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Np and 
Am gamma ray regionsFukuda, Tatsuo; Kobata, Masaaki; Shobu, Takahisa; Yoshii, Kenji; Kamiya, Junichiro; Iwamoto, Yosuke; Makino, Takahiro*; Yamazaki, Yuichi*; Oshima, Takeshi*; Shirai, Yasuhiro*; et al.
Journal of Applied Physics, 132(24), p.245102_1 - 245102_8, 2022/12
Times Cited Count：1 Percentile：17.38(Physics, Applied)Direct energy conversion has been investigated using Ni/SiC Schottky junctions with the irradiation of monochromatized synchrotron X-rays simulating the gamma rays of Np (30 keV) and Am (60 keV). From current-voltage measurements, electrical energies were obtained for both kinds of gamma rays. The energy conversion efficiencies were found to reach up to 
1.6%, which is comparable to those of a few other semiconducting systems reported thus far. This result shows a possibility of energy recovery from nuclear wastes using the present system, judging from the radiation tolerant nature of SiC. Also, we found different conversion efficiencies between the two samples. This could be understandable from hard X-ray photoelectron spectroscopy and secondary ion mass spectroscopy measurements, suggesting the formation of Ni-Si compounds at the interface in the sample with a poor performance. Hence, such combined measurements are useful to provide information that cannot be obtained by electrical measurements alone.
Entani, Shiro*; Sato, Shinichiro*; Honda, Mitsunori; Suzuki, Chihiro*; Taguchi, Tomitsugu*; Yamamoto, Shunya*; Oshima, Takeshi*
Radiation Physics and Chemistry, 199, p.110369_1 - 110369_7, 2022/10
Times Cited Count：1 Percentile：31.61(Chemistry, Physical)Ni silicide synthesis by Ni ion beam irradiation into Si attracts attention due to its advantages including the ability of formation of local structures, the controllability of ion beams, the formability of silicide without heat treatment and the high reproducibility of the resulting specimen. In this work, we investigate the local atomic structure of Si implanted with 3.0 MeV Ni
ions. Analysis of Ni K-edge fluorescent-yield extended X-ray absorption fine structure reveals that Ni atoms have mixed structure of metallic-like face-centered cubic Ni and NiSi
phases at the initial stage of the irradiation and the formation of NiSi promotes significantly with the ion fluence above 10 
ions cm
. With consideration of the agreement between the ion fluence threshold for the structural transition and the critical Si-amorphization fluence, it is concluded that the amorphization of Si plays an important role in the synthesis of the NiSi phase in Ni-irradiated Si.
Iwamoto, Naoya*; Azarov, A.*; Oshima, Takeshi; Moe, A. M. M.*; Svensson, B. G.*
Materials Science Forum, 858, p.357 - 360, 2016/05
Lohrmann, A.*; Castelletto, S.*; Klein, J. R.*; Oshima, Takeshi; Bosi, M.*; Negri, M.*; Lau, D. W. M.*; Gibson, B. C.*; Prawer, S.*; McCallum, J. C.*; et al.
Applied Physics Letters, 108(2), p.021107_1 - 021107_4, 2016/01
Times Cited Count：38 Percentile：82.81(Physics, Applied)Oshima, Takeshi; Yokoseki, Takashi; Murata, Koichi; Matsuda, Takuma; Mitomo, Satoshi; Abe, Hiroshi; Makino, Takahiro; Onoda, Shinobu; Hijikata, Yasuto*; Tanaka, Yuki*; et al.
