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Inoue, Shuichi; Omuro, Tadao; Nabeya, Hideaki; Matsui, Yoshinori; Iida, Kazuhiro; Ito, Kazuyuki; Kimura, Akihiro; Kanno, Masaru
JAEA-Technology 2010-010, 27 Pages, 2012/05
JAEA-Technology-2010-010.pdf:1.99MB
In fuel irradiation transient tests using a boiling water capsule, a dilution tube has been installed in the boiling water capsule in order to detect fission products (FP) from an irradiated fuel, in case of the fuel failure during the transient, by a radiation monitor located outside the reactor. When the fuel failure occurs, the released FP flows out from the capsule through the dilution tube. The dilution tube is designed to minimize the released FP that can be detected by the radiation monitor located outside the reactor. This report summarized the measurement results of the dilution tube installed in the boiling water capsule.
Nakagawa, Satoko*; Tajima, Michio*; Hirose, Kazuyuki*; Oshima, Takeshi; Ito, Hisayoshi
Japanese Journal of Applied Physics, 48(3), p.031201_1 - 031201_4, 2009/03
Times Cited Count：4 Percentile：18.53(Physics, Applied)Light element impurities in ultrathin top Silicon layers of silicon-on-insulator (SOI) wafers were investigated by a luminescence activation method using electron irradiation. Photoluminescence (PL) measurement using ultraviolet (UV) light excitation was carried out of various commercial SOI wafers irradiated with electrons. The C-line related to a complex of interstitial carbon and oxygen impurities and the G-line related to a complex of interstitial and substitutional carbon impurities in the top Si layer with a thickness down to 62 nm were observed after electron irradiation. There were differences in the impurity concentration depending on the wafer fabrication methods and also that there were variations in these concentrations in the respective wafers. The present method is a verypromising tool to evaluate the light element impurities in top Si layers.
Miura, Yukitoshi; *; *; Hoshino, Katsumichi; *; *; Kasai, Satoshi; Kawakami, Tomohide; Kawashima, Hisato; Maeda, M.*; et al.
Fusion Energy 1996, p.167 - 175, 1997/05
no abstracts in English
*; *; *; *; *; *; *; Oikawa, Toshihiro; *; *; et al.
Fusion Energy 1996, p.885 - 890, 1997/05
no abstracts in English
Mihara, Morihiro; Osvaldo, C.*; Torii, Kazuyuki*; Ito, Yasufumi*
no journal, ,
no abstracts in English
Tamai, Hidesada; Nagayoshi, Takuji; Katono, Kenichi; Ito, Takashi; Takase, Kazuyuki
no journal, ,
no abstracts in English
Sakamoto, Atsushi; Sano, Yuichi; Takeuchi, Masayuki; Ito, Kazuyuki*; Sekita, Satoshi*; Sakamoto, Yukio*; Akutsu, Koichi*
no journal, ,
no abstracts in English
Takeuchi, Masayuki; Sakamoto, Atsushi; Sano, Yuichi; Ito, Kazuyuki*; Sekita, Satoshi*; Sakamoto, Yukio*; Akutsu, Koichi*
no journal, ,
no abstracts in English
Sakamoto, Atsushi; Sano, Yuichi; Takeuchi, Masayuki; Ito, Kazuyuki*; Sekita, Satoshi*; Sakamoto, Yukio*; Akutsu, Koichi*
no journal, ,
no abstracts in English
