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Iyota, Muneyoshi*; Matsuda, Tomoki*; Sano, Tomokazu*; Shigeta, Masaya*; Shobu, Takahisa; Yumoto, Hirokatsu*; Koyama, Takahisa*; Yamazaki, Hiroshi*; Semba, Yasunori*; Ohashi, Haruhiko*; et al.
Journal of Manufacturing Processes, 94, p.424 - 434, 2023/05
Times Cited Count：3 Percentile：57.26(Engineering, Manufacturing)Pikuz, T.*; Faenov, A.*; Matsuoka, Takeshi*; Matsuyama, Satoshi*; Yamauchi, Kazuto*; Ozaki, Narimasa*; Albertazzi, B.*; Inubushi, Yuichi*; Yabashi, Makina*; Tono, Kensuke*; et al.
Scientific Reports (Internet), 5, p.17713_1 - 17713_10, 2015/12
Times Cited Count：38 Percentile：87.97(Multidisciplinary Sciences)Sato, Takahiro*; Iwasaki, Atsushi*; Owada, Shigeki*; Yamanouchi, Kaoru*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Togashi, Tadashi*; Fukami, Kenji*; et al.
Journal of Physics B; Atomic, Molecular and Optical Physics, 46(16), p.164006_1 - 164006_6, 2013/08
Times Cited Count：3 Percentile：19.06(Optics)By introducing 13th- (61.7 nm) and 15th-order harmonics (53.4 nm) of femtosecond laser pulses at 800 nm into an undulator of SCSS (SPring-8 Compact SASE Source) test accelerator at RIKEN, these harmonic pulses were amplified by a factor of more than 10
with a high contrast ratio through the interaction between accelerated electron bunches and the harmonic pulses. From numerical simulations of the amplification processes of high-order harmonic pulses in the undulator, optimum conditions of the electron bunch duration interacting with the high-order harmonic pulses were investigated for generating full-coherent and intense pulses in the extreme ultraviolet wavelength region.
Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Kando, Masaki; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; et al.
Optics Express (Internet), 20(4), p.3424 - 3433, 2012/02
Times Cited Count：27 Percentile：76.85(Optics)Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
Physical Review Letters, 107(19), p.193603_1 - 193603_5, 2011/11
Times Cited Count：37 Percentile：82.81(Physics, Multidisciplinary)Inogamov, N. A.*; Anisimov, S. I.*; Petrov, Y. V.*; Khokhlov, V. A.*; Zhakhovskii, V. V.*; Faenov, A. Ya.*; Pikuz, T.; Fortov, V. E.*; Skobelev, I. Y.*; Kato, Yoshiaki*; et al.
Journal of Optical Technology, 78(8), p.473 - 480, 2011/08
Times Cited Count：6 Percentile：32.94(Optics)Inogamov, N. A.*; Faenov, A. Ya.*; Zhakhovsky, V. V.*; Pikuz, T. A.*; Skobelev, I. Yu.*; Petrov, Y. V.*; Khokhlov, V. A.*; Shepelev, V. V.*; Anisimov, S. I.*; Fortov, V. E.*; et al.
Contributions to Plasma Physics, 51(5), p.419 - 426, 2011/06
Times Cited Count：20 Percentile：64.22(Physics, Fluids & Plasmas)Warm dense matter, arising under the action of ultrashort EUV-FEL pulse onto LiF dielectric crystal, is characterized by high temperature of conduction electrons, with their number density achieving values of the order of atom number density at maximum laser fluences in our experiments. Expansion of matter, heated and pressurized through the electron-ion energy exchange, gives rise to the spallative ablation at small fluences and gaseous outflow from a target in the case of large fluences. Ablation threshold is low in comparison with a longer nanosecond XRL.
Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Sato, Takahiro*; Iwasaki, Atsushi*; Owada, Shigeki*; Okino, Tomoya*; Yamanouchi, Kaoru*; et al.
