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Kobayashi, Yoshinori*; Sato, Kiminori*; Yamawaki, Masato*; Michishio, Koji*; Oka, Toshitaka; Washio, Masakazu*
Radiation Physics and Chemistry, 202, p.110590_1 - 110590_6, 2023/01
Times Cited Count：3 Percentile：68.71(Chemistry, Physical)Because of their different charge states, positrons and positronium (Ps) behave quite differently in macromolecules. The behavior of positively charged positrons is strongly influenced by electrostatic interactions. In nonpolar macromolecules such as polyethylene, energetic positrons, if not incorporated into Ps, fall into a delocalized state. These positrons are sensitively trapped by polar groups, if any. On the other hand, charge-neutral Ps is localized in a free volume regardless of the macromolecule's chemical structure. In this study, we discuss the behavior and annihilation characteristics of positrons and Ps in various macromolecules, emphasizing their differences.
Kobayashi, Yoshinori*; Sato, Kiminori*; Yamawaki, Masato*; Michishio, Koji*; Oka, Toshitaka; Washio, Masakazu*
Applied Physics Express, 15(7), p.076001_1 - 076001_4, 2022/07
Times Cited Count：2 Percentile：34.67(Physics, Applied)We discuss the energy dissipation of short-lived 
-positronium (
-Ps) in polymers and silica glass. The 
parameter characterizing the Doppler broadening of -Ps annihilation is determined from the previously reported systematic data of positron annihilation age momentum correlation for various polymers and silica glass. A comparison of the parameter with that expected for thermalized -Ps trapped in a free volume reveals that -Ps is not thermalized and possesses excess energy in fluorinated polymers and silica glass, indicating that it is difficult for Ps to lose energy in substances containing heavy elements such as fluorine and silicon.
Hirade, Tetsuya; Michishio, Koji*; Kobayashi, Yoshinori*; Oshima, Nagayasu*
Chemical Physics Letters, 795, p.139507_1 - 139507_4, 2022/05
Times Cited Count：0 Percentile：0.01(Chemistry, Physical)We obtained the temperature dependence up to 150
C of the triplet positronium (
-Ps) lifetime in N,N,N-Trimethyl-N-propylammonium bis(trifluoromethanesulfonyl)imide (TMPA-TFSI) by the vertical slow positron beamline installed at AIST. Positrons penetrate into the liquid surface of TMPA-TFSI with the positron energies of 2 keV and 12 keV to investigate at the near-surface and the balk. The surface structure was visible at 150C, 120C above the melting temperature. The -Ps lifetime became shorter at higher temperatures for both positron energies. Similar temperature dependence had appeared just in water as the result of the reaction of -Ps and radiolysis products such as the OH radicals. The temperature dependence observed for TMPA-TFSI suggested that the chemical reaction of -Ps occurred.
Yamawaki, Masato*; Uesugi, Naoya*; Oka, Toshitaka; Nagasawa, Naotsugu*; Ando, Hirokazu*; O'Rourke, B. E.*; Kobayashi, Yoshinori*
Japanese Journal of Applied Physics, 59(11), p.116504_1 - 116504_5, 2020/11
Positron annihilation lifetime measurements were performed on polyethylene films with thickness of 15
m - 2000m using a Na-22 positron source enclosed in a Kapton film. For thin films, some positrons will pass through the film and annihilate behind it. Using a single film in a commercial anti-coincidence system, by placing an annealed stainless steel (SUS304) cover behind the sample, it is possible to sufficiently measure the long lifetime ortho-positronium (o-Ps) component even in thin films. Additionally, calculated intensities of the o-Ps component determined from the estimated film transmittance agreed well with the measured values. Furthermore, by applying this method to uniaxially stretched UHMWPE, we were able to observe structural changes owing to the stretching consistent with shorter measured o-Ps lifetime and increased o-Ps intensity.
Al
GaO
scintillators by gamma-ray-induced positron annihilation lifetime spectroscopyFujimori, Kosuke*; Kitaura, Mamoru*; Taira, Yoshitaka*; Fujimoto, Masaki*; Zen, H.*; Watanabe, Shinta*; Kamada, Kei*; Okano, Yasuaki*; Kato, Masahiro*; Hosaka, Masahito*; et al.
