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Hayashi, Koichi*; Oyama, Kenji*; Happo, Naohisa*; Matsushita, Tomohiro*; Hosokawa, Shinya*; Harada, Masahide; Inamura, Yasuhiro; Nitani, Hiroaki*; Shishido, Toetsu*; Yubuta, Kunio*
Science Advances (Internet), 3(8), p.e1700294_1 - e1700294_7, 2017/08
Hayashi, Koichi*; Happo, Naohisa*; Hosokawa, Shinya*; Hu, W.; Matsushita, Tomohiro*
Journal of Physics; Condensed Matter, 24(9), p.093201_1 - 093201_15, 2012/03
Times Cited Count：86 Percentile：60.71(Physics, Condensed Matter)Matsushita, Tomohiro*; Guo, F. Z.*; Agui, Akane; Matsui, Fumihiko*; Daimon, Hiroshi*
Materia, 45(11), p.791 - 796, 2006/11
no abstracts in English
-edge of perpendicular magnetic Dy
Co
filmsAgui, Akane; Mizumaki, Masaichiro*; Asahi, Toru*; Sayama, Junichi*; Matsumoto, Koji*; Morikawa, Tsuyoshi*; Matsushita, Tomohiro*; Osaka, Tetsuya*; Miura, Yoshimasa*
Journal of Alloys and Compounds, 408-412, p.741 - 745, 2006/02
Times Cited Count：7 Percentile：46.38(Chemistry, Physical)no abstracts in English
Tanaka, Hitoshi*; Takao, Masaru*; Matsushita, Tomohiro*; Aoyagi, Hideki*; Takeuchi, Masao*; Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi
Hoshako, 19(1), p.27 - 32, 2006/01
no abstracts in English
NbS
Guo, F. Z.*; Matsushita, Tomohiro*; Kobayashi, Keisuke*; Matsui, Fumihiko*; Kato, Yukako*; Daimon, Hiroshi*; Koyano, Mikio*; Yamamura, Yasuhisa*; Tsuji, Toshihide*; Saito, Yuji
Journal of Applied Physics, 99(2), p.024907_1 - 024907_3, 2006/01
Times Cited Count：8 Percentile：31.28(Physics, Applied)Stereoatomscope was used to study the atomic arrangements of intercalation compound FeNbS. The three-dimensional atomic arrangements around different kinds of atoms (Nb and Fe) are visualized by taking the photoelectron angular distribution (PEAD) patterns at clockwise and counterclockwise circularly polarized lights. Atomic distances between the emitters and the scatterers are obtained from the PEAD patterns by measuring the rotation angles of the forward focusing peaks. The applications of stereoatomscope to intercalation compound show the possibility to build an ultimate microscope for scientist.
Matsushita, Tomohiro*; Yoshigoe, Akitaka; Agui, Akane
Europhysics Letters, 71(4), p.597 - 603, 2005/08
Times Cited Count：31 Percentile：76.8(Physics, Multidisciplinary)no abstracts in English
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka
Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.1175 - 1177, 2005/06
Times Cited Count：3 Percentile：17.62(Spectroscopy)no abstracts in English
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Tanaka, Hitoshi*; Takao, Masaru*; Takeuchi, Masao*; Matsushita, Tomohiro*; Aoyagi, Hideki*
JAERI-Tech 2005-027, 29 Pages, 2005/05
JAERI-Tech-2005-027.pdf:5.14MB
We measured the orbit fluctuation caused by APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring by using the developed real time measurement system of electron and photon beam position monitors. We quantitatively found two characteristic fluctuations correlating with the ID23 motion by wavelet transform which is a kind of frequency analysis. One originates from the variation of error field during the ID drive. The other originates from the stray magnetic field leaked from the servomotors for the phase drive. Using these results, we tried to get rid of the effect of error fields on the beam orbit by the precise feed-forward correction table and the stray field shield. Consequently we succeeded in suppressing the orbit fluctuation down to sub-micron during the gap drive, which is observed by photon beam position monitors installed in downstream 20m from each light source point.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka
Nihon Butsuri Gakkai-Shi, 60(3), p.195 - 202, 2005/03
no abstracts in English
Agui, Akane; Mizumaki, Masaichiro*; Matsushita, Tomohiro*; Kawamura, Naomi*; Nakatani, Takeshi
Physica Scripta, T115, p.611 - 613, 2005/00
no abstracts in English
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Takeuchi, Masao*; Aoyagi, Hideki*; Tanaka, Hitoshi*
JAERI-Tech 2004-013, 16 Pages, 2004/12
JAERI-Tech-2004-013.pdf:3.55MB
We observed two characteristic electron orbit fluctuations caused when the phase of ID23 (APPLE-2 type undulator) installed at SPring-8 was driven. One was caused by the variation of magnetic error filed of ID23 when the phase was driven. The other was caused by the noise from the phase drive system which adoped AC servomotors. We measured these orbit fluctuations synchronized with the phase motion using the real-time electron beam position measurement system. The part of the orbit fluctuation was supressed by the correction table which was made referring to the obtained data.
