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Saito, Yuji; Fukuda, Yoshihiro; Takeda, Yukiharu; Yamagami, Hiroshi; Takahashi, Sunao*; Asano, Yoshihiro*; Hara, Toru*; Shirasawa, Katsutoshi*; Takeuchi, Masao*; Tanaka, Takashi*; et al.
Journal of Synchrotron Radiation, 19(3), p.388 - 393, 2012/05
Times Cited Count：101 Percentile：97.06(Instruments & Instrumentation)The soft X-ray beamline BL23SU at SPring-8 has undergone an upgrade with a twin-helical undulator of in-vacuum type to enhance the experimental capabilities of the end stations. The new light source with a fast helicity-switching operation allows not only the data throughput but also the sensitivity in X-ray magnetic circular dichroism (XMCD) to be improved. The operational performance and potential are described by presenting XMCD results of paramagnetic 
-US
measured with a 10 T superconducting magnet.
Tanaka, Hitoshi*; Takao, Masaru*; Matsushita, Tomohiro*; Aoyagi, Hideki*; Takeuchi, Masao*; Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi
Hoshako, 19(1), p.27 - 32, 2006/01
no abstracts in English
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Tanaka, Hitoshi*; Takao, Masaru*; Takeuchi, Masao*; Matsushita, Tomohiro*; Aoyagi, Hideki*
JAERI-Tech 2005-027, 29 Pages, 2005/05
JAERI-Tech-2005-027.pdf:5.14MB
We measured the orbit fluctuation caused by APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring by using the developed real time measurement system of electron and photon beam position monitors. We quantitatively found two characteristic fluctuations correlating with the ID23 motion by wavelet transform which is a kind of frequency analysis. One originates from the variation of error field during the ID drive. The other originates from the stray magnetic field leaked from the servomotors for the phase drive. Using these results, we tried to get rid of the effect of error fields on the beam orbit by the precise feed-forward correction table and the stray field shield. Consequently we succeeded in suppressing the orbit fluctuation down to sub-micron during the gap drive, which is observed by photon beam position monitors installed in downstream 20m from each light source point.
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Takeuchi, Masao*; Aoyagi, Hideki*; Tanaka, Hitoshi*
JAERI-Tech 2004-013, 16 Pages, 2004/12
JAERI-Tech-2004-013.pdf:3.55MB
We observed two characteristic electron orbit fluctuations caused when the phase of ID23 (APPLE-2 type undulator) installed at SPring-8 was driven. One was caused by the variation of magnetic error filed of ID23 when the phase was driven. The other was caused by the noise from the phase drive system which adoped AC servomotors. We measured these orbit fluctuations synchronized with the phase motion using the real-time electron beam position measurement system. The part of the orbit fluctuation was supressed by the correction table which was made referring to the obtained data.
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.290 - 293, 2004/00
We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Nakatani, Takeshi; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.21 - 24, 2004/00
no abstracts in English
Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Agui, Akane; Yoshigoe, Akitaka; Takeuchi, Masao*; Aoyagi, Hideki*; Okuma, Haruo*
JAERI-Tech 2003-048, 29 Pages, 2003/05
JAERI-Tech-2003-048.pdf:1.14MB
no abstracts in English
Hara, Toru*; Shirasawa, Katsutoshi*; Takeuchi, Masao*; Seike, Takamitsu*; Saito, Yuji; Muro, Takayuki*; Kitamura, Hideo*
Nuclear Instruments and Methods in Physics Research A, 498(1-3), p.496 - 502, 2003/02
Times Cited Count：58 Percentile：95.46(Instruments & Instrumentation)no abstracts in English
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Tanaka, Hitoshi*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*
Hoshako, 15(5), p.303 - 307, 2002/05
no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi; Matsushita, Tomohiro*; Saito, Yuji; Mizumaki, Masaichiro*; Yokoya, Akinari; Tanaka, Hitoshi*; Miyahara, Yoshikazu*; Shimada, Taihei; et al.
Hoshako, 14(5), p.339 - 348, 2001/11
no abstracts in English
Agui, Akane; Yoshigoe, Akitaka; Nakatani, Takeshi*; Matsushita, Tomohiro*; Saito, Yuji; Yokoya, Akinari; Tanaka, Hitoshi*; Miyahara, Yoshikazu*; Shimada, Taihei; Takeuchi, Masao*; et al.
Review of Scientific Instruments, 72(8), p.3191 - 3197, 2001/08
Times Cited Count：21 Percentile：71.63(Instruments & Instrumentation)no abstracts in English
Saito, Yuji; Fukuda, Yoshihiro; Takeda, Yukiharu; Hara, Toru*; Shirasawa, Katsutoshi*; Takeuchi, Masao*; Kitamura, Hideo*
no journal, ,
The SPring-8 BL23SU (JAEA Actinide Science beamline) has been upgraded by the replacement of the original APPLE-2 type undulator with a twin helical undulator using in-vacuum devices. Recently, polarization switching between beams of opposite helicity at 1 Hz has reached operational status. The test results clearly show that the new light source is very well suited for the measurement of precision X-ray absorption, magnetic circular dichroism, spectra, as well as element-specifc hysteresis loops.
