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Ohae, Chiaki*; Harries, J.; Iwayama, Hiroshi*; Kawaguchi, Kentaro*; Kuma, Susumu*; Miyamoto, Yuki*; Nagasono, Mitsuru*; Nakajima, Kyo*; Nakano, Itsuo*; Shigemasa, Eiji*; et al.
Journal of the Physical Society of Japan, 85(3), p.034301_1 - 034301_10, 2016/03
Times Cited Count：8 Percentile：52.42(Physics, Multidisciplinary)Harries, J.; Iwayama, Hiroshi*; Nagasono, Mitsuru*; Togashi, Tadashi*; Yabashi, Makina*; Kuma, Susumu*; Nakajima, Kyo*; Miyamoto, Yuki*; Ohae, Chiaki*; Sasao, Noboru*; et al.
Journal of Physics B; Atomic, Molecular and Optical Physics, 48(10), p.105002_1 - 105002_9, 2015/05
Times Cited Count：7 Percentile：38.91(Optics)Nakajima, Kyo*; Harries, J.; Iwayama, Hiroshi*; Kuma, Susumu*; Miyamoto, Yuki*; Nagasono, Mitsuru*; Ohae, Chiaki*; Togashi, Tadashi*; Yabashi, Makina*; Shigemasa, Eiji*; et al.
Journal of the Physical Society of Japan, 84(5), p.054301_1 - 054301_7, 2015/05
Times Cited Count：7 Percentile：49.48(Physics, Multidisciplinary)Harries, J.; Iwayama, Hiroshi*; Okihara, Lisa*; Nagasono, Mitsuru*; Shigemasa, Eiji*
JPS Conference Proceedings (Internet), 1, p.013083_1 - 013083_6, 2014/03
Shigemasa, Eiji*; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Harries, J.; Ishikawa, Lisa*
Journal of Physics B; Atomic, Molecular and Optical Physics, 46(16), p.164020_1 - 164020_5, 2013/08
Times Cited Count：1 Percentile：7.09(Optics)Harries, J.; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Shigemasa, Eiji*
Journal of Physics B; Atomic, Molecular and Optical Physics, 46(16), p.164021_1 - 164021_5, 2013/08
Times Cited Count：0 Percentile：0.01(Optics)Yabashi, Makina*; Tanaka, Hitoshi*; Tanaka, Takashi*; Tomizawa, Hiromitsu*; Togashi, Tadashi*; Nagasono, Mitsuru*; Ishikawa, Tetsuya*; Harries, J.; Hikosaka, Yasumasa*; Hishikawa, Akiyoshi*; et al.
Journal of Physics B; Atomic, Molecular and Optical Physics, 46(16), p.164001_1 - 164001_19, 2013/08
Times Cited Count：71 Percentile：95.16(Optics)Sato, Takahiro*; Iwasaki, Atsushi*; Owada, Shigeki*; Yamanouchi, Kaoru*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Togashi, Tadashi*; Fukami, Kenji*; et al.
Journal of Physics B; Atomic, Molecular and Optical Physics, 46(16), p.164006_1 - 164006_6, 2013/08
Times Cited Count：3 Percentile：19.06(Optics)By introducing 13th- (61.7 nm) and 15th-order harmonics (53.4 nm) of femtosecond laser pulses at 800 nm into an undulator of SCSS (SPring-8 Compact SASE Source) test accelerator at RIKEN, these harmonic pulses were amplified by a factor of more than 10
with a high contrast ratio through the interaction between accelerated electron bunches and the harmonic pulses. From numerical simulations of the amplification processes of high-order harmonic pulses in the undulator, optimum conditions of the electron bunch duration interacting with the high-order harmonic pulses were investigated for generating full-coherent and intense pulses in the extreme ultraviolet wavelength region.
Iwayama, Hiroshi*; Nagasono, Mitsuru*; Harries, J.; Shigemasa, Eiji*
Optics Express (Internet), 20(21), p.23174 - 23179, 2012/10
Times Cited Count：15 Percentile：59.41(Optics)Iwasaki, Atsushi*; Sato, Takahiro*; Owada, Shigeki*; Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Kannari, Fumihiko*; Yagishita, Akira*; et al.
Reza Kenkyu, 40(9), p.687 - 690, 2012/09
no abstracts in English
Iwasaki, Atsushi*; Sato, Takahiro*; Owada, Shigeki*; Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Matsubara, Shinichi*; Okayasu, Yuichi*; et al.
Proceedings of International Conference on Ultrafast Phenomena 2012 (UP 2012) (Internet), 3 Pages, 2012/07
Times Cited Count：0 Percentile：0.03(Physics, Multidisciplinary)no abstracts in English
Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Kando, Masaki; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; et al.
Optics Express (Internet), 20(4), p.3424 - 3433, 2012/02
Times Cited Count：27 Percentile：76.85(Optics)Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
Physical Review Letters, 107(19), p.193603_1 - 193603_5, 2011/11
Times Cited Count：37 Percentile：82.81(Physics, Multidisciplinary)Sato, Takahiro*; Iwasaki, Atsushi*; Ishibashi, Kazuki*; Okino, Tomoya*; Yamanouchi, Kaoru*; Adachi, Junichi*; Yagishita, Akira*; Yazawa, Hiroki*; Kannari, Fumihiko*; Aoyama, Makoto; et al.
