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Abe, Shinichiro; Hashimoto, Masanori*; Liao, W.*; Kato, Takashi*; Asai, Hiroaki*; Shimbo, Kenichi*; Matsuyama, Hideya*; Sato, Tatsuhiko; Kobayashi, Kazutoshi*; Watanabe, Yukinobu*
IEEE Transactions on Nuclear Science, 70(8, Part 1), p.1652 - 1657, 2023/08
Times Cited Count：0 Percentile：0.01(Engineering, Electrical & Electronic)Single event upsets (SEUs) caused by neutrons is a reliability problem for microelectronic devices in the terrestrial environment. Acceleration tests using white neutron beam provide realistic soft error rates (SERs), but only a few facilities can provide white neutron beam in the world. If single-source irradiation applicable to diverse neutron source can be utilized for the evaluation of the SER in the terrestrial environment, it contributes to solve the shortage of beam time. In this study, we investigated the feasibility of the SER estimation in the terrestrial environment by any one of these measured data with the SEU cross sections obtained by PHITS simulation. It was found that the SERs estimated by our proposed method are within a factor of 2.7 of that estimated by the Weibull function. We also investigated the effect of simplification which reduce the computational cost in simulation to the SER estimation.
Iwamoto, Yosuke; Fukuda, Mitsuhiro*; Sakamoto, Yukio; Tamii, Atsushi*; Hatanaka, Kichiji*; Takahisa, Keiji*; Nagayama, Keiichi*; Asai, Hiroaki*; Sugimoto, Kenji*; Nashiyama, Isamu*
Nuclear Technology, 173(2), p.210 - 217, 2011/02
Times Cited Count：30 Percentile：89.62(Nuclear Science & Technology)The 30 
white neutron beam at RCNP facility has been characterized as a prove suitable for testing of single event effects (SEEs) in semiconductors in the neutron energy range from 1 to 300 MeV using the 392-MeV proton incident reaction on a 6.5-cm-thick tungsten target. The neutron spectrum in measurements were demonstrated to provide a neutron spectrum similar to the terrestrial one at sea level, but with an enhancement in the intensity of a factor of 1.5
10
. The average neutron intensity and spectrum from 10 to 300 MeV at RCNP were almost same as those at WNR. The calculated RCNP neutron flux using PHITS generally agreed with the measured RCNP data within a factor of two. As the neutron density per pulse for RCNP is 500 times lower than that for WNR, the pileup probability of single-event transient currents and false multiple-bit upsets is reduced. Such conditions at RCNP are suitable for accelerated SEE testing to get meaningful results in realistic time frame.
m fully depleted CMOS/SOI digital logic devicesMakihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.
Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7), p.95 - 98, 2006/10
no abstracts in English
m fully depleted CMOS/SOI digital logic devicesMakihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.
no journal, ,
no abstracts in English
Iwamoto, Yosuke; Sakamoto, Yukio; Fukuda, Mitsuhiro*; Tamii, Atsushi*; Takahisa, Keiji*; Hatanaka, Kichiji*; Asai, Hiroaki*; Sugimoto, Kenji*; Nashiyama, Isamu*
no journal, ,
Recently, the soft error which is induced by high energy white neutron incidence from the space have been evaluated at WNR of Los Alamos National Laboratory. In Japan, white neutron irradiation field has not been developed, therefore, it is necessary to establish Japanese neutron field for the development of Japanese own airplane and space craft. In this work, neutron energy spectra at 30 degrees for the 392MeV proton incidence were measured at RCNP, Osaka University by using Time-Of-Flight techniques, and comparison between obtained data and the data of WNR was done. As a result, the white neutron field of RCNP is suitable for irradiation field of semi-conductor because the shape of neutron energy spectra is same with WNR data and calculated result of PHITS.
Abe, Shinichiro; Hashimoto, Masanori*; Liao, W.*; Kato, Takashi*; Asai, Hiroaki*; Shimbo, Kenichi*; Matsuyama, Hideya*; Sato, Tatsuhiko; Kobayashi, Kazutoshi*; Watanabe, Yukinobu*
no journal, ,
Single event upset (SEU) induced by secondary cosmic-ray neutrons is one of the causes of non-destructive faults (the so-called soft errors) in microelectronics. We have proposed a method to estimate the terrestrial soft error rates (SERs) based on simulation coupled with one-time neutron irradiation testing which can be applied to various kinds of neutron sources. The validity of our method has been investigated for 65-nm bulk SRAMs with the measured data using various neutron sources. This result will be reviewed on the organized session of the 67th Space Sciences and Technology Conference.