Japanese Journal of Applied Physics, 55(1S), p.01AD01_1 - 01AD01_4, 2016/01
Times Cited Count：14 Percentile：54.92(Physics, Applied)Abe, Hiroshi; Tokuhira, Shinnosuke*; Uchida, Hirohisa*; Oshima, Takeshi
Nuclear Instruments and Methods in Physics Research B, 365(Part A), p.214 - 217, 2015/12
no abstracts in English
Onoda, Shinobu; Haruyama, Moriyoshi; Teraji, Tokuyuki*; Isoya, Junichi*; Kada, Wataru*; Hanaizumi, Osamu*; Oshima, Takeshi
Physica Status Solidi (A), 212(11), p.2641 - 2644, 2015/11
Times Cited Count：11 Percentile：44.98(Materials Science, Multidisciplinary)Kraus, H.; Simin, D.*; Fuchs, F.*; Onoda, Shinobu; Makino, Takahiro; Dyakonov, V.*; Oshima, Takeshi
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.176 - 179, 2015/11
Shibata, Yuichi*; Imaizumi, Mitsuru*; Sato, Shinichiro; Oshima, Takeshi; Ooka, Sachiyo*; Takamoto, Tatsuya*
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.65 - 68, 2015/11
Radiation response is one of the important properties for space solar cells. It should be well understood so as to accurately predict their degradation in orbit and also to improve their radiation tolerance. Recently, a phenomenon, recovery from the radiation degradation by light soaking, on inverted metamorphic (IMM) triple-junction (3J) solar cells was found out. In this work, the light soaking annealing effects on electron irradiated IMM 3J solar cells are reported. IMM 3J solar cells irradiated with 1 MeV electrons with the fluence of 3
10 e
/cm
showed the recovery of open-circuit voltage, Voc, up to 43 mV after light (AM0, 1 sun) soaking of 3 hours. The increment of the electroluminescence intensity for InGaP in the IMM 3J cells due to the light soaking suggests that the Voc recovery occurs in InGaP top-cell rather than GaAs middle-cell or InGaAs bottom-cell.
Nakamura, Tetsuya*; Imaizumi, Mitsuru*; Sato, Shinichiro; Sugaya, Takeyoshi*; Mochizuki, Toru*; Okano, Yoshinobu*; Oshima, Takeshi
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.73 - 76, 2015/11
The radiation effect on GaAs p-i-n solar cells with quantum dot (QD) in the i-layer was investigated. In a previous work, we particularly noted the degradation of fill-factor (FF) for the QD cells. In this work, to clarify the reason of the FF degradation in QD cells, generation current due to low-energy proton irradiation, which we call ion beam induced current (IBIC), was observed to characterize behavior of the generated minority carrier by the protons in the depletion region where QDs are located. The energy of protons was adjusted to damage the depletion region, and decrease of generation current was measured during the proton irradiation. The results suggest that the serious degradation of FF is caused by a decrease of the carrier collection efficiency in the depletion region due to proton damage.
Hijikata, Yasuto*; Mitomo, Satoshi*; Matsuda, Takuma*; Murata, Koichi*; Yokoseki, Takashi*; Makino, Takahiro; Takeyama, Akinori; Onoda, Shinobu; Okubo, Shuichi*; Tanaka, Yuki*; et al.
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.130 - 133, 2015/11
Takeyama, Akinori; Matsuda, Takuma; Yokoseki, Takashi; Mitomo, Satoshi; Murata, Koichi; Makino, Takahiro; Onoda, Shinobu; Tanaka, Yuki*; Kandori, Mikio*; Yoshie, Toru*; et al.
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.134 - 137, 2015/11
Haruyama, Moriyoshi; Onoda, Shinobu; Kada, Wataru*; Teraji, Tokuyuki*; Isoya, Junichi*; Oshima, Takeshi; Hanaizumi, Osamu*
Proceedings of 11th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-11) (Internet), p.184 - 187, 2015/11
Abe, Hiroshi; Shimomura, Takuya; Tokuhira, Shinnosuke*; Shimada, Yukihiro*; Takenaka, Yusuke*; Furuyama, Yuta*; Nishimura, Akihiko; Uchida, Hirohisa*; Daido, Hiroyuki; Oshima, Takeshi
Proceedings of 7th International Congress on Laser Advanced Materials Processing (LAMP 2015) (Internet), 4 Pages, 2015/08
A short pulse laser (the nanosecond and femtosecond) was applied to hydrogen absorbing alloys surface layer, and a surface modification experiment was put into effective to aim at improvement of hydrogen adsorption functionally. It was investigated about correlation between an initial hydrogen absorption reaction rate of hydrogen alloys and a laser irradiation in this research. The laser irradiation condition was done with pulse width 100 fsec and energy 0.2 - 3.4 mJ/pulse. It blazed down on hydrogen absorbing alloys (LaNi
Al
) and changed local order in the surface. As a result, the initial hydrogen absorption reaction rate was 1.5 - 3.0 times as fast as a irradiated sample, and the result and laser irradiated sample found out that a hydrogen absorption function improves. A laser irradiation can conclude to be effective in surface modification of the hydrogen storage materials.
