited Count:10 Percentile:61.47(Physics, Fluids & Plasmas)In this study, we investigate the process of a polystyrene thin film using inelastic neutron scattering (INS), dielectric relaxation spectroscopy (DRS), and thermal expansion spectroscopy (TES). The DRS and TES measurements exhibited a decrease in glass transition temperature (
) with film thickness. On the other hand, an increase in
was observed in INS studies. In order to interpret this contradiction, we investigated the temperature dependence of the peak frequency (
) of the
process probed by DRS and TES. The experiments revealed an increase in the peak frequency (
) with decreasing film thickness in the frequency region. This observation is consistent with the observed decrease in
with thickness. The discrepancy between INS and DRS or TES descriptions of the
process is likely to be attributed to a decrease in the apparent activation energy with film thickness and reduced mobility, due to the impenetrable wall effect.
Agui, Akane; Mizumaki, Masaichiro*; Asahi, Toru*; Sayama, Junichi*; Matsumoto, Koji*; Morikawa, Tsuyoshi*; Nakatani, Takeshi; Matsushita, Tomohiro*; Osaka, Tetsuya*; Miura, Yoshimasa*
Transactions of the Magnetics Society of Japan, 4(4-2), p.326 - 329, 2004/11
The electronic and spin state of the perpendicular magnetization film TbFe
Co
was investigated by means of magnetic circular dichroism spectroscopy for each element. The samples are Tb
Fe
Co
while the ratio of a rare-earth metal Tb to transition metals Fe and Co is constant, the composition ratio of Fe and Co is changed. Changing the ratio, we estimated the expected orbital moments
of Tb 4f electrons. The macroscopic magnetic property is studied from the microscopic point of view.
Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Nath, K. G.
Applied Surface Science, 237(1-4), p.176 - 180, 2004/10
Times Cited Count:9 Percentile:43.26(Chemistry, Physical)no abstracts in English
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki*; Hanaya, Hiroaki; Tachibana, Hiroyuki*
Radiation Physics and Chemistry, 68(6), p.975 - 980, 2003/12
Times Cited Count:2 Percentile:18.58(Chemistry, Physical)Four kinds of film dosimeters well-characterized for low LET radiations were applied to 3-45 MeV/u ions. The dose responses relative to those for low LET radiations are almost one up to about 10 MeV/(mg/cm) and gradually become smaller with increase of the stopping power. Overall uncertainty in ion beam dosimetry using these characterized dosimeters is better than
5%(1
) including uncertainty in fluence measurement(
2%). Lateral and depth dose profile measurements were achievable using characterized Gafchromic dosimeters with the spatial resolution of better than 1 and 10
m, respectively.
Kitazawa, Shinichi; Putra, P.; Sakai, Seiji; Narumi, Kazumasa; Naramoto, Hiroshi; Yamamoto, Shunya; Chiba, Atsuya
Nuclear Instruments and Methods in Physics Research B, 206, p.952 - 955, 2003/05
Times Cited Count:6 Percentile:42.70(Instruments & Instrumentation)Pulsed energy impacts are expected to generate the elastic waves reflecting the elastic properties of impacted substances. Among the generated waves, the surface acoustic waves (SAW) can be more specific to the surface structures and can be used effectively in the characterization of thin films in a non-destructive way. In the present study, pulsed laser impacts were employed to generate SAWs on a thin film and the SAWs are detected with a laser reflection technique. To test the effectiveness of this method, an amorphous carbon films were irradiated with 13 keV Ar ions at room temperature in a broad range and the SAW propagation velocity was evaluated as a function of Ar ion dose. The present preliminary experiment using pulsed laser suggests the successful detection of SAW from typical substances with different modulus of elasticity such as fcc metals, oxides and semi conducting materials.
Yoneda, Yasuhiro; Sakaue, Kiyoshi*; Terauchi, Hikaru*
Surface Science, 529(3), p.283 - 287, 2003/04
Times Cited Count:8 Percentile:42.18(Chemistry, Physical)Ferroelectric BaTiO thin filmwith a thickness of 10ML were epitaxally grown on SrTiO
(001) substrate by very slow deposition using MBE. The investigation were carried out by two growth methods: (i) codeposition and (ii) alternate deposition. In-situ observation of RHEED confirmed that an epitaxial cube-on-cube structure was prepared. After the deposition, X-ray diffraction measurements were carried out. The 10-ML-thick BaTiO
films were highly
-axis oriented single crystals with good film quality.
