Complexation of Eu(III), Pb(II), and U(VI) with a glycoprotein; Microbial transformation of heavy elements in the aquatic environment

Kozai, Naofumi; Sakamoto, Fuminori; Tanaka, Kazuya; Onuki, Toshihiko; Sato, Takahiro*; Kamiya, Tomihiro*; Grambow, B.

Chemosphere, 196, p.135 - 144, 2018/04

https://doi.org/10.1016/j.chemosphere.2017.12.154

Transformation of heavy elements by microbes such as bacteria and fungi has been an intense research subject; however, little is known about that of protozoa. This study investigated interaction of a representative protozoa, , with heavy elements (Eu(III), Pb(II), U(VI)). Non-destructive elemental analysis by micro-PIXE hardly detected those elements on living cells after sorption experiments but clearly detected on the cells that were killed with a fixative beforehand. Chromatographic analysis of aquatic species of those heavy elements after the sorption experiments revealed a fraction of those elements bound to a glycoprotein dissolved from the cell surface of living cells to form soluble pseudocolloid. These findings suggest that complexation of heavy elements with the dissolved surface glycoprotein reduced the sorption of those heavy elements on living cells.

Light ion microbeam analysis / processing system and its improvement

Koka, Masashi; Ishii, Yasuyuki; Yamada, Naoto; Okubo, Takeru; Kada, Wataru*; Kitamura, Akane; Iwata, Yoshihiro*; Kamiya, Tomihiro; Sato, Takahiro

JAEA-Technology 2016-006, 41 Pages, 2016/03

JAEA-Technology-2016-006.pdf:14.03MB

A MeV-class light ion microbeam system has been developed for micro-analysis and micro-fabrication with high spatial resolution at 3-MV single-ended accelerator in Takasaki Ion Accelerators for Advanced Radiation Application of Takasaki Advanced Radiation Research Institute, Sector of Nuclear Science Research, Japan Atomic Energy Agency. This report describes the technical improvements for the main apparatus (the accelerator, beam-transport lines, and microbeam system), and auxiliary equipments/ parts for ion beam applications such as Particle Induced X-ray/Gamma-ray Emission (PIXE/PIGE) analysis, 3-D element distribution analysis using PIXE-Computed Tomography(CT), Ion Beam-Induced Luminescence (IBIL) analysis, and Proton Beam Writing with the microbeam scanning, with functional outline of these apparatus and equipments/parts.

Fabrication of microstructures embedded in SC-CVD diamond with a focused proton microbeam

Kada, Wataru*; Kambayashi, Yuya*; Miura, Kenta*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Hanaizumi, Osamu*

Key Engineering Materials, 643, p.15 - 19, 2015/05

http://doi.org/10.4028/www.scientific.net/KEM.643.15

Beam size reduction of a several hundred-keV compact ion microbeam system by improving the extraction condition in an ion source

Ishii, Yasuyuki; Okubo, Takeru; Kamiya, Tomihiro; Saito, Yuichi

Nuclear Instruments and Methods in Physics Research B, 348, p.79 - 82, 2015/04

https://doi.org/10.1016/j.nimb.2014.12.011

Development of embedded Mach-Zehnder optical waveguide structures in polydimethylsiloxane thin films by proton beam writing

Kada, Wataru*; Miura, Kenta*; Kato, Hijiri*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Ishii, Yasuyuki; Kamiya, Tomihiro; Nishikawa, Hiroyuki*; et al.

Nuclear Instruments and Methods in Physics Research B, 348, p.218 - 222, 2015/04

https://doi.org/10.1016/j.nimb.2014.12.041

Evaluation of phase bunching in the central region of a cyclotron by a radial probe with a plastic scintillator

Miyawaki, Nobumasa; Fukuda, Mitsuhiro*; Kurashima, Satoshi; Kashiwagi, Hirotsugu; Okumura, Susumu; Arakawa, Kazuo*; Kamiya, Tomihiro

Nuclear Instruments and Methods in Physics Research A, 767, p.372 - 378, 2014/12

https://doi.org/10.1016/j.nima.2014.09.006

Development of microbeam formation and single-ion hit technologies at the TIARA cyclotron

Yokota, Wataru; Sato, Takahiro; Kamiya, Tomihiro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Yoshida, Kenichi; Funayama, Tomoo; Sakashita, Tetsuya; et al.

JAEA-Technology 2014-018, 103 Pages, 2014/09

JAEA-Technology-2014-018.pdf:123.66MB

The world's first microbeam focusing technology for heavy ions of hundreds MeV accelerated by a cyclotron has been developed at the TIARA facility in the Takasaki Advanced Radiation Research Institute of the Japan Atomic Energy Agency. The technology enables us to form a microbeam of less than 1 m in diameter and to shoot a specified point on a target by one ion (single-ion hit) with spatial accuracy of microbeam size. In the course of the development, a cyclotron technology to accelerate a small energy-spread beam of hundres MeV, which is necessary for focusing to 1 m, has been developed as well as a beam focusing apparatus, beam size measurement and so forth based on the several-MeV microbeam/single-ion hit system of the TIARA electrostatic accelerators. Applicability of the technologies was examined by actual use in irradiation experiment and the result were fed back to them. This paper reports the process and the results of the development over ten years.

Development of real-time position detection system for single-ion hit

Yokoyama, Akihito; Kada, Wataru*; Sato, Takahiro; Koka, Masashi; Yamamoto, Shunya; Kamiya, Tomihiro; Yokota, Wataru

Nuclear Instruments and Methods in Physics Research B, 332, p.334 - 336, 2014/08

https://doi.org/10.1016/j.nimb.2014.02.090

A system is developed for the real-time position detection of single-ions which hits a target with spatial accuracy about 1 m. The system combines highly luminescent, sensitive, scintillators with a high sensitivity luminescence detection system. The real-time detection system contains a AlO:Eu scintillator, Eu implanting into -AlO. A single-crystal scintillator has been selected since position resolution of emission for powdery scintillator is limited by a grain size, several micrometers for ZnS for example. When the material is irradiated with an electron or ion beam, the Eu is activated and strong luminescence occurs. The detection system includes an image intensifier tube and an electron multiplier CCD camera. The results show that our system can be sufficiently sensitive to detect the hit of a single-ion in real time through simple improvement in emission intensity of the scintillator.

Simultaneous ion luminescence imaging and spectroscopy of individual aerosol particles with external proton or helium microbeams

Kada, Wataru*; Sato, Takahiro; Yokoyama, Akihito; Koka, Masashi; Kamiya, Tomihiro

Nuclear Instruments and Methods in Physics Research B, 332, p.42 - 45, 2014/08

https://doi.org/10.1016/j.nimb.2014.02.026

no abstracts in English

Analysis of microscopic air-bone particle by combined system of in-air micro PIXE and ion luminescence microscopic imaging and spectroscopy

Kada, Wataru*; Yokoyama, Akihito; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro

Hoshasen To Sangyo, (136), p.40 - 45, 2014/06

http://ci.nii.ac.jp/naid/40020125409

no abstracts in English