Applied Physics Express, 13(8), p.085505_1 - 085505_4, 2020/08
Times Cited Count：5 Percentile：33.01(Physics, Applied)To clarify the existence of cation vacancies in Ce-doped GdAlGaO (Ce:GAGG) scintillators, we performed gamma-ray-induced positron annihilation lifetime spectroscopy (GiPALS). GiPAL spectra of GAGG and Ce:GAGG comprised two exponential decay components, which were assigned to positron annihilation at bulk and defect states. By an analogy with Ce:YAl
O, the defect-related component was attributed to Al/Ga-O divacancy complexes. This component was weaker for Ce, Mg:GAGG, which correlated with the suppression of shallow electron traps responsible for phosphorescence. Oxygen vacancies were charge compensators for Al/Ga vacancies. The lifetime of the defect-related component was significantly changed by Mg co-doping. This was understood by considering aggregates of Mg
ions at Al/Ga sites with oxygen vacancies, which resulted in the formation of vacancy clusters.
Hirade, Tetsuya; Michishio, Koji*; Kobayashi, Yoshinori*; Oshima, Nagayasu*
Acta Physica Polonica A, 137(2), p.109 - 112, 2020/02
Times Cited Count：0 Percentile：0(Physics, Multidisciplinary)Recently, it was reported that the positronium (Ps) bubble in Room Temperature Ionic Liquids (RTILs) showed some phenomena that were very different from them observed in other molecular liquids. Now the reason of these interesting phenomena is being understood. The structure caused by the ionic interaction between anions and cations can exist even at the higher temperatures than the melting temperatures. It was the reason why the oscillation of Ps bubble was observed at the temperatures near the melting temperatures in RTILs. The temperature dependence of the Ps bubble size estimated by the triplet Ps (-Ps) pick-off annihilation lifetime indicated that there was a nano-meter structure remained by ionic interactions even at high temperatures. The -Ps pick-off annihilation lifetime will be a strong tool to study nano-structure in RTILs.
Hirade, Tetsuya; O'Rourke, B. E.*; Kobayashi, Yoshinori*
Journal of Physics; Conference Series, 791(1), p.012029_1 - 012029_4, 2017/02
Times Cited Count：2 Percentile：62.67(Physics, Multidisciplinary)We tried to observe the positron annihilation rates near surface of (room temperature ionic liquids) IL's, such as N,N,N-trimethyl-N-propylammonium bis(trifluoromethanesulfonyl)imide (TMPA-TFSI) by use of the perpendicular slow positron beamline installed at AIST. The vaper pressure of TMPA-TFSI is very small and hence it is possible to measure the positron annihilation rate in vacuum chamber directly. This represents the first energy variable experimental results of the positron annihilation rate at the near surface of an IL. The triplet positronium annihilation rate seems to be larger at nearer region to the surface of the IL's.
-irradiated ultra high molecular weight polyethyleneKobayashi, Yoshinori*; Yamawaki, Masato*; Oka, Toshitaka; Saiki, Seiichi; Mohamed, H.*; Hattori, Kanehisa*; Watanabe, Yoshihiro*
Materials Science Forum, 733, p.147 - 150, 2013/00
Times Cited Count：3 Percentile：80.86(Materials Science, Multidisciplinary)Positron annihilation lifetime spectroscopy (PALS) has widely been used for probing open volume defects in various materials. PALS is in principle non-destructive, yet conventional PALS is not strictly non-destructive because cutting out of two specimens from the material is required. Recently we developed a novel method of PALS, which is potentially applicable to non-destructive, onsite material inspection. In order to explore the possibility of onsite monitoring of polymer degradation by this novel method of PALS, we studied variations of positron lifetime and mechanical properties of ultra high molecular weight polyethylene (UHMWPE) subjected to -irradiation. Correlations were found between the mechanical properties and o-Ps lifetimes, suggesting the feasibility of non-destructive, onsite monitoring of polymer degradation by PALS. The effect of -irradiation on positronium formation is discussed.
Kobayashi, Yoshinori*; Oka, Toshitaka
Hoshasen Kagaku (Internet), (93), p.47 - 56, 2012/03
no abstracts in English
Kobayashi, Yoshinori*; Oka, Toshitaka
Hoshasen Kagaku (Internet), (92), p.39 - 49, 2011/09
Contents of the lecture note by Prof. V. M. Byakov and Dr. S. V. Stepanov (Institute of Theoretical and Experimental Physics, Russia) are described in a series of articles. The first article concerns basic concepts, classification and sources of ionizing radiations.
Ata, Seisuke*; Oka, Toshitaka; He, C.-Q.*; Odaira, Toshiyuki*; Suzuki, Ryoichi*; Ito, Kenji*; Kobayashi, Yoshinori*; Ougizawa, Toshiaki*
Journal of Polymer Science, Part B; Polymer Physics, 48(20), p.2148 - 2153, 2010/10
Times Cited Count：6 Percentile：20.25(Polymer Science)Surface morphology of bisphenol-A polycarbonate (BAPC) thin films with thickness ranging from 30 to 1000 nm on silicon substrates was studied by atomic force microscopy (AFM). The films were prepared by spincasting from 1,2-dichloroethane solutions of 0.25-5.0 wt % BAPC. Even though longer annealing than 250 h was necessary for complete crystallization for bulk BAPC, high crystallinity was observed for 30 nm thick film after annealing at 200 C for 48 h in vacuum. Positron annihilation lifetime spectroscopy (PALS) measurements showed that the free volume hole size in 30 nm thick film was larger than that of bulk at 200 C. Comparison of the BAPC concentration in the precursor solution with the overlap concentration suggests that the high crystallinity of the 30 nm BAPC film is due to less entangled chains caused by rapid removal of the solvent from the dilute solution.