Takeda, Masayasu; Torikai, Naoya*; Ino, Takashi*; Tasaki, Seiji*
KENS Report-XIV, p.205 - 206, 2003/00
no abstracts in English
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Hanaya, Hiroaki; Tachibana, Hiroyuki*
JAERI-Review 2002-035, TIARA Annual Report 2001, p.123 - 124, 2002/11
Thin film dosimeters of about 10-200 mm in thickness, which were well -characterized for Co
-rays or 2-MeV electrons, have been applied to dosimetry for ion beams. For development of dosimetry covering the dose range of 0.005 to 200 kGy with high precision within
5%, the linear energy transfer (LET) characteristics of thin films were studied involving development of precise fluence measurement. Dose mapping technique was also developed achieving high spatial resolution values of about 1
m and
10
m for lateral and depth directions respectively. The outline of the recent development is summarized in this paper.
Sugiharuto; Yamamoto, Shunya; Sumita, Taishi; Miyashita, Atsumi
Journal of Physics; Condensed Matter, 13(13), p.2875 - 2881, 2001/04
Times Cited Count:15 Percentile:61.10(Physics, Condensed Matter)An epitaxial TiO-anatase thin film was grown on the Si(001) substrate with SrTiO
/TiN as the buffer layers by pulsed laser deposition technique under an oxygen gas supply. The characterization of the epitaxial TiO
-anatase film was performed using the X-ray diffraction method. The crystallographic relationships between the TiO
-anatase film and SrTiO
/TiN buffer layers were analyzed by the
-2
scan and pole figure measurement. The growth direction of the films was determined as
/
/
/
and their in-plane relationship
//
//
//
. The crystalline quality of TiO
-anatase was examined by the rocking curve analysis. The composition of the thin film packaging was characterized by Rutherford backscattering spectrometry (RBS) using 2.0 MeV
He beam.
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki
JAERI-Conf 2000-001, p.310 - 313, 2000/03
no abstracts in English
Dai, Z.*; Naramoto, Hiroshi; Narumi, Kazumasa; Yamamoto, Shunya; Miyashita, Atsumi
Thin Solid Films, 360(1), p.28 - 33, 2000/02
Times Cited Count:2 Percentile:15.22(Materials Science, Multidisciplinary)no abstracts in English
Kojima, Takuji; Sunaga, Hiromi; Takizawa, Haruki; Tachibana, Hiroyuki
JAERI-Review 99-025, TIARA Annual Report 1998, p.100 - 102, 1999/10
no abstracts in English
Dai, Z.*; Naramoto, Hiroshi; Narumi, Kazumasa; Yamamoto, Shunya; Miyashita, Atsumi
Journal of Applied Physics, 85(10), p.7433 - 7437, 1999/05
Times Cited Count:23 Percentile:68.68(Physics, Applied)no abstracts in English
Dai, Z.*; Naramoto, Hiroshi; Narumi, Kazumasa; Yamamoto, Shunya; Miyashita, Atsumi
Applied Physics Letters, 74(12), p.1686 - 1688, 1999/03
Times Cited Count:5 Percentile:28.17(Physics, Applied)no abstracts in English
P.Zhu*; Yamamoto, Shunya; Miyashita, Atsumi; Wu, Z.*; Narumi, Kazumasa; Naramoto, Hiroshi
Philos. Mag. Lett., 79(8), p.603 - 608, 1999/00
Times Cited Count:5 Percentile:44.92(Materials Science, Multidisciplinary)no abstracts in English
Tsunekawa, Shin*; Fukuda, Tsuguo*; Ozaki, Toru*; Yoneda, Yasuhiro; Okabe, Toru*; Terauchi, Hikaru*
Journal of Applied Physics, 84(2), p.999 - 1002, 1998/06
Times Cited Count:16 Percentile:59.16(Physics, Applied)no abstracts in English