-edges of Tb
FeCo
perpendicular magnetization filmsAgui, Akane; Mizumaki, Masaichiro*; Asahi, Toru*; Sayama, Junichi*; Matsumoto, Koji*; Morikawa, Tsuyoshi*; Nakatani, Takeshi; Matsushita, Tomohiro*; Osaka, Tetsuya*; Miura, Yoshimasa*
Transactions of the Magnetics Society of Japan, 4(4-2), p.326 - 329, 2004/11
The electronic and spin state of the perpendicular magnetization film TbFeCo was investigated by means of magnetic circular dichroism spectroscopy for each element. The samples are TbFeCo while the ratio of a rare-earth metal Tb to transition metals Fe and Co is constant, the composition ratio of Fe and Co is changed. Changing the ratio, we estimated the expected orbital moments 
of Tb 4f electrons. The macroscopic magnetic property is studied from the microscopic point of view.
Agui, Akane; Mizumaki, Masaichiro*; Matsushita, Tomohiro*; Asahi, Toru*; Kawaji, Jun*; Sayama, Junichi*; Osaka, Tetsuya*
Journal of Applied Physics, 95(12), p.7825 - 7831, 2004/06
Times Cited Count：6 Percentile：27.83(Physics, Applied)The electronic and spin states of [Co/Pd] multilayered perpendicular magnetization films with various seedlayers have been investigated by means of soft X-ray absorption and magnetic circular dichroism spectroscopy at the Co 
-edges. The expectation values of the orbital angular momentum and the spin angular momentum 
of Co atom in the [Co/Pd] multilayered film were estimated using the sum rule. It was found that the seedlayer changes macroscopic magnetic properties of the [Co/Pd] multilayered film without affecting the electronic and spin states of the upper layers of Co.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka
Europhysics Letters, 65(2), p.207 - 213, 2004/01
Times Cited Count：31 Percentile：76.59(Physics, Multidisciplinary)A "scattering pattern matrix" method is proposed here to overcome the difculties presented by photoelectron holography, such as forward-scattering and multi-energyproblems. This method makes it possible to reconstruct a three-dimensional atomic arrangement from a single-energy hologram. We have utilized the "scattering pattern matrix" that includes the angular variation of the scattered object waves, and we have adopted a specialaverage process and the gradient projection method for minimizing the mean-squared error. The reconstruction of the Si bulk structure is demonstrated by using an experimental Si(111) 2s single-energy hologram.
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.290 - 293, 2004/00
We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Nakatani, Takeshi; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.21 - 24, 2004/00
no abstracts in English
Sakata, Osami*; Furukawa, Yukito*; Goto, Shunji*; Mochizuki, Tetsuro*; Uruga, Tomoya*; Takeshita, Kunikazu*; Ohashi, Haruhiko*; Ohata, Toru*; Matsushita, Tomohiro*; Takahashi, Sunao*; et al.
Surface Review and Letters, 10(2&3), p.543 - 547, 2003/04
Times Cited Count：141 Percentile：96.38(Chemistry, Physical)The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt(111) surface.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*
Hoshako, 15(5), p.303 - 307, 2002/05
no abstracts in English
(=Pt, Pd; 
=P, As, Sb)Iwasaki, T.*; Sekiyama, Akira*; Yamasaki, Atsushi*; Okazaki, Makoto*; Kadono, Koji*; Utsunomiya, Hiroshi*; Imada, Shin*; Saito, Yuji; Muro, Takayuki*; Matsushita, Tomohiro*; et al.
Physical Review B, 65(19), p.195109_1 - 195109_9, 2002/05
Times Cited Count：24 Percentile：71.84(Materials Science, Multidisciplinary)no abstracts in English
