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Toyokawa, Hidenori*; Saji, Choji*; Kawase, Morihiro*; Wu, S.*; Hurukawa, Yukihito*; Kajiwara, Kentaro*; Sato, Masugu*; Hirono, Toko*; Shiro, Ayumi*; Shobu, Takahisa; et al.
Journal of Instrumentation (Internet), 12(1), p.C01044_1 - C01044_7, 2017/01
Times Cited Count：4 Percentile：21.22(Instruments & Instrumentation)We have been developing CdTe pixel detectors combined with a Schottky diode sensor and photon-counting ASICs. The hybrid pixel detector was designed with a pixel size of 200 micro-meter by 200 micro-meter and an area of 19 mm by 20 mm or 38.2 mm by 40.2 mm. The photon-counting ASIC, SP8-04F10K, has a preamplifier, a shaper, 3-level window-type discriminators and a 24-bits counter in each pixel. The single-chip detector with 100 by 95 pixels successfully operated with a photon-counting mode selecting X-ray energy with the window comparator and stable operation was realized at 20
C. We have performed a feasibility study for a white X-ray microbeam experiment. Laue diffraction patterns were measured during the scan of the irradiated position in a silicon steel sample. The grain boundaries were identified by using the differentials between adjacent images at each position.
Yoneda, Yasuhiro; Matsumoto, Norimasa; Furukawa, Yukito*; Ishikawa, Tetsuya*
Physica Scripta, T115, p.995 - 997, 2005/00
Sagittal focusing is known as one of the most efficient focusing methods for synchrotron X-rays which increases the photon density at the sample position. Results are reported on the performance of a fixed height exit bender with an unribbed silicon (311) crystal. The fixed height exit was achieved by using a 4-point bending mechanism. This bending mechanism is designed for the SPring-8 standard double crystal monochromator (DCM) of bending-magnet beamlines and the bender is installed as a second crystal of the DCM. By using unribbed crystal, the focusing beam size was kept 0.5 mm in the energy ranges from 35 - 60 keV. Since mirrors for high-energy X-rays are still under development at the moment, focusing techniques by crystal bender are demanded for many practical applications.
Yoneda, Yasuhiro; Matsumoto, Norimasa; Furukawa, Yukito*; Ishikawa, Tetsuya*
SPring-8 Riyosha Joho, 8(6), p.397 - 400, 2003/11
no abstracts in English
Sakata, Osami*; Furukawa, Yukito*; Goto, Shunji*; Mochizuki, Tetsuro*; Uruga, Tomoya*; Takeshita, Kunikazu*; Ohashi, Haruhiko*; Ohata, Toru*; Matsushita, Tomohiro*; Takahashi, Sunao*; et al.
Surface Review and Letters, 10(2&3), p.543 - 547, 2003/04
Times Cited Count：141 Percentile：96.38(Chemistry, Physical)The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt(111) surface.
Yoneda, Yasuhiro; Matsumoto, Norimasa; Furukawa, Yukito*; Ishikawa, Tetsuya*
AIP Conference Proceedings 705 (CD-ROM), 4 Pages, 2003/00
Results are reported on the performance of a fixed height exit bender with an unribbed silicon (311) crystal. The anticlasic crveture can be minimized for a recutangular Si (311) focusing crystal with "clamped" or "builtin" boundary conditions if the length to width ratio of the crystal is 1.42. The test crystal used in this study was manufactured from a 98mm
90mm2mm dimension of float zone silicon. After final etching, the ratio of the crystal is 1.435. The sub-millimeter sagittal focusing was achieved by using a 4-point bending mechanism in energy ranges from 30keV to 60keV.
Yoneda, Yasuhiro; Matsumoto, Norimasa; Furukawa, Yukito*; Ishikawa, Tetsuya*
Journal of Synchrotron Radiation, 8(1), p.18 - 21, 2001/08
Times Cited Count：41 Percentile：85.19(Instruments & Instrumentation)no abstracts in English
Yoneda, Yasuhiro; Matsumoto, Norimasa; Furukawa, Yukito*; Ishikawa, Tetsuya*
Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.370 - 372, 2001/07
Times Cited Count：6 Percentile：44.09(Instruments & Instrumentation)no abstracts in English