Optics Express (Internet), 19(1), p.317 - 324, 2011/01
Times Cited Count：96 Percentile：96.45(Optics)The 13th harmonic of a Ti:sapphire (Ti:S) laser in the plateau region was injected as a seeding source to a 250-MeV free-electron-laser (FEL) amplifier. When the amplification conditions were fulfilled, strong enhancement of the radiation intensity by a factor of 650 was observed. The random and uncontrollable spikes, which appeared in the spectra of the Self-Amplified Spontaneous Emission (SASE) based FEL radiation without the seeding source, were found to be suppressed drastically to form to a narrow-band, single peak profile at 61.2 nm. The properties of the seeded FEL radiation were well reproduced by numerical simulations. We discuss the future precept of the seeded FEL scheme to the shorter wavelength region.
Sakata, Osami*; Furukawa, Yukito*; Goto, Shunji*; Mochizuki, Tetsuro*; Uruga, Tomoya*; Takeshita, Kunikazu*; Ohashi, Haruhiko*; Ohata, Toru*; Matsushita, Tomohiro*; Takahashi, Sunao*; et al.
Surface Review and Letters, 10(2&3), p.543 - 547, 2003/04
Times Cited Count：141 Percentile：96.38(Chemistry, Physical)The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt(111) surface.
Goto, Shunji*; Takeshita, Kunikazu*; Suzuki, Yoshio*; Ohashi, Haruhiko*; Asano, Yoshihiro; Kimura, Hiroaki*; Matsushita, Tomohiro*; Yagi, Naoto*; Isshiki, M.*; Yamazaki, H.*; et al.
Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.682 - 685, 2001/07
no abstracts in English
Goto, Shunji*; Ohashi, Haruhiko*; Takeshita, Kunikazu*; Yabashi, Makina*; Yamakata, Masaaki*; Asano, Yoshihiro; Ishikawa, Tetsuya*
Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.813 - 815, 2001/07
Times Cited Count：3 Percentile：28.27(Instruments & Instrumentation)no abstracts in English
Goto, Shunji*; Takeshita, Kunikazu*; Suzuki, Yoshio*; Ohashi, Haruhiko*; Asano, Yoshihiro; Kimura, Hiroaki*; Matsushita, Tomohiro*; Yagi, Naoto*; Isshiki, Maiko*; Yamazaki, H.*; et al.
Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.682 - 685, 2001/07
Times Cited Count：140 Percentile：99.13(Instruments & Instrumentation)no abstracts in English
Fukuda, Yuji; Faenov, A. Y.; Pikuz, T. A.*; Nagasono, Mitsuru*; Azumaya, Atsushi*; Togashi, Tadashi*; Yabashi, Makina*; Kimura, Hiroaki*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*
no journal, ,
Using extreme ultraviolet free electron laser (EUVFEL), images of metal mesh, metal thin foil, and biological objects in a wide field of view with high spatial resolution are obtained with high dynamic range LiF crystal detectors. The single shot image of the metal mesh shows a full spatial coherence of EUVFEL light, and a beam diameter of 9.0
8.4 mm (fwhm).
Fukuda, Yuji; Faenov, A. Y.; Pikuz, T. A.*; Ohashi, Haruhiko*; Semba, Yasunori*; Nagasono, Mitsuru*; Tono, Kensuke*; Togashi, Tadashi*; Yabashi, Makina*; Ishikawa, Tetsuya*
no journal, ,
We have conducted detailed focused spot shape measurements for EUVFEL using a LiF crystal radiation detector. The single shot focused spot images were recorded on the LiF detector surface as a function of detector position. As a result, we found that the spot images were distorted due to aberrations, and that laser beam was focused about 1-mm up to the laser beam axis. Moreover, we found that the LiF crystal was ablated due to high intensity of the focused beam.
Inogamov, N. A.*; Faenov, A. Y.; Pikuz, T.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Faenov, A. Y.; Pikuz, T.*; Inogamov, N. A.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Harries, J.; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Tono, Kensuke*; Togashi, Tadashi*; Semba, Yasunori*; Ohashi, Haruhiko*; Yabashi, Makina*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
no abstracts in English
Faenov, A.*; Pikuz, T.; Fukuda, Yuji; Tanaka, Momoko; Kishimoto, Maki; Ishino, Masahiko; Nishikino, Masaharu; Kando, Masaki; Kawachi, Tetsuya; Nagasono, Mitsuru*; et al.
no journal, ,
