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Journal Articles

Real-time X-ray diffraction of metastable phases during solidification from the undercooled LuFeO$$_{3}$$ melt by two-dimensional detector at 1 kHz

Kumar, M. V.*; Kuribayashi, Kazuhiko*; Nagashio, Kosuke*; Ishikawa, Takehiko*; Okada, Jumpei*; Yu, J.*; Yoda, Shinichi*; Katayama, Yoshinori

Applied Physics Letters, 100(19), p.191905_1 - 191905_4, 2012/05

https://doi.org/10.1063/1.4712124
 Times Cited Count：2 Percentile：8.9(Physics, Applied)

${it In-situ}$ identification of metastable phases formed from the undercooled LuFeO$$_{3}$$ melt under controlled oxygen partial pressure $$P$$o$$_{2}$$ was studied by X-ray diffraction measurements at a synchrotron radiation source. Real-time observation of the formation and growth of individual phases during the single recalescence of Lu$$_{3}$$Fe$$_{2}$$O$$_{7}$$ and LuFe$$_{2}$$O$$_{4}$$ phases at $$P$$o$$_{2}$$ of 1$$times$$10$$^{3}$$ Pa has been revealed by a high speed imaging system at 1 kHz. The obtained diffraction pattern of the metastable phase in the LuFeO$$_{3}$$ system was consistent with that of the metastable and stable phases reported in the Lu-Fe-O system.

Journal Articles

Microstructure formation and in situ phase identification from undercooled Co-61.8 at.% Si melts solidified on an electromagnetic levitator and an electrostatic levitator

Li, M.*; Nagashio, Kosuke*; Ishikawa, Takehiko*; Mizuno, Akitoshi*; Adachi, Masayoshi*; Watanabe, Masahito*; Yoda, Shinichi*; Kuribayashi, Kazuhiko*; Katayama, Yoshinori

Acta Materialia, 56(11), p.2514 - 2525, 2008/06

https://doi.org/10.1016/j.actamat.2008.01.041
 Times Cited Count：23 Percentile：71.59(Materials Science, Multidisciplinary)

Co-61.8 at.% Si (CoSe-CoSi$$_{2}$$) eutectic alloys were solidified on an electromagnetic levitator (EML) and an electrostatic levitator (ESL) at different undercooling levels. The results indicated that there is only a single recalescence event at low undercooling with the CoSi intermetallic compound as primary phase, which is independent of processing facilities, on either an EML or an ESL. The microstructure, however, is strongly dependent on the processing facility. On high undercooling, double recalescence takes place regardless of levitation condition. In situ X-ray diffraction of alloys solidified on the EML demonstrates that the CoSi$$_{2}$$ compound becomes the primary phase upon the first recalescence, and the CoSi intermetallic phase crystallizes during the second recalescence. In addition to phase identification, real-time diffraction patterns can also provide additional evidence of the fragmentation of the primary phase.

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