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Izumida, Wataru*; Okuyama, Rin*; Sato, Kentaro*; Kato, Takeo*; Matsuo, Mamoru
Physical Review Letters, 128(1), p.017701_1 - 017701_6, 2022/01
Times Cited Count:4 Percentile:67.44(Physics, Multidisciplinary)Watanabe, So; Katai, Yuya*; Matsuura, Haruaki*; Kada, Wataru*; Koka, Masashi*; Sato, Takahiro*; Arai, Tsuyoshi*
Nuclear Instruments and Methods in Physics Research B, 450, p.61 - 65, 2019/07
Times Cited Count:2 Percentile:23.19(Instruments & Instrumentation)Sato, Wataru*; Komatsuda, Sayaka*; Osa, Akihiko; Sato, Tetsuya; Okubo, Yoshitaka*
Hyperfine Interactions, 237(1), p.113_1 - 113_6, 2016/12
Times Cited Count:2 Percentile:61.78(Physics, Atomic, Molecular & Chemical)The magnetic hyperfine field and electric field gradient at theCd( Cd) and Cd(In) probe nuclei introduced in a perovskite manganese oxide ( 250 K) were measured for the study of the local magnetism and structure by means of time-differential perturbed angular correlation spectroscopy. In the ferromagnetic phase at 77 K, a very slight supertransferred magnetic hyperfine field (SMHF) ( 0.014 T) combined with a well-defined electric field gradient was observed at the nonmagnetic Cd nucleus on the La/Ca A site. This observation suggests that the large magnetic hyperfine field ( = 6.9 T) measured, in our previous work, at the Ce probe nucleus on the A site originates from the contribution of a 4 spin oriented by the SMHF from adjacent Mn ions.
Koka, Masashi; Ishii, Yasuyuki; Yamada, Naoto; Okubo, Takeru; Kada, Wataru*; Kitamura, Akane; Iwata, Yoshihiro*; Kamiya, Tomihiro; Sato, Takahiro
JAEA-Technology 2016-006, 41 Pages, 2016/03
A MeV-class light ion microbeam system has been developed for micro-analysis and micro-fabrication with high spatial resolution at 3-MV single-ended accelerator in Takasaki Ion Accelerators for Advanced Radiation Application of Takasaki Advanced Radiation Research Institute, Sector of Nuclear Science Research, Japan Atomic Energy Agency. This report describes the technical improvements for the main apparatus (the accelerator, beam-transport lines, and microbeam system), and auxiliary equipments/ parts for ion beam applications such as Particle Induced X-ray/Gamma-ray Emission (PIXE/PIGE) analysis, 3-D element distribution analysis using PIXE-Computed Tomography(CT), Ion Beam-Induced Luminescence (IBIL) analysis, and Proton Beam Writing with the microbeam scanning, with functional outline of these apparatus and equipments/parts.
Sato, Takahiro; Yokoyama, Akihito; Kitamura, Akane; Okubo, Takeru; Ishii, Yasuyuki; Takahatake, Yoko; Watanabe, So; Koma, Yoshikazu; Kada, Wataru*
Nuclear Instruments and Methods in Physics Research B, 371, p.419 - 423, 2016/03
Times Cited Count:7 Percentile:55.03(Instruments & Instrumentation)Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Shimada, Keisuke*; Yokota, Yuya*; Miura, Kenta*; Hanaizumi, Osamu*
Nuclear Instruments and Methods in Physics Research B, 371, p.340 - 343, 2016/03
Times Cited Count:6 Percentile:49.29(Instruments & Instrumentation)no abstracts in English
Kada, Wataru*; Kambayashi, Yuya*; Miura, Kenta*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Hanaizumi, Osamu*
Key Engineering Materials, 643, p.15 - 19, 2015/05
Kamiya, Tomihiro; Sato, Takahiro; Koka, Masashi; Kada, Wataru*
Nuclear Instruments and Methods in Physics Research B, 348, p.4 - 7, 2015/04
Times Cited Count:5 Percentile:39.96(Instruments & Instrumentation)Kada, Wataru*; Miura, Kenta*; Kato, Hijiri*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Ishii, Yasuyuki; Kamiya, Tomihiro; Nishikawa, Hiroyuki*; et al.
Nuclear Instruments and Methods in Physics Research B, 348, p.218 - 222, 2015/04
Times Cited Count:6 Percentile:45.92(Instruments & Instrumentation)Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Yamamoto, Shunya; Kamiya, Tomihiro; Yokota, Wataru
JAEA-Review 2014-050, JAEA Takasaki Annual Report 2013, P. 168, 2015/03
no abstracts in English
Yokota, Wataru; Sato, Takahiro; Kamiya, Tomihiro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Yoshida, Kenichi; Funayama, Tomoo; Sakashita, Tetsuya; et al.
