Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Ishigami, Keisuke*; Yoshimatsu, Kohei*; Toyota, Daisuke*; Takizawa, Masaru*; Yoshida, Teppei*; Shibata, Goro*; Harano, Takayuki*; Takahashi, Yukio*; Kadono, Toshiharu*; Verma, V. K.*; et al.
Physical Review B, 92(6), p.064402_1 - 064402_5, 2015/08
Times Cited Count:42 Percentile:83.69(Materials Science, Multidisciplinary)Kobayashi, Masaki*; Ishida, Yukiaki*; Hwang, J. I.*; Song, G. S.*; Takizawa, Masaru*; Fujimori, Atsushi; Takeda, Yukiharu; Okochi, Takuo*; Okane, Tetsuo; Saito, Yuji; et al.
Physical Review B, 79(20), p.205203_1 - 205203_5, 2009/05
Times Cited Count:7 Percentile:33.25(Materials Science, Multidisciplinary)Kobayashi, Masaki*; Hwang, J. I.*; Song, G.*; Oki, Yasuhiro*; Takizawa, Masaru*; Fujimori, Atsushi; Takeda, Yukiharu; Fujimori, Shinichi; Terai, Kota*; Okane, Tetsuo; et al.
Physical Review B, 78(15), p.155322_1 - 155322_4, 2008/10
Times Cited Count:5 Percentile:26.3(Materials Science, Multidisciplinary)Song, G.*; Kobayashi, Masaki*; Hwang, J. I.*; Kataoka, Takashi*; Takizawa, Masaru*; Fujimori, Atsushi; Okochi, Takuo; Takeda, Yukiharu; Okane, Tetsuo; Saito, Yuji; et al.
Japanese Journal of Applied Physics, 47(9), p.7113 - 7116, 2008/09
Times Cited Count:3 Percentile:14.43(Physics, Applied)Song, G.*; Kobayashi, Masaki*; Hwang, J. I.*; Kataoka, Takashi*; Takizawa, Masaru*; Fujimori, Atsushi; Okochi, Takuo; Takeda, Yukiharu; Okane, Tetsuo; Saito, Yuji; et al.
Physical Review B, 78(3), p.033304_1 - 033304_4, 2008/07
Times Cited Count:8 Percentile:37.4(Materials Science, Multidisciplinary)Kobayashi, Masaki*; Oki, Yasuhiro*; Takizawa, Masaru*; Song, G. S.*; Fujimori, Atsushi; Takeda, Yukiharu; Terai, Kota*; Okane, Tetsuo; Fujimori, Shinichi; Saito, Yuji; et al.
Applied Physics Letters, 92(8), p.082502_1 - 082502_3, 2008/02
Times Cited Count:12 Percentile:44.67(Physics, Applied)Lin, Y.-H.*; Terai, Kota*; Wadachi, Hiroki*; Kobayashi, Masaki*; Takizawa, Masaru*; Hwang, J. I.*; Fujimori, Atsushi; Nan, C.-W.*; Li, J.-F.*; Fujimori, Shinichi; et al.
Applied Physics Letters, 90(22), p.222909_1 - 222909_3, 2007/05
Times Cited Count:6 Percentile:26.48(Physics, Applied)Epitaxial BaSrTiO thin films were prepared on Nb-doped SrTiO (100) substrates by the pulsed laser deposition technique and were studied by measuring the Ti 2p 3d resonant photoemission spectra in the valence-band region, both at room temperature and low temperature. The results demonstrated an abrupt variation in the spectral structures between 2.8 nm (7 ML) and 2.0 nm (5 ML) BaSrTiO films, suggesting that there exists a critical thickness for phase change in the range of 2.0-2.8 nm.
Entani, Shiro; Honda, Mitsunori; Takizawa, Masaru*; Shimoyama, Iwao; Naramoto, Hiroshi*; Sakai, Seiji; Shamoto, Shinichi
no journal, ,
no abstracts in English