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Daido, Hiroyuki; Suzuki, Yoji; Kawachi, Tetsuya; Fukuda, Takeshi*; Nakagiri, Toshio; Kaku, Masanori*; Kubodera, Masakazu*
Optics Express (Internet), 21(23), p.28182 - 28188, 2013/11
Times Cited Count：1 Percentile：7.05(Optics)We describe the direct measurement of actual transmittance of sodium samples with thickness of a 2 mm and 3 mm in a spectral range 
115 nm, resulting in 50% transmittance of 3 mm thick solid and liquid sodium samples including transmission of a pair of the windows at the wavelength of 120 nm, giving an extinction coefficient of 
10
to 10
which represents the sodium with a few cm thickness to be partially transparent for this wavelength. To confirm the measurement, we perform simple imaging experiments by the ultra-violet light passing through a 8 mm-thick sodium sample to illuminate a mesh as an object, resulting in obtaining a clear image.
Daido, Hiroyuki; Suzuki, Yoji; Kawachi, Tetsuya; Fukuda, Takeshi*; Nakagiri, Toshio; Kaku, Masanori*; Kubodera, Masakazu*; Pirozhkov, A. S.
Proceedings of SPIE, Vol.8849, p.884908_1 - 884908_11, 2013/09
no abstracts in English
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
AIP Conference Proceedings 1234, p.347 - 350, 2010/06
Times Cited Count：3 Percentile：75.75(Physics, Applied)Linear polarization measurements were carried out using a newly developed soft X-ray polarimeter and ellipsometer (SXPE) for complete polarization analysis at a soft X-ray beamline (BL-11) of the SR Center, Ritsumeikan University, Japan. A Mo/Si multilayer mirror was deposited on the surface of a Si(111) substrate by an ion beam sputtering method. It was cut into two pieces which were then used as reflection-type polarizers. When the incident wavelength was scanned from 12.4 nm to 14.8 nm by a Monk-Gillieson type varied-line-spacing grating monochromator of the BL-11, the angles of incidence of both the Mo/Si multilayer polarizers in the SXPE were also varied from 37.5
to 52.3. The polarizances depended strongly on the wavelength, and the best performance of over 99% was obtained in the vicinity of 14 nm. Using these polarizers, we assessed that the degree of linear polarization of the BL-11 was almost constant at 85-88% in the measured wavelength range.
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
Memoirs of the SR Center Ritsumeikan University, (12), p.87 - 100, 2010/05
A novel apparatus for polarimetric and ellipsometric measurements for the complete polarization analysis in the soft X-ray (SX) region, which is based on the rotating-analyzer ellipsometry by using six independently movable drive shafts, has been designed, constructed, and installed in BL-11. Linear polarization measurement has been demonstrated using two identical Mo/Si multilayer polarizers. The incident wavelength was scanned from 12.4 nm to 14.8 nm by a VLS-PGM of BL-11, and the angles of incidence of both polarizers were also varied from 37.5 to 52.3. The best performance of polarizers has been determined to be over 99% at 13.9 nm, and the degree of linear polarization has been assessed to be 85-88% in the measured wavelength range for the first time since the completion of the beamline. This means that BL-11 is upgraded as the comprehensive evaluation beamline for optical elements including polarizing elements for use in the SX region.
Imazono, Takashi; Suzuki, Yoji; Sano, Kazuo*; Koike, Masato
Spectrochimica Acta, Part B, 65(2), p.147 - 151, 2010/02
Times Cited Count：2 Percentile：14.55(Spectroscopy)To meet the needs we have been developing an apparatus to evaluate polarization abilities of multilayer- and crystal-types polarizing elements and determine the polarization state of light in 1 keV region. The 8-axis goniometer called the polarization analysis-unit is equipped in this apparatus and consists of a phase shifter-unit and an analyzer-unit. All axes can be driven with HV compatible stepping motors. Both reflection- and transmission-types samples are available on P and A. Therefore, this apparatus makes it possible to carry out not only conventional reflection and transmission measurements but also four scanning modes which are double- reflections and transmissions, and transmission-reflection and vice versa.
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
Review of Scientific Instruments, 80(8), p.085109_1 - 085109_8, 2009/08
Times Cited Count：18 Percentile：60.04(Instruments & Instrumentation)A new apparