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Journal Articles

Data of heavy elements for light sources in EUV and XUV and for other applications

Koike, Fumihiro*; Funaba, Hisamichi*; Goto, Motoshi*; Kato, Daiji*; Kato, Takako*; Morita, Shigeru*; Murakami, Izumi*; Sakaue, Hiroyuki*; Sudo, Shigeru*; Suzuki, Chihiro*; et al.

AIP Conference Proceedings 1545, p.202 - 211, 2013/07

 Times Cited Count:4 Percentile:83.46(Physics, Applied)

Atomic ionic states and transition properties of elements with atomic numbers Z ranging from 50 to 80 are discussed as these are important to the understanding of plasmas containing such heavy elements. As such, data productions and the current status of theoretical calculations in this field are discussed. Further, recent spectroscopic measurements and respective theoretical analyses for W, Gd, and Nd are provided.

Journal Articles

A Study of tungsten spectra using Large Helical Device and Compact Electron Beam Ion Trap in NIFS

Morita, Shigeru*; Dong, C. F.*; Goto, Motoshi*; Kato, Daiji*; Murakami, Izumi*; Sakaue, Hiroyuki*; Hasuo, Masahiro*; Koike, Fumihiro*; Nakamura, Nobuyuki*; Oishi, Tetsutaro*; et al.

AIP Conference Proceedings 1545, p.143 - 152, 2013/07

 Times Cited Count:29 Percentile:99.19(Physics, Applied)

Tungsten spectra have been observed from Large Helical Device (LHD) and Compact electron Beam Ion Trap (CoBIT) in wavelength ranges of visible to EUV. The tungsten spectra from LHD are well analyzed based on the knowledge from CoBIT tungsten spectra. The C-R model code has been developed to explain the UTA spectra in details. Radial profiles of EUV spectra from highly ionized tungsten ions have been measured and analyzed by impurity transport simulation code with ADPAK atomic database code to examine the ionization balance determined by ionization and recombination rate coefficients. The ablation cloud of the impurity pellet is directly measured with visible spectroscopy.

Journal Articles

Complementary spectroscopy of tin ions using ion and electron beams

Ohashi, Hayato*; Suda, Shintaro*; Tanuma, Hajime*; Fujioka, Shinsuke*; Nishimura, Hiroaki*; Nishihara, Katsunobu*; Kai, Takeshi; Sasaki, Akira; Sakaue, Hiroyuki*; Nakamura, Nobuyuki*; et al.

Journal of Physics; Conference Series, 163, p.012071_1 - 012071_4, 2009/06

 Times Cited Count:7 Percentile:89.22(Physics, Multidisciplinary)

Extreme ultra-violet (EUV) emission spectra of multiply charged tin ions were measured in the wavelength range of 10-22 nm following charge exchange collisions or the electron impact excitation of tin ions. In charge exchange collisions, we observed both the resonance lines and the emission lines corresponding to the transitions between the excited states. On the other hand, we observed mainly the resonance lines in the electron impact experiments. We can distinguish the resonance lines from other emission lines in the charge exchange spectrum by comparison with the emission lines in the electron impact spectrum.

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