Europhysics News, 42(5), P. 10, 2011/09
The resonant and non-resonant two-photon single ionization processes of He were investigated using intense free electron laser light in the extreme ultraviolet (XUV) region (53.4-61.4 nm) covering the 1s-2p and 1s-3p resonant transitions of He. On the basis of the dependences of the yield of He
on the XUV light-field intensity at 53.4, 58.4, 56.0 and 61.4 nm, the absolute values of the two-photon ionization cross sections of He at the four different wavelengths and their dependence on the light-field intensity were determined for the first time.
Inogamov, N. A.*; Anisimov, S. I.*; Petrov, Y. V.*; Khokhlov, V. A.*; Zhakhovskii, V. V.*; Faenov, A. Ya.*; Pikuz, T.; Fortov, V. E.*; Skobelev, I. Y.*; Kato, Yoshiaki*; et al.
Journal of Optical Technology, 78(8), p.473 - 480, 2011/08
Times Cited Count：6 Percentile：32.94(Optics)Sato, Takahiro*; Iwasaki, Atsushi*; Ishibashi, Kazuki*; Okino, Tomoya*; Yamanouchi, Kaoru*; Adachi, Junichi*; Yagishita, Akira*; Yazawa, Hiroki*; Kannari, Fumihiko*; Aoyama, Makoto; et al.
Journal of Physics B; Atomic, Molecular and Optical Physics, 44(16), p.161001_1 - 161001_5, 2011/08
Times Cited Count：36 Percentile：82.78(Optics)The resonant and non-resonant two-photon single ionization processes of He were investigated using intense free electron laser light in the extreme ultraviolet (XUV) region (53.4-61.4 nm) covering the 1s-2p and 1s-3p resonant transitions of He. On the basis of the dependences of the yield of He on the XUV light-field intensity at 53.4, 58.4, 56.0 and 61.4 nm, the absolute values of the two-photon ionization cross sections of He at the four different wavelengths and their dependence on the light-field intensity were determined for the first time.
Inogamov, N. A.*; Faenov, A. Ya.*; Zhakhovsky, V. V.*; Pikuz, T. A.*; Skobelev, I. Yu.*; Petrov, Y. V.*; Khokhlov, V. A.*; Shepelev, V. V.*; Anisimov, S. I.*; Fortov, V. E.*; et al.
Contributions to Plasma Physics, 51(5), p.419 - 426, 2011/06
Times Cited Count：20 Percentile：64.22(Physics, Fluids & Plasmas)Warm dense matter, arising under the action of ultrashort EUV-FEL pulse onto LiF dielectric crystal, is characterized by high temperature of conduction electrons, with their number density achieving values of the order of atom number density at maximum laser fluences in our experiments. Expansion of matter, heated and pressurized through the electron-ion energy exchange, gives rise to the spallative ablation at small fluences and gaseous outflow from a target in the case of large fluences. Ablation threshold is low in comparison with a longer nanosecond XRL.
Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Sato, Takahiro*; Iwasaki, Atsushi*; Okino, Tomoya*; Yamanouchi, Kaoru*; Hara, Toru*; et al.
Proceedings of 2011 Conference on Lasers and Electro-Optics (CLEO 2011) (CD-ROM), p.1527 - 1528, 2011/05
We succeeded in generating the seeded free electron laser (FEL) with wavelengths of 61 nm at the SCSS test accelerator. The 13th (61 nm) harmonics generated by focusing the high peak power Ti:Sapphire laser to the Xe gas cell was directed to the undulator. This is first realization of the seeded FEL in extreme ultraviolet region.
Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Sato, Takahiro*; Iwasaki, Atsushi*; Owada, Shigeki*; Okino, Tomoya*; Yamanouchi, Kaoru*; et al.
Optics Express (Internet), 19(1), p.317 - 324, 2011/01
Times Cited Count：96 Percentile：96.45(Optics)The 13th harmonic of a Ti:sapphire (Ti:S) laser in the plateau region was injected as a seeding source to a 250-MeV free-electron-laser (FEL) amplifier. When the amplification conditions were fulfilled, strong enhancement of the radiation intensity by a factor of 650 was observed. The random and uncontrollable spikes, which appeared in the spectra of the Self-Amplified Spontaneous Emission (SASE) based FEL radiation without the seeding source, were found to be suppressed drastically to form to a narrow-band, single peak profile at 61.2 nm. The properties of the seeded FEL radiation were well reproduced by numerical simulations. We discuss the future precept of the seeded FEL scheme to the shorter wavelength region.
Fukuda, Yuji; Faenov, A. Y.; Pikuz, T. A.*; Nagasono, Mitsuru*; Azumaya, Atsushi*; Togashi, Tadashi*; Yabashi, Makina*; Kimura, Hiroaki*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*
no journal, ,
Using extreme ultraviolet free electron laser (EUVFEL), images of metal mesh, metal thin foil, and biological objects in a wide field of view with high spatial resolution are obtained with high dynamic range LiF crystal detectors. The single shot image of the metal mesh shows a full spatial coherence of EUVFEL light, and a beam diameter of 9.0
8.4 mm (fwhm).
