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Matsunami, Noriaki*; Sataka, Masao; Okayasu, Satoru; Ishikawa, Norito; Tazawa, Masato*; Kakiuchida, Hiroshi*
Nuclear Instruments and Methods in Physics Research B, 266(12-13), p.2986 - 2989, 2008/06
Times Cited Count:8 Percentile:50.26(Instruments & Instrumentation)Irradiation effects of CuO irradiated with 100 MeV Xe ions were studied. X-ray diffraction intensity and optical properties were analyzed.
Matsunami, Noriaki*; Sataka, Masao; Okayasu, Satoru; Tazawa, Masato*
Nuclear Instruments and Methods in Physics Research B, 256(1), p.333 - 336, 2007/03
Times Cited Count:15 Percentile:70.17(Instruments & Instrumentation)no abstracts in English
Sugai, Hiroyuki; Matsunami, Noriaki*; Fukuoka, Osamu*; Sataka, Masao; Kato, Teruo; Okayasu, Satoru; Shimura, Tetsuo*; Tazawa, Masato*
Nuclear Instruments and Methods in Physics Research B, 250(1-2), p.291 - 294, 2006/09
Times Cited Count:15 Percentile:70.41(Instruments & Instrumentation)We have investigated the effects on electrical properties of Al-doped ZnO (AZO) semiconductor films induced by high-energy heavy ion. The AZO films with c-axis on SiO glass substrate were prepared by a RF-sputter-deposition method at 400 C. Rutherford backscattering spectroscopy shows that the Al/Zn composition and the film thickness are 4 % and 0.3 m. We find that the conductivity monotonically increases from 1.510 to 810 S/cm with increasing the fluence up to 410/cm, as already been observed for 100 keV Ne irradiation. The fluence of 100 keV Ne at which the conductivity takes its maximum is 310/cm (7 dpa). The dpa of 100 MeV Xe at 410/cm is estimated as 0.008. Hence, the conductivity increase by 100 MeV Xe ion is ascribed to the electronic excitation effects.
Fukuoka, Osamu*; Matsunami, Noriaki*; Tazawa, Masato*; Shimura, Tetsuo*; Sataka, Masao; Sugai, Hiroyuki; Okayasu, Satoru
Nuclear Instruments and Methods in Physics Research B, 250(1-2), p.295 - 299, 2006/09
Times Cited Count:24 Percentile:82.92(Instruments & Instrumentation)We have investigated the effects on electrical and optical properties of Al-doped ZnO (AZO) semiconductor films induced by high-energy heavy ion. The AZO films with c-axis on SiO glass substrate were prepared by a RF-sputter-deposition method at 400 C. Rutherford backscattering spectroscopy shows that the Al/Zn composition and the film thickness are 4 % and 0.3 m. No appreciable change was observed in optical transparency. We find that the conductivity monotonically increases from 1.510 to 810 S/cm with increasing the fluence up to 410/cm, as already been observed for 100 keV Ne irradiation. The fluence of 100 keV Ne at which the conductivity takes its maximum is 310/cm (7 dpa). The dpa of 100 MeV Xe at 410/cm is estimated as 0.008. Hence, the conductivity increase by 100 MeV Xe ion is ascribed to the electronic excitation effects.
Shinde, N.*; Matsunami, Noriaki*; Tazawa, Masato*; Sataka, Masao; Chimi, Yasuhiro
Transactions of the Materials Research Society of Japan, 31(3), p.709 - 712, 2006/09
no abstracts in English
Matsunami, Noriaki*; Ito, Masaharu*; Takai, Yoshiaki*; Tazawa, Masato*; Sataka, Masao
Nuclear Instruments and Methods in Physics Research B, 206, p.282 - 286, 2003/05
Times Cited Count:23 Percentile:80.61(Instruments & Instrumentation)no abstracts in English
Shinde, N.*; Matsunami, Noriaki*; Shimura, Tetsuo*; Sataka, Masao; Okayasu, Satoru; Tazawa, Masato*
no journal, ,
no abstracts in English
Matsunami, Noriaki*; Kakiuchida, Hiroshi*; Tazawa, Masato*; Sataka, Masao; Okayasu, Satoru; Sugai, Hiroyuki
no journal, ,
no abstracts in English