Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880eV evaluated by the rotating-analyzer method

Imazono, Takashi; Hirono, Toko*; Kimura, Hiroaki*; Saito, Yuji; Ishino, Masahiko; Muramatsu, Yasuji*; Koike, Masato; Sano, Kazuo*

Review of Scientific Instruments, 76(12), p.126106_1 - 126106_4, 2005/12

https://doi.org/10.1063/1.2140492

Polarizance of a reflection-type polarizer made with a synthetic mica (fluorophlogopite) single crystal was evaluated at the photon energy of 880 eV by means of the rotating-analyzer method in conjunction with the evaluation of the degree of linear polarization of the insertion beamline, SPring-8 BL23SU, featuring an APPLE-2 type variably polarizing undulator. When the undulator was tuned to the horizontal linear polarization mode, the maximum reflectances for s- and p-polarization for a symmetric Bragg reflection of synthetic mica(002) were 2.6% and 0.013%, respectively, at incident angles of near 45. Our analysis based on the rotating-analyzer method gave the polarizance of the polarizer of at least 0.997 0.002 and the degree of linear polarization of 0.993 0.004 in the linear polarization mode.