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Kuroda, Kenta*; Arai, Yosuke*; Rezaei, N.*; Kunisada, So*; Sakuragi, Shunsuke*; Alaei, M.*; Kinoshita, Yuto*; Bareille, C.*; Noguchi, Ryo*; Nakayama, Mitsuhiro*; et al.
Nature Communications (Internet), 11, p.2888_1 - 2888_9, 2020/06
Times Cited Count:29 Percentile:78.89(Multidisciplinary Sciences)Matsuda, Shinya*; Ota, Joji*; Nakaima, Kenri*; Iha, Wataru*; Gochi, Jun*; Uwatoko, Yoshiya*; Nakashima, Miho*; Amako, Yasushi*; Honda, Fuminori*; Aoki, Dai*; et al.
Philosophical Magazine, 100(10), p.1244 - 1257, 2020/04
Times Cited Count:4 Percentile:21.63(Materials Science, Multidisciplinary)Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Nath, K. G.
Surface and Interface Analysis, 38(4), p.352 - 356, 2006/04
Times Cited Count:3 Percentile:7.00(Chemistry, Physical)We investigated the orientation nature at the top-most layers of F-irradiated graphite using polarization dependent near-edge X-ray absorption fine structure (NEXAFS) spectroscopy which incorporates partial electron yield (PEY) detection and photon-stimulated ion desorption (PSID) techniques. The fluorine K-edge NEXAFS spectra conducted in PEY mode show no significant dependence on polarization angles. In contrast, NEXAFS spectra recorded in F
ion yield mode show enhanced yields at a feature of
689.4 eV assigned as a
*(C-F) state relevant to =C-F sites, which depend on polarization angles. The C-F bonds prefer relatively tilting down the surface at the top-most layer, while the C-F bonds are randomly directed at deeper regions. We conclude that the difference in the orientation structures between the top surface and bulk is reflected in the NEXAFS recorded in the two different detection modes. It was also found that H
- and F
- PSID NEXAFS spectra are helpful in understanding desorption mechanism, thus in analysing NEXAFS data.
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Wu, G.*; Kitajima, Yoshinori*
Surface Science, 593(1-3), p.310 - 317, 2005/11
Times Cited Count:2 Percentile:11.18(Chemistry, Physical)Using a newly developed rotatable time-of-flight mass spectrometer(R-TOF-MS) and polarized synchrotron radiation, orientation effect on fragmentation and desorption pathways occurring at the top-most layers of molecular solids have been investigated. Reported will be polarization-angle dependencies of TOF mass spectra, high-resolution electron- and ion-NEXAFS in condensed chlorobenzene.
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro; Baba, Yuji; Imamura, Motoyasu*; Matsubayashi, Nobuyuki*; Shimada, Hiromichi*
Surface Science, 593(1-3), p.303 - 309, 2005/11
Times Cited Count:5 Percentile:25.38(Chemistry, Physical)no abstracts in English
Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Nath, K. G.
Applied Surface Science, 237(1-4), p.176 - 180, 2004/10
Times Cited Count:9 Percentile:43.32(Chemistry, Physical)no abstracts in English
Iwasaki, T.*; Sekiyama, Akira*; Yamasaki, Atsushi*; Okazaki, Makoto*; Kadono, Koji*; Utsunomiya, Hiroshi*; Imada, Shin*; Saito, Yuji; Muro, Takayuki*; Matsushita, Tomohiro*; et al.
Physical Review B, 65(19), p.195109_1 - 195109_9, 2002/05
Times Cited Count:24 Percentile:71.19(Materials Science, Multidisciplinary)no abstracts in English
Hirata, Masaru
JAERI-Research 96-033, 16 Pages, 1996/06
no abstracts in English
Baba, Yuji; Yamamoto, Hiroyuki; Sasaki, Teikichi
Surface Science, 287-288, p.806 - 810, 1993/00
Times Cited Count:10 Percentile:52.17(Chemistry, Physical)no abstracts in English
Baba, Yuji; Sasaki, Teikichi; Yamamoto, Hiroyuki; Sasase, Masato*; Takano, Ichiro*;
Proc. of the Int. Symp. on Material Chemistry in Nuclear Environment, p.275 - 285, 1992/00
no abstracts in English
;
Hyomen Kagaku, 3(1), p.17 - 26, 1982/00
no abstracts in English
; ;
Physica Status Solidi (B), 113, p.647 - 655, 1982/00
Times Cited Count:17 Percentile:63.54(Physics, Condensed Matter)no abstracts in English
;
JAERI-M 9769, 19 Pages, 1981/10
no abstracts in English
;
Physica B; Condensed Matter, 111B(2-3), p.304 - 318, 1981/00
no abstracts in English
Journal of the Physical Society of Japan, 24(3), p.489 - 492, 1968/00
Times Cited Count:21no abstracts in English
Saito, Junichi; Kobayashi, Yohei*; Shibutani, Hideo*
no journal, ,
Haga, Yoshinori; Yamamoto, Etsuji; Nakamura, Ai*; Honda, Fuminori*; Aoki, Dai*; Matsumoto, Yuji*; Yamamura, Tomoo*; Shirasaki, Kenji*; Yamagami, Hiroshi*
no journal, ,
Haga, Yoshinori; Yamamoto, Etsuji; Nakamura, Ai*; Honda, Fuminori*; Aoki, Dai*; Matsumoto, Yuji*; Yamamura, Tomoo*; Shirasaki, Kenji*; Yamagami, Hiroshi*; Sumida, Kazuki
no journal, ,
no abstracts in English