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Kada, Wataru*; Miura, Kenta*; Kato, Hijiri*; Saruya, Ryota*; Kubota, Atsushi*; Sato, Takahiro; Koka, Masashi; Ishii, Yasuyuki; Kamiya, Tomihiro; Nishikawa, Hiroyuki*; et al.
Nuclear Instruments and Methods in Physics Research B, 348, p.218 - 222, 2015/04
Times Cited Count:6 Percentile:45.92(Instruments & Instrumentation)Tanabe, Yusuke*; Iwamoto, Takashi*; Takahashi, Junichi*; Nishikawa, Hiroyuki*; Sato, Takahiro; Ishii, Yasuyuki; Kamiya, Tomihiro
JAEA-Review 2012-046, JAEA Takasaki Annual Report 2011, P. 129, 2013/01
Omichi, Masaaki*; Takano, Katsuyoshi*; Sato, Takahiro; Kamiya, Tomihiro; Ishii, Yasuyuki; Okubo, Takeru; Koka, Masashi; Kada, Wataru; Sugimoto, Masaki; Nishikawa, Hiroyuki*; et al.
Journal of Nanoscience and Nanotechnology, 12, p.7401 - 7404, 2012/09
Times Cited Count:2 Percentile:11.57(Chemistry, Multidisciplinary)Takano, Katsuyoshi*; Asano, Atsushi*; Maeyoshi, Yuta*; Marui, Hiromi*; Omichi, Masaaki*; Saeki, Akinori*; Seki, Shu*; Sato, Takahiro; Ishii, Yasuyuki; Kamiya, Tomihiro; et al.
Journal of Photopolymer Science and Technology, 25(1), p.43 - 46, 2012/07
Times Cited Count:2 Percentile:6.57(Polymer Science)Takano, Katsuyoshi*; Sugimoto, Masaki; Asano, Atsushi*; Maeyoshi, Yuta*; Marui, Hiromi*; Omichi, Masaaki*; Saeki, Akinori*; Seki, Shu*; Sato, Takahiro; Ishii, Yasuyuki; et al.
Transactions of the Materials Research Society of Japan, 37(2), p.237 - 240, 2012/06
Maeyoshi, Yuta*; Takano, Katsuyoshi*; Asano, Atsushi*; Marui, Hiromi*; Omichi, Masaaki*; Sato, Takahiro; Kamiya, Tomihiro; Ishii, Yasuyuki; Okubo, Takeru; Koka, Masashi; et al.
Japanese Journal of Applied Physics, 51(4R), p.045201_1 - 045201_4, 2012/04
Times Cited Count:1 Percentile:4.43(Physics, Applied)Takano, Katsuyoshi*; Sato, Takahiro; Kamiya, Tomihiro; Ishii, Yasuyuki; Okubo, Takeru; Koka, Masashi; Kada, Wataru; Sugimoto, Masaki; Seki, Shuhei*; Nishikawa, Hiroyuki*
JAEA-Review 2011-043, JAEA Takasaki Annual Report 2010, P. 162, 2012/01
Tanabe, Yusuke*; Nishikawa, Hiroyuki*; Sato, Takahiro; Ishii, Yasuyuki; Kamiya, Tomihiro
JAEA-Review 2011-043, JAEA Takasaki Annual Report 2010, P. 163, 2012/01
Miura, Kenta*; Machida, Yuki*; Uehara, Masato*; Kiryu, Hiromu*; Ozawa, Yusuke*; Sasaki, Tomoyuki*; Hanaizumi, Osamu*; Sato, Takahiro; Ishii, Yasuyuki; Koka, Masashi; et al.
Key Engineering Materials, 497, p.147 - 150, 2012/00
Times Cited Count:7 Percentile:95.12(Engineering, Electrical & Electronic)Miura, Kenta*; Machida, Yuki*; Uehara, Masato*; Kiryu, Hiromu*; Ozawa, Yusuke*; Sasaki, Tomoyuki*; Hanaizumi, Osamu*; Sato, Takahiro; Ishii, Yasuyuki; Koka, Masashi; et al.
