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Wakai, Eiichi; Jitsukawa, Shiro; Tomita, Hideki*; Furuya, Kazuyuki; Sato, Michitaka*; Oka, Keiichiro*; Tanaka, Teruyuki*; Takada, Fumiki; Yamamoto, Toshio*; Kato, Yoshiaki; et al.
Journal of Nuclear Materials, 343(1-3), p.285 - 296, 2005/08
Times Cited Count:48 Percentile:93.78(Materials Science, Multidisciplinary)The dependence of helium production on radiation-hardening and -embrittlement has been examined in a reduced-activation martensitic F82H steel doped with B, B and B+B irradiated at 250C to 2.2 dpa. The total amounts of doping boron were about 60 massppm. The range of He concentration produced in the specimens was from about 5 to about 300 appm. Tensile and fracture toughness tests were performed after neutron irradiation. 50 MeV-He irradiation was also performed to implant about 85 appm He atoms at 120C by AVF cyclotron to 0.03 dpa, and small punch testing was performed to obtain DBTT. Radiation-hardening of the neutron-irradiated specimens increased slightly with increasing He production. The 100 MPam DBTT for the F82H+B, F82H+B+B, and F82H+B were 40, 110, and 155C, respectively. The shifts of DBTT due to He production were evaluated as about 70C by 150 appmHe and 115C by 300 appmHe. The DBTT shift in the small punch testing was evaluated as 50C.
Wakai, Eiichi; Sato, Michitaka*; Okubo, Nariaki; Sawai, Tomotsugu; Shiba, Kiyoyuki; Jitsukawa, Shiro
Nihon Kinzoku Gakkai-Shi, 69(6), p.460 - 464, 2005/06
Times Cited Count:1 Percentile:16.26(Metallurgy & Metallurgical Engineering)no abstracts in English
Wakai, Eiichi; Sato, Michitaka*; Sawai, Tomotsugu; Shiba, Kiyoyuki; Jitsukawa, Shiro
Materials Transactions, 45(2), p.407 - 410, 2004/01
Times Cited Count:6 Percentile:41.09(Materials Science, Multidisciplinary)no abstracts in English
Hamajima, Takataro*; Hanai, Satoshi*; Wachi, Yoshihiro*; Shimada, Mamoru*; Ono, Michitaka*; Martovetsky, N.*; Zbasnik, J.*; Moller, J.*; Takahashi, Yoshikazu; Matsui, Kunihiro; et al.
IEEE Transactions on Applied Superconductivity, 10(1), p.812 - 815, 2000/03
Times Cited Count:10 Percentile:53.49(Engineering, Electrical & Electronic)no abstracts in English
Hamajima, Takataro*; Shimada, Mamoru*; Ono, Michitaka*; Takigami, Hiroyuki*; Hanai, Satoshi*; Wachi, Yoshihiro*; Takahashi, Yoshikazu; Matsui, Kunihiro; Ito, Toshinobu*; Isono, Takaaki; et al.
Teion Kogaku, 33(7), p.492 - 499, 1998/00
no abstracts in English
*; Hanai, S.*; Wachi, Y.*; *; *; Hamajima, Takataro*; *; Koizumi, Norikiyo; Ando, Toshinari; Tsuji, Hiroshi; et al.
Teion Kogaku, 33(7), p.485 - 491, 1998/00
no abstracts in English
Wachi, Y.*; Hanai, S.*; *; *; *; Hamajima, Takataro*; *; Nakajima, Hideo; Tsuji, Hiroshi; Shinoda, K.*; et al.
Teion Kogaku, 33(7), p.479 - 484, 1998/00
no abstracts in English