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Kuboyama, Satoshi*; Mizuta, Eiichi*; Ikeda, Naomi*; Abe, Hiroshi; Oshima, Takeshi; Tamura, Takashi*
Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.138 - 141, 2012/12
no abstracts in English
Kuboyama, Satoshi*; Maru, Akifumi*; Ikeda, Naomi*; Hirao, Toshio; Tamura, Takashi*
IEEE Transactions on Nuclear Science, 57(6), p.3257 - 3261, 2010/12
Times Cited Count：16 Percentile：72.36(Engineering, Electrical & Electronic)no abstracts in English
Ikeda, Naomi*; Kuboyama, Satoshi*; Maru, Akifumi*; Hirao, Toshio; Abe, Hiroshi; Tamura, Takashi*
Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.163 - 166, 2010/10
The trench structure showed an anomalously large degradation by heavy ion irradiation. For the trench structure, ions irradiated normal to the chip surface traverse the gate oxide along the entire length of the channel. Therefore, there is a possibility that the trapped holes resulting from the ion traverse introduce the anomalously large leakage current path. This phenomenon is apparently attributable to the microdose effect. In the previous report, the microdose effect was identified on both trench and planner type of power MOSFETs by real-time measurement of the threshold voltage shift during the heavy ion irradiation with very long range. In this study, detailed characterization of the microdose effects was carried out with several in species. As a result, several damage parameters introduced in the gate oxide by a single ion, such as physical damage size and trapped hole density in the damage region were estimated.
Ikeda, Kiyoshi; Gonda, Mayuki; Nozawa, Takashi; Itabashi, Keizo; Ebisawa, Naomi*
Proceedings of 11th International Conference on Grey Literature (GL-11), p.111 - 117, 2009/12
This poster presentation is to introduce new circulation systems of gray literatures in the fields of nuclear science and technology. Normally circulation of grey literature is not easy, but JAEA Library has been making efforts for highly accessibility to JAEA reports (i.e. JAEA-Research etc.) via the Internet. JAEA Library website is providing the two types of systems for dissemination of our R&D results including JAEA Reports. "JAEA Abstracts" is the list of current R&D results by our staff. The bibliographic information of JAEA reports and papers published in journals is listed. "JOPSS" is the abbreviation for JAEA Originated Papers Searching System. You may search all JAEA research results accumulated over the past fifty years. Recently, with the aim of giving convenience to users of our R&D results in the world, we have developed the new searching interface and retrieval algorithms for "JOPSS".
Gonda, Mayuki; Ikeda, Kiyoshi; Ebisawa, Naomi*; Nozawa, Takashi
Dai-5-Kai Joho Purofesshonaru Shimpojiumu (INFOPRO 2008) Happyo Yokoshu, p.125 - 129, 2008/11
no abstracts in English
Gonda, Mayuki; Ikeda, Kiyoshi; Ebisawa, Naomi*
Senmon Toshokan, (228), p.26 - 32, 2008/03
Japan Atomic Energy Agency (JAEA) has disseminated research results via the Internet from before institutional repositories are provided by many universities and institutes. JAEA Library is providing 2 systems, "JAEA Abstracts" and "JOPSS" (JAEA Originated Papers Searching System) today. In this article, the history and the present situation of dissemination of JAEA's research results are reviewed.
Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Otomo, Hiromitsu*; Shimada, Osamu*; Hirao, Toshio; Matsuda, Sumio*
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.63 - 66, 2004/10
no abstracts in English
Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.165 - 168, 2004/10
no abstracts in English
Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*
IEEE Transactions on Nuclear Science, 50(6, Part1), p.1839 - 1845, 2003/12
Times Cited Count：17 Percentile：72.74(Engineering, Electrical & Electronic)no abstracts in English
Miyahara, H.*; Narita, N.*; Ikeda, Keiichi*; Kato, Y.*; Fujiki, K.*; Momose, Takumaro; Tasaki, Takashi; Kurihara, Osamu; Hayashi, Naomi
JNC TY8400 2001-002, 81 Pages, 2001/07
JNC-TY8400-2001-002.pdf:2.35MB
no abstracts in English
Maru, Akifumi*; Kuboyama, Satoshi*; Shindo, Hiroyuki*; Ikeda, Naomi*; Tamura, Takashi*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi
no journal, ,
no abstracts in English
Mizuta, Eiichi*; Ikeda, Naomi*; Kuboyama, Satoshi*; Tamura, Takashi*; Abe, Hiroshi; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi
no journal, ,
no abstracts in English
