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Okajima, Satoshi*; Honda, Kei*; Sakai, Shinsuke*; Izumi, Satoshi*; Oishi, Kunio*; Kasahara, Naoto
Nihon Kikai Gakkai M&M 2007 Zairyo Rikigaku Kanfuarensu Koen Rombunshu (CD-ROM), p.262 - 263, 2007/10
It is well known that fatigue damage accumulates around T-junctions of piping system where two kinds of fluid with different temperatures are mixed. Kasahara et al. have proposed the thermal fatigue evaluation method based on power spectrum density (PSD). However, this method is too complex to practical use in the design stage. In this paper, a simplified damage evaluation guideline is proposed based on the Kasahara et al. method. The damage evaluation procedure from stress PSD is simplified in this guideline.
Sakai, Shinsuke*; Honda, Kei*; Okajima, Satoshi*; Izumi, Satoshi*; Kasahara, Naoto
Proceedings of 2007 ASME Pressure Vessels and Piping Division Conference/8th International Conference on Creep and Fatigue at Elevated Temperatures (PVP 2007/CREEP-8) (CD-ROM), 7 Pages, 2007/07
At an incomplete mixing area of high and low temperature fluids, fluid temperature fluctuation often occurs. It induces cyclic thermal stresses in the wall, which may result in fatigue crack initiation. Kasahara et al. proposed the thermal fatigue evaluation method based on power spectrum density (PSD). This method generalizes the evaluation procedure by preparing PSD charts of fluid and frequency transfer functions of stress for various kinds of plant components. From design point of view, however, this method is too complicated due to the inverse Fourier transform and wave decomposition procedures named Rain Flow Cycle Counting (RFC). In this paper, simplified damage evaluation method for thermal fatigue is proposed by directly evaluating fatigue damage from PSD of stress.
Okajima, Satoshi*; Sakai, Shinsuke*; Izumi, Satoshi*; Kasahara, Naoto
Nihon Zairyo Gakkai Dai-21-Kai Zairyo, Kozo Shinraisei Shimpojiumu Koen Rombunshu, p.132 - 137, 2005/12
no abstracts in English
Okajima, Satoshi*; Sakai, Shinsuke*; Izumi, Satoshi*; Kasahara, Naoto
no journal, ,
no abstracts in English
Honda, Kei*; Sakai, Shinsuke*; Izumi, Satoshi*; Okajima, Satoshi*; Kasahara, Naoto
no journal, ,
no abstracts in English
Nakamura, Satoshi; Kimura, Takahiro; Ban, Yasutoshi; Matsumura, Tatsuro; Oizumi, Akito; Fukushima, Masahiro; Tsubata, Yasuhiro; Hayashi, Hirokazu
no journal, ,
no abstracts in English