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Journal Articles

Comparison of COTS SRAMs and SDRAMs on total ionizing dose tolerance

Takeuchi, Koichiro*; Akiyama, Masatsugu*; Hirao, Toshio

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.195 - 199, 2004/10

no abstracts in English