Neutron imaging technology and diverse applications; Observation of microstructures in Cu using Bragg edge imaging

Oba, Yojiro; Sasaki, Hirokazu*

Nihon Genshiryoku Gakkai-Shi ATOMO, 65(8), p.499 - 502, 2023/08

https://doi.org/10.3327/jaesjb.65.8_499

no abstracts in English

Characterization of precipitated phase in Cu-Ni-Si alloy by small angle X-ray scattering, small angle neutron scattering and atom probe tomography

Sasaki, Hirokazu*; Akiya, Shunta*; Oba, Yojiro; Onuma, Masato*; Giddings, A. D.*; Okubo, Tadakatsu*

Do To Dogokin, 60(1), p.309 - 314, 2021/08

https://doi.org/10.34562/jic.60.1_309

no abstracts in English

Characterization of BaZrO nanocolumns in Zr-added (Gd,Y)BaCuOx superconductor tape by anomalous small-angle X-ray scattering

Oba, Yojiro; Sasaki, Hirokazu*; Yamazaki, Satoshi*; Nakasaki, Ryusuke*; Onuma, Masato*

Superconductor Science and Technology, 32(5), p.055011_1 - 055011_5, 2019/05

https://doi.org/10.1088/1361-6668/ab0f55

Characterization of pinning site in high-temperature superconducting wire using anomalous small-angle X-ray scattering

Sasaki, Hirokazu*; Yamazaki, Satoshi*; Nakasaki, Ryusuke*; Oba, Yojiro; Onuma, Masato*; Sugiyama, Masaaki*

no journal, , 

no abstracts in English

Characterization of pinning center in Zr-doped (Gd,Y)BaCuO superconductor tape by anomalous small-angle X-ray scattering

Oba, Yojiro; Sasaki, Hirokazu*; Yamazaki, Satoshi*; Nakasaki, Ryusuke*; Onuma, Masato*

no journal, , 

Since pinning centers are closely related to the physical properties in Zr-doped (Gd,Y)BaCuO superconductor tapes, the accurate characterization of the pinning centers is required. Although small-angle X-ray scattering (SAXS) is suitable for this purpose, weak scattering contrast between (Gd,Y)BaCuO matrix and BaZrO pinning center is a problem. Therefore, anomalous small-angle X-ray scattering (ASAXS) at Zr K absorption edge was performed. Since Zr is concentrated in only the pinning center, the scattering of the pinning center is enhanced. As the result, we successfully observed the scattering of the pinning centers in the Zr-doped (Gd,Y)BaCuO tapes. The detail of the nanostructures of the pinning centers is discussed.

Characterization of secondary phase in Cu alloy by small-angle scattering and TEM

Sasaki, Hirokazu*; Isomatsu, Takemi*; Higuchi, Masaru*; Oba, Yojiro; Onuma, Masato*

no journal, , 

no abstracts in English

Nano-scale precipitates in Corson alloy during aging process characterized by in-situ small-angle X-ray scattering

Yamazaki, Satoshi*; Hirose, Kiyoshige*; Sasaki, Hirokazu*; Oba, Yojiro; Miyazawa, Tomotaka*; Onuma, Masato*

no journal, , 

no abstracts in English

Characterization of precipitated phase in Cu-Ni-Si alloy by small-angle X-ray scattering, small-angle neutron scattering, and atom probe tomography, 2

Sasaki, Hirokazu*; Akiya, Shunta*; Oba, Yojiro; Onuma, Masato*; Okubo, Tadakatsu*; Uzuhashi, Jun*

no journal, , 

no abstracts in English