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Search Results: Records 1-7 displayed on this page of 7
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Journal Articles

Heavy-ion induced current through an oxide layer

Takahashi, Yoshihiro*; Oki, Takahiro*; Nagasawa, Takaharu*; Nakajima, Yasuhito*; Kawanabe, Ryu*; Onishi, Kazunori*; Hirao, Toshio; Onoda, Shinobu; Mishima, Kenta; Kawano, Katsuyasu*; et al.

Nuclear Instruments and Methods in Physics Research B, 260(1), p.309 - 313, 2007/07

https://doi.org/10.1016/j.nimb.2007.02.010
 Times Cited Count：4 Percentile：35.71(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Optimization for SEU/SET immunity on 0.15 $$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7), p.95 - 98, 2006/10

no abstracts in English

Oral presentation

Welding deformation and mechanical proprieties of 316LN welded joint for ITER superconducting coil

Nakajima, Hideo; Hamada, Kazuya; Takano, Katsutoshi; Tsutsumi, Fumiaki; Kawano, Katsumi; Okuno, Kiyoshi; Yamaoka, Hiroto*; Kakui, Hideo*; Nakamura, Taizo*; Morinaga, Yasuhito*

no journal, , 

no abstracts in English

Oral presentation

Optimization for SEU/SET immunity on 0.15$$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

no journal, , 

no abstracts in English

Oral presentation

Analysis of transport properties of charge induced in SOI structure devices by heavy ion irradiation

Onishi, Kazunori*; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Fugane, Masaru; Imagawa, Ryo*; Nomoto, Keisuke*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Charge collection mechanism of heavy-ion induced charge through an oxide layer

Fugane, Masaru; Takahashi, Yoshihiro*; Hirao, Toshio; Onoda, Shinobu; Nakajima, Yasuhito*; Onishi, Kazunori*

no journal, , 

no abstracts in English

Oral presentation

Heavy-ion induced gate current in MOSFET

Fugane, Masaru; Takahashi, Yoshihiro*; Nakajima, Yasuhito*; Nagasawa, Takaharu*; Imagawa, Ryo*; Nomoto, Keisuke*; Onishi, Kazunori*; Hirao, Toshio; Onoda, Shinobu; Oshima, Takeshi

no journal, , 

no abstracts in English

7 (Records 1-7 displayed on this page)
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