Iwamoto, Naoya*; Azarov, A.*; Oshima, Takeshi; Moe, A. M. M.*; Svensson, B. G.*
Journal of Applied Physics, 118(4), p.045705_1 - 045705_8, 2015/07
Times Cited Count：6 Percentile：27.03(Physics, Applied)Yokoseki, Takashi; Abe, Hiroshi; Makino, Takahiro; Onoda, Shinobu; Tanaka, Yuki*; Kandori, Mikio*; Yoshie, Toru*; Hijikata, Yasuto*; Oshima, Takeshi
Materials Science Forum, 821-823, p.705 - 708, 2015/07
Lohrmann, A.*; Iwamoto, Naoya*; Bodrog, Z.*; Castelletto, S.*; Oshima, Takeshi; Karle, T. J.*; Gali, A.*; Prawer, S.*; McCallum, J. C.*; Johnson, B. C.*
Nature Communications (Internet), 6, p.7783_1 - 7783_7, 2015/07
Times Cited Count：143 Percentile：96.84(Multidisciplinary Sciences)
SGo, Shintaro*; Ideguchi, Eiji*; Yokoyama, Rin*; Kobayashi, Motoki*; Kisamori, Keiichi*; Takaki, Motonobu*; Miya, Hiroyuki*; Ota, Shinsuke*; Michimasa, Shinichiro*; Shimoura, Susumu*; et al.
JPS Conference Proceedings (Internet), 6, p.030005_1 - 030005_4, 2015/06
Sato, Shinichiro; Beernink, K.*; Oshima, Takeshi
Japanese Journal of Applied Physics, 54(6), p.061401_1 - 061401_6, 2015/06
Times Cited Count：5 Percentile：22.94(Physics, Applied)Performance degradation and immediate recovery of a-Si/a-SiGe/a-SiGe triple-junction solar cells due to irradiation of silicon ions, electrons, and protons are investigated. Significant recovery is always observed independent of radiation species and temperature. It is shown that the characteristic time, which is obtained by analyzing the short-circuit current annealing behavior, is an important parameter for practical applications in space. In addition, the radiation degradation mechanism is discussed by analyzing the energy loss process of incident particles (ionizing energy loss: IEL, and non-ionizing energy loss: NIEL) and their relative damage factors. It is determined that ionizing dose is the primarily parameter for electron degradation whereas displacement damage dose is the primarily parameter for proton degradation. The impact of "radiation quality effect" has to be considered to understand the degradation due to Si ion irradiation.
Sato, Shinichiro; Schmieder, K. J.*; Hubbard, S. M.*; Forbes, D. V.*; Warner, J. H.*; Oshima, Takeshi; Walters, R. J.*
Proceedings of 42nd IEEE Photovoltaic Specialists Conference (PVSC-42) (CD-ROM), 5 Pages, 2015/06
GaAs pn-junction diodes with embedded InAs quantum dots (QDs) are irradiated with protons and the generated deep level traps are investigated using Deep Level Transient Spectroscopy (DLTS). The results are compared to GaAs pn-junction diodes without QDs in order to identify the origin of the deep level traps. The fluence dependence of trap density is investigated, and it is shown that majority carrier traps induced by irradiation increase in proportion to the fluence whereas the EL2 trap, which appears before irradiation, is not affected by irradiation. In addition, minority carrier traps in the QD layer and electron/hole emission from QD levels are investigated by various reverse bias and pulse voltage conditions.
