JOPSS - Search Results

Journal Articles

Measurement of local temperature around the impact points of fast ions under grazing incidence

Kokabu, Hiroki*; Yoon, S.*; Lee, H.*; Nakajima, Kaoru*; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Toulemonde, M.*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 460, p.34 - 37, 2019/12

https://doi.org/10.1016/j.nimb.2019.01.006

Times Cited Count：0 Percentile：0.02(Instruments & Instrumentation)

Journal Articles

Temperature of thermal spikes induced by swift heavy ions

Matsuzaki, Shota*; Hayashi, Hiroaki*; Nakajima, Kaoru*; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Toulemonde, M.*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 406(Part B), p.456 - 459, 2017/09

https://doi.org/10.1016/j.nimb.2016.12.019

Times Cited Count：4 Percentile：36.71(Instruments & Instrumentation)

Journal Articles

Tracing temperature in a nanometer size region in a picosecond time period

Nakajima, Kaoru*; Kitayama, Takumi*; Hayashi, Hiroaki*; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Toulemonde, M.*; Bouffard, S.*; Kimura, Kenji*

Scientific Reports (Internet), 5, p.13363_1 - 13363_8, 2015/08

https://doi.org/10.1038/srep13363

Times Cited Count：5 Percentile：40.93(Multidisciplinary Sciences)

Journal Articles

Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C $_{60}^{3+}$ impacts

Kitayama, Takumi*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 354, p.183 - 186, 2015/07

https://doi.org/10.1016/j.nimb.2014.11.002

Times Cited Count：2 Percentile：17.52(Instruments & Instrumentation)

Journal Articles

Sputtering of SiN films by 540 keV C $_{60}$ $^{2+}$ ions observed using high-resolution Rutherford backscattering spectroscopy

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Fujii, Yoshikazu*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 332, p.117 - 121, 2014/08

https://doi.org/10.1016/j.nimb.2014.02.042

Times Cited Count：7 Percentile：48.18(Instruments & Instrumentation)

Journal Articles

Surface effect on ion track formation in amorphous Si $_{3}$ N $_{4}$ films

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 315, p.142 - 145, 2013/11

https://doi.org/10.1016/j.nimb.2013.03.043

Times Cited Count：13 Percentile：69.38(Instruments & Instrumentation)

Oral presentation

Thickness dependence of length of ion tracks induced in amorphous SiN membranes by bombardment of C $_{60}$ ions

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

Oral presentation

Direct observation of ion tracks in amorphous insulator thin films with transmission electron microscopy

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; et al.

no journal, ,

no abstracts in English

Oral presentation

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; et al.

no journal, ,

no abstracts in English

Oral presentation

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; et al.

no journal, ,

Oral presentation

Measurement of local temperature around the impact points of fast ions

Hayashi, Hiroaki*; Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; et al.

no journal, ,

no abstracts in English

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Measurement of local temperature around the impact points of fast ions under grazing incidence

Temperature of thermal spikes induced by swift heavy ions

Tracing temperature in a nanometer size region in a picosecond time period

Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C $_{60}^{3+}$ impacts

Sputtering of SiN films by 540 keV C $_{60}$ $^{2+}$ ions observed using high-resolution Rutherford backscattering spectroscopy

Surface effect on ion track formation in amorphous Si $_{3}$ N $_{4}$ films

Thickness dependence of length of ion tracks induced in amorphous SiN membranes by bombardment of C $_{60}$ ions

Direct observation of ion tracks in amorphous insulator thin films with transmission electron microscopy

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Measurement of local temperature around the impact points of fast ions