Ito, Kenji*; Oka, Toshitaka*; Kobayashi, Yoshinori*; Shirai, Yasuharu*; Wada, Kenichiro*; Matsumoto, Masataka*; Fujinami, Masanori*; Hirade, Tetsuya; Honda, Yoshihide*; Hosomi, Hiroyuki*; et al.
Materials Science Forum, 607, p.248 - 250, 2009/00
So far no standard procedure for the positron annihilation lifetime (PAL) technique has been established. A lack of the standards has led to difficulty in ensuring the equivalency and reliability of data from different laboratories. As a first, we conducted an interlaboratory comparison of PAL measurements for metal, polymer and silica glass with agreed procedures for data recording and analysis. The PAL data recorded at different laboratories were analyzed with a single lifetime component for the metal sample and with three components for the others, respectively. Based on the results of the reported positron and ortho-positronium lifetimes, the possible sources of the uncertainties in the PAL measurements are discussed. To reduce the effect of scattered rays, a lead shield was placed between the detectors. The uncertainty was significantly decreased, signifying that placing lead shields between the detectors effectively reduced the false signals due to the scattered rays.
Ito, Kenji*; Oka, Toshitaka*; Kobayashi, Yoshinori*; Shirai, Yasuharu*; Wada, Kenichiro*; Matsumoto, Masataka*; Fujinami, Masanori*; Hirade, Tetsuya; Honda, Yoshihide*; Hosomi, Hiroyuki*; et al.
Journal of Applied Physics, 104(2), p.026102_1 - 026102_3, 2008/07
Times Cited Count：48 Percentile：83.5(Physics, Applied)Interlaboratory comparison of positron annihilation lifetime measurements using synthetic fused silica and polycarbonate was conducted with the participation of 12 laboratories. By regulating procedures for the measurement and data analysis the uncertainties of the positron lifetimes obtained at different laboratories were significantly reduced in comparison with those reported in the past.
-implanted SiO/Si studied by positron annihilation and cathodoluminescenceHirata, Koichi*; Arai, Hideyuki*; Kawasuso, Atsuo; Sekiguchi, T.*; Kobayashi, Yoshinori*; Okada, Sohei
Journal of Applied Physics, 90(1), p.237 - 242, 2001/07
Times Cited Count：4 Percentile：21.84(Physics, Applied)no abstracts in English
Saito, Yuichi; Mizuhashi, Kiyoshi; Tajima, Satoshi; Arakawa, Kazuo; Hirata, Koichi*; Kobayashi, Yoshinori*
JAERI-Conf 2000-019, p.93 - 96, 2001/02
no abstracts in English
/Si studied by slow positron beamKawasuso, Atsuo; Arai, H.*; Hirata, K.*; Sekiguchi, T.*; Kobayashi, Yoshinori*; Okada, Sohei
Radiation Physics and Chemistry, 58(5-6), p.615 - 619, 2000/06
Times Cited Count：3 Percentile：26.42(Chemistry, Physical)no abstracts in English
J.Vacik*; J.Cervena*; V.Hnatowicz*; S.Posta*; D.Fink*; Naramoto, Hiroshi; Kobayashi, Yoshinori*; Hirata, K.*; P.Strauss*
Radiat. Eff. Defects Solids, 147, p.177 - 186, 1999/00
no abstracts in English
Okamoto, Makoto*; Kitajima, Masahiro*; Kobayashi, Yoshinori*; Kiuchi, Kiyoshi*; Kano, Shigeki
Nihon Genshiryoku Gakkai-Shi, 37(9), p.796 - 806, 1995/00
Times Cited Count：0 Percentile：0.01(Nuclear Science & Technology)None
Hirata, Koichi*; Saito, Yuichi; Chiba, Atsuya; Narumi, Kazumasa; Kobayashi, Yoshinori*; Fukuda, Mitsuhiro*
no journal, ,
no abstracts in English
Hirata, Koichi*; Kobayashi, Yoshinori*; Saito, Yuichi; Chiba, Atsuya; Adachi, Masahiro; Yamada, Keisuke; Kamiya, Tomihiro; Narumi, Kazumasa
no journal, ,
no abstracts in English
