Refine your search:     
Report No.
 - 
Search Results: Records 1-8 displayed on this page of 8
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Thickness-dependent magnetic properties and strain-induced orbital magnetic moment in SrRuO$$_{3}$$ thin films

Ishigami, Keisuke*; Yoshimatsu, Kohei*; Toyota, Daisuke*; Takizawa, Masaru*; Yoshida, Teppei*; Shibata, Goro*; Harano, Takayuki*; Takahashi, Yukio*; Kadono, Toshiharu*; Verma, V. K.*; et al.

Physical Review B, 92(6), p.064402_1 - 064402_5, 2015/08

 Times Cited Count:42 Percentile:83.69(Materials Science, Multidisciplinary)

Journal Articles

Hybridization between the conduction band and 3$$d$$ orbitals in the oxide-based diluted magnetic semiconductor In$$_{2-x}$$V$$_x$$O$$_3$$

Kobayashi, Masaki*; Ishida, Yukiaki*; Hwang, J. I.*; Song, G. S.*; Takizawa, Masaru*; Fujimori, Atsushi; Takeda, Yukiharu; Okochi, Takuo*; Okane, Tetsuo; Saito, Yuji; et al.

Physical Review B, 79(20), p.205203_1 - 205203_5, 2009/05

 Times Cited Count:7 Percentile:33.25(Materials Science, Multidisciplinary)

Journal Articles

Systematic changes of the electronic structure of the diluted ferromagnetic oxide Li-doped Ni$$_{1-x}$$Fe$$_x$$O with hole doping

Kobayashi, Masaki*; Hwang, J. I.*; Song, G.*; Oki, Yasuhiro*; Takizawa, Masaru*; Fujimori, Atsushi; Takeda, Yukiharu; Fujimori, Shinichi; Terai, Kota*; Okane, Tetsuo; et al.

Physical Review B, 78(15), p.155322_1 - 155322_4, 2008/10

 Times Cited Count:5 Percentile:26.3(Materials Science, Multidisciplinary)

Journal Articles

Soft X-ray absorption and photoemission studies of ferromagnetic Mn-implanted 3$$C$$-SiC

Song, G.*; Kobayashi, Masaki*; Hwang, J. I.*; Kataoka, Takashi*; Takizawa, Masaru*; Fujimori, Atsushi; Okochi, Takuo; Takeda, Yukiharu; Okane, Tetsuo; Saito, Yuji; et al.

Japanese Journal of Applied Physics, 47(9), p.7113 - 7116, 2008/09

 Times Cited Count:3 Percentile:14.43(Physics, Applied)

Journal Articles

Electronic structure of Ga$$_{1-x}$$Cr$$_{x}$$N and Si-doping effects studied by photoemission and X-ray absorption spectroscopy

Song, G.*; Kobayashi, Masaki*; Hwang, J. I.*; Kataoka, Takashi*; Takizawa, Masaru*; Fujimori, Atsushi; Okochi, Takuo; Takeda, Yukiharu; Okane, Tetsuo; Saito, Yuji; et al.

Physical Review B, 78(3), p.033304_1 - 033304_4, 2008/07

 Times Cited Count:8 Percentile:37.4(Materials Science, Multidisciplinary)

Journal Articles

Photoemission and X-ray absorption studies of valence states in (Ni,Zn,Fe,Ti)$$_3$$O$$_4$$ thin films exhibiting photoinduced magnetization

Kobayashi, Masaki*; Oki, Yasuhiro*; Takizawa, Masaru*; Song, G. S.*; Fujimori, Atsushi; Takeda, Yukiharu; Terai, Kota*; Okane, Tetsuo; Fujimori, Shinichi; Saito, Yuji; et al.

Applied Physics Letters, 92(8), p.082502_1 - 082502_3, 2008/02

 Times Cited Count:12 Percentile:44.67(Physics, Applied)

Journal Articles

Phase change observed in ultrathin Ba$$_{0.5}$$Sr$$_{0.5}$$TiO$$_3$$ films by in situ resonant photoemission spectroscopy

Lin, Y.-H.*; Terai, Kota*; Wadachi, Hiroki*; Kobayashi, Masaki*; Takizawa, Masaru*; Hwang, J. I.*; Fujimori, Atsushi; Nan, C.-W.*; Li, J.-F.*; Fujimori, Shinichi; et al.

Applied Physics Letters, 90(22), p.222909_1 - 222909_3, 2007/05

AA2007-0754.pdf:0.58MB

 Times Cited Count:6 Percentile:26.48(Physics, Applied)

Epitaxial Ba$$_{0.5}$$Sr$$_{0.5}$$TiO$$_3$$ thin films were prepared on Nb-doped SrTiO$$_3$$ (100) substrates by the pulsed laser deposition technique and were studied by measuring the Ti 2p $$rightarrow$$ 3d resonant photoemission spectra in the valence-band region, both at room temperature and low temperature. The results demonstrated an abrupt variation in the spectral structures between 2.8 nm ($$sim$$7 ML) and 2.0 nm ($$sim$$5 ML) Ba$$_{0.5}$$Sr$$_{0.5}$$TiO$$_3$$ films, suggesting that there exists a critical thickness for phase change in the range of 2.0-2.8 nm.

Oral presentation

XAFS study of single-layer graphene oxide grown on sapphire(0001)

Entani, Shiro; Honda, Mitsunori; Takizawa, Masaru*; Shimoyama, Iwao; Naramoto, Hiroshi*; Sakai, Seiji; Shamoto, Shinichi

no journal, , 

no abstracts in English

8 (Records 1-8 displayed on this page)
  • 1