Key Engineering Materials, 497, p.147 - 150, 2011/12
Times Cited Count:6 Percentile:2.48Kamiya, Tomihiro; Takano, Katsuyoshi; Sato, Takahiro; Ishii, Yasuyuki; Nishikawa, Hiroyuki*; Seki, Shu*; Sugimoto, Masaki; Okumura, Susumu; Fukuda, Mitsuhiro*
Nuclear Instruments and Methods in Physics Research B, 269(20), p.2184 - 2188, 2011/10
Times Cited Count:15 Percentile:73.97(Instruments & Instrumentation)Takano, Katsuyoshi; Sato, Takahiro; Ishii, Yasuyuki; Koka, Masashi; Kamiya, Tomihiro; Okubo, Takeru; Sugimoto, Masaki; Nishikawa, Hiroyuki*; Seki, Shu*
Transactions of the Materials Research Society of Japan, 36(3), p.305 - 308, 2011/09
Tanabe, Yusuke*; Nishikawa, Hiroyuki*; Seki, Yoshihiro*; Sato, Takahiro; Ishii, Yasuyuki; Kamiya, Tomihiro; Watanabe, Toru*; Sekiguchi, Atsushi*
Microelectronic Engineering, 88(8), p.2145 - 2148, 2011/08
Times Cited Count:9 Percentile:47.34(Engineering, Electrical & Electronic)Shiine, Yasuharu*; Nishikawa, Hiroyuki*; Furuta, Yusuke*; Kanamitsu, Kaoru*; Sato, Takahiro; Ishii, Yasuyuki; Kamiya, Tomihiro; Nakao, Ryota*; Uchida, Satoshi*
Microelectronic Engineering, 87(5-8), p.835 - 838, 2010/05
Times Cited Count:7 Percentile:42.49(Engineering, Electrical & Electronic)Kamiya, Tomihiro; Takano, Katsuyoshi; Ishii, Yasuyuki; Sato, Takahiro; Oikawa, Masakazu*; Okubo, Takeru; Haga, Junji*; Nishikawa, Hiroyuki*; Furuta, Yusuke*; Uchiya, Naoyuki*; et al.
Nuclear Instruments and Methods in Physics Research B, 267(12-13), p.2317 - 2320, 2009/06
Times Cited Count:7 Percentile:47.15(Instruments & Instrumentation)Kamiya, Tomihiro; Nishikawa, Hiroyuki*; Sato, Takahiro; Haga, Junji; Oikawa, Masakazu*; Ishii, Yasuyuki; Okubo, Takeru; Uchiya, Naoyuki; Furuta, Yusuke*
Applied Radiation and Isotopes, 67(3), p.488 - 491, 2009/03
Times Cited Count:4 Percentile:30.49(Chemistry, Inorganic & Nuclear)Development of a mask-less ion beam lithography technique for fabricating micro- or nano-meter sized structures has been started at the microbeam systems in the ion accelerator facility of JAEA Takasaki (TIARA) in collaboration with Shibaura Institute of Technology. In order to obtain a high precision measure for microbeam size estimation and lens system optimization, or for improvement of spatial resolution down to 100 nm level, we applied this lithography technique itself combined with the electroplating process to make a Ni relief pattern as an optimum resolution standard to be used in secondary electron imaging. In this work, using this standard, the smallest beam size could be obtained. This paper also discuses on the scattering of ions in the materials influenced to the resolution using a Monte Carlo simulation code.
Uchiya, Naoyuki*; Furuta, Yusuke*; Nishikawa, Hiroyuki*; Watanabe, Toru*; Haga, Junji; Sato, Takahiro; Oikawa, Masakazu; Ishii, Yasuyuki; Kamiya, Tomihiro
Microsystem Technologies, 14(9-11), p.1537 - 1540, 2008/10
Times Cited Count:17 Percentile:64.34(Engineering, Electrical & Electronic)Nishikawa, Hiroyuki*; Souno, T.*; Hattori, M.*; Oki, Y.*; Watanabe, E.*; Oikawa, Masakazu*; Arakawa, Kazuo; Kamiya, Tomihiro
JAERI-Review 2003-033, TIARA Annual Report 2002, p.254 - 256, 2003/11
no abstracts in English
Nishikawa, Hiroyuki*; Souno, T.*; Hattori, M.*; Nishihara, Y.*; Oki, Y.*; Watanabe, E.*; Oikawa, Masakazu*; Kamiya, Tomihiro; Arakawa, Kazuo
Nuclear Instruments and Methods in Physics Research B, 191(1-4), p.342 - 345, 2002/05
Times Cited Count:3 Percentile:24.4(Instruments & Instrumentation)no abstracts in English
*; *; *; *; Kusama, Yasuo; Seguchi, Tadao
Japanese Journal of Applied Physics, 33(7A), p.3937 - 3941, 1994/07
Times Cited Count:2 Percentile:17.88(Physics, Applied)no abstracts in English