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Journal Articles

Observation of momentum-dependent charge excitations in hole-doped cuprates using resonant inelastic X-ray scattering at the oxygen $$K$$ edge

Ishii, Kenji*; Toyama, Takami*; Asano, Shun*; Sato, Kentaro*; Fujita, Masaki*; Wakimoto, Shuichi; Tsutsui, Kenji*; Sota, Shigetoshi*; Miyawaki, Jun*; Niwa, Hideharu*; et al.

Physical Review B, 96(11), p.115148_1 - 115148_8, 2017/09

AA2017-0402.pdf:0.81MB

https://doi.org/10.1103/PhysRevB.96.115148
 Times Cited Count：29 Percentile：77.61(Materials Science, Multidisciplinary)

Journal Articles

Pressure dependence of local structure in liquid carbon disulfide

Yamamoto, Sekika*; Ishibashi, Yasuhiko*; Inamura, Yasuhiro; Katayama, Yoshinori; Mishina, Tomobumi*; Nakahara, Junichiro*

Journal of Chemical Physics, 124(14), p.144511_1 - 144511_5, 2006/04

https://doi.org/10.1063/1.2185094
 Times Cited Count：12 Percentile：38.31(Chemistry, Physical)

High pressure X-ray diffraction measurements on liquid carbon disulfide up to 1.2 GPa are performed by using an energy dispersion method. The results are compared with a molecular dynamics calculation with usual Lennard-Jones potential. They give very good agreement for all pressures measured. It becomes clear that the liquid structure changes like hard core liquid up to the pressure just below crystallizing point. The relation between structural change and optical response at high pressure is discussed.

Journal Articles

Domain boundaries in the GaAs(001)-2$$times$$4 surface

Takahashi, Masamitsu; Yoneda, Yasuhiro; Yamamoto, Naomasa*; Mizuki, Junichiro

Physical Review B, 68(8), p.085321_1 - 085321_5, 2003/08

https://doi.org/10.1103/PhysRevB.68.085321
 Times Cited Count：17 Percentile：62.72(Materials Science, Multidisciplinary)

The $$alpha$$, $$beta$$ and $$gamma$$ phases of the GaAs(001)-2$$times$$4 surface have been investigated by ${it in situ}$ surface X-ray diffraction in an As flux and at temperatures ranging from 480$$^circ$$C to 610$$^circ$$C. It has been found that the fractional-order peaks originating from the fourfold symmetry show shift in the [110] direction as well as significant broadening of the peaks in the $$alpha$$ and $$gamma$$ phases. The direction of the peak shift is characteristic in each phase. This behavior is explained by the formation of the antiphase domain boundaries. The atomic structure of the domain boundaries is discussed.

Journal Articles

Time-resolved X-ray diffraction study on surface structure and morphology during molecular beam epitaxy growth

Takahashi, Masamitsu; Yoneda, Yasuhiro; Inoue, Hirotane*; Yamamoto, Naomasa*; Mizuki, Junichiro

Journal of Crystal Growth, 251(1-4), p.51 - 55, 2003/04

https://doi.org/10.1016/S0022-0248(02)02375-8
 Times Cited Count：3 Percentile：22.01(Crystallography)

The reflection high energy electron diffraction (RHEED) oscillation has been widely adopted for studies on growth kinetics and dynamics in molecular beam epitaxy (MBE). Recent development in brilliant X-ray source has enabled similar experiments with X-rays, which has great advantage in a straightforward interpretation of results and in a high angular resolution. In general, the diffracted intensity from surface is proportional to the surface structure factor associated with the surface reconstruction, F, multiplied by a damping factor associated with the surface roughness, m. We show that the two factors, F and m, can be obtained separately by measuring diffuse scattering around the two-dimensional Bragg peak during growth.

Journal Articles

X-ray diffractometer for studies on molecular-beam-epitaxy growth of III-V semiconductors

Takahashi, Masamitsu; Yoneda, Yasuhiro; Inoue, Hirotane*; Yamamoto, Naomasa*; Mizuki, Junichiro

Japanese Journal of Applied Physics, Part 1, 41(10), p.6247 - 6251, 2002/10

https://doi.org/10.1143/JJAP.41.6247
 Times Cited Count：55 Percentile：85.2(Physics, Applied)

An X-ray diffractometer connected with a molecular-beam epitaxy (MBE) system has been constructed for in situ studies on the growing surfaces of III-V compound semiconductors. This diffractometer is based on the (4+2) type and equipped with an axis for rotating the receiving slit about the normal of the slit plane. This additional axis is used to align the resolution of the receiving slit properly for the surface X-ray diffraction measurement. For the alignment of the sample and the whole setup with respect to the X-ray beam, an XYZ-stage and an adjustable base plate are available. X-rays enter and leave the chamber through two cylindrical Be windows welded onto the MBE chamber. A graphite sheet which can be heated up to 250$$^circ$$C is placed along the inside of the Be windows to protect the Be windows from being coated with evaporated materials. Preliminary data are presented to demonstrate the feasibility of static and dynamic measurements of growing surfaces using this instrument.

Journal Articles

Relationship between tensile curve and indentation load-depth curve for a Ni-base alloy with microstructures by cold work and aging

Yamamoto, Junichiro*; Futakawa, Masatoshi; Kurata, Yuji; Naoe, Takashi*

Nihon Kikai Gakkai Kanto Shibu Ibaraki Koenkai (2002) Koen Rombunshu, p.1 - 2, 2002/09

no abstracts in English

JAEA Reports

JNDC FP decay data file

*; *; ; *

JAERI-M 9357, 80 Pages, 1981/02

JAERI-M-9357.pdf:3.44MB

no abstracts in English

7 (Records 1-7 displayed on this page)
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