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Journal Articles

Single-event current transients induced by high energy ion microbeams

Nashiyama, Isamu; Hirao, Toshio; Kamiya, Tomihiro; *; Nishijima, Toshiji*; *

IEEE Transactions on Nuclear Science, 40(6), p.1935 - 1940, 1993/12

 Times Cited Count:75 Percentile:97.94(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Control of JAERI heavy ion microbeam system and beam measurement

Kamiya, Tomihiro; Yuto, Hidenori; Tanaka, Ryuichi

Dai-5-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.116 - 119, 1992/07

no abstracts in English

Journal Articles

Single ion hit system in heavy ion microbeam apparatus

Kamiya, Tomihiro; *; Tanaka, Ryuichi

Dai-3-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu, p.453 - 456, 1992/00

no abstracts in English

Journal Articles

JAERI heavy ion microbeam system and single ion hit technique

Kamiya, Tomihiro; *; Tanaka, Ryuichi

Proc. of the lst Meeting on the Ion Engineering Society of Japan, p.105 - 110, 1992/00

no abstracts in English

Journal Articles

JAERI heavy ion microbeam system and single ion hit technique

Kamiya, Tomihiro; *; Tanaka, Ryuichi

Proceedings of the International Workshop on Radiation Effects of Semiconductor Devices for Space Application, p.112 - 117, 1992/00

no abstracts in English

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