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Journal Articles

Transient currents induced in MOS capacitors by ion irradiation; Influence of incident angle of ions and device temperature

Yamakawa, Takeshi; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Wakasa, Takeshi; Shibata, Toshihiko*; Kamiya, Tomihiro

JAERI-Review 2004-025, TIARA Annual Report 2003, p.19 - 20, 2004/11

https://jopss.jaea.go.jp/pdfdata/JAERI-Review-2004-025-p0001-p0116.pdf

no abstracts in English

Journal Articles

Charge collected in Si MOS capacitors and SOI devices p$$^{+}$$n diodes due to heavy ion irradiation

Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Shibata, Toshihiko*; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Takahashi, Yoshihiro*; Onishi, Kazunori*; Ito, Hisayoshi

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.105 - 109, 2004/10

no abstracts in English

Journal Articles

Heavy-ion induced current in MOS structure

Takahashi, Yoshihiro*; Shibata, Toshihiko*; Murase, Yuji*; Onishi, Kazunori*; Hirao, Toshio; Kamiya, Tomihiro

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.111 - 114, 2004/10

no abstracts in English

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