JAEA-Technology 2014-018, 103 Pages, 2014/09
The world's first microbeam focusing technology for heavy ions of hundreds MeV accelerated by a cyclotron has been developed at the TIARA facility in the Takasaki Advanced Radiation Research Institute of the Japan Atomic Energy Agency. The technology enables us to form a microbeam of less than 1 m in diameter and to shoot a specified point on a target by one ion (single-ion hit) with spatial accuracy of microbeam size. In the course of the development, a cyclotron technology to accelerate a small energy-spread beam of hundres MeV, which is necessary for focusing to 1 m, has been developed as well as a beam focusing apparatus, beam size measurement and so forth based on the several-MeV microbeam/single-ion hit system of the TIARA electrostatic accelerators. Applicability of the technologies was examined by actual use in irradiation experiment and the result were fed back to them. This paper reports the process and the results of the development over ten years.
Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Yamamoto, Shunya; Kamiya, Tomihiro; Yokota, Wataru
Nuclear Instruments and Methods in Physics Research B, 332, p.334 - 336, 2014/08
Times Cited Count:1 Percentile:10.25(Instruments & Instrumentation)A system is developed for the real-time position detection of single-ions which hits a target with spatial accuracy about 1 m. The system combines highly luminescent, sensitive, scintillators with a high sensitivity luminescence detection system. The real-time detection system contains a AlO:Eu scintillator, Eu implanting into -AlO. A single-crystal scintillator has been selected since position resolution of emission for powdery scintillator is limited by a grain size, several micrometers for ZnS for example. When the material is irradiated with an electron or ion beam, the Eu is activated and strong luminescence occurs. The detection system includes an image intensifier tube and an electron multiplier CCD camera. The results show that our system can be sufficiently sensitive to detect the hit of a single-ion in real time through simple improvement in emission intensity of the scintillator.
Sato, Takahiro; Koka, Masashi; Kada, Wataru*; Yokoyama, Akihito; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 332, p.242 - 244, 2014/08
Times Cited Count:5 Percentile:38.03(Instruments & Instrumentation)Kada, Wataru*; Sato, Takahiro; Yokoyama, Akihito; Koka, Masashi; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 332, p.42 - 45, 2014/08
Times Cited Count:9 Percentile:57.19(Instruments & Instrumentation)no abstracts in English
Kada, Wataru*; Iwamoto, Naoya; Sato, Takahiro; Onoda, Shinobu; Grilj, V.*; Skukan, N.*; Koka, Masashi; Oshima, Takeshi; Jaki, M.*; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 331, p.113 - 116, 2014/07
Times Cited Count:24 Percentile:87.38(Instruments & Instrumentation)no abstracts in English
Kada, Wataru*; Yokoyama, Akihito; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro
Hoshasen To Sangyo, (136), p.40 - 45, 2014/06
no abstracts in English
Kada, Wataru; Yokoyama, Akihito; Koka, Masashi; Sato, Takahiro; Kamiya, Tomihiro
International Journal of PIXE, 23(1&2), p.47 - 53, 2014/05
no abstracts in English
Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Yamamoto, Shunya; Kamiya, Tomihiro; Yokota, Wataru
JAEA-Review 2013-059, JAEA Takasaki Annual Report 2012, P. 164, 2014/03
no abstracts in English
Yokota, Wataru; Sato, Takahiro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Yoshida, Kenichi; Koka, Masashi; Yokoyama, Akihito; Kada, Wataru*; et al.
JAEA-Review 2013-059, JAEA Takasaki Annual Report 2012, P. 160, 2014/03
no abstracts in English
Kada, Wataru; Sato, Takahiro; Yokoyama, Akihito; Koka, Masashi; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 318(Part A), p.42 - 46, 2014/01
Times Cited Count:16 Percentile:76.64(Instruments & Instrumentation)Combined techniques of PIXE and IL are currently investigated with proton microbeam for the precise analysis and imaging of microscopic targets. Spectroscopy of IL is able to characterize the chemical composition of the irradiation targets while the wavelength of the IL photons is strongly affected by the chemical-state of the elements. However, IL was not well obtained from the targets with size of micrometers comparing to the PIXE analysis because of the sensitivity and the S/N ratio of IL detection. In this study, we have developed a new optics for the IL measurement using confocal micro lens optics. Anti-reflection-coated convex lens was installed in a microbeam line of 3 MV single ended accelerator for in-air micro-PIXE analysis system. The focal points of the lens were set on the irradiation target and input terminal of optical fiber. The effective focus area on the target was approximately 800 800 um considering chromatic aberration of the IL photons ranging 300 to 950 nm. Electrically-cooled back-thin CCD spectrometer was used for the spectroscopic analysis of IL with a wavelength resolution of 0.5 nm in the range of 200 to 950 nm. The IL spectrum was clearly observed. The spectral analysis of IL was also applicable to the other natural mineral target and also particulate target like aerosols with different elemental and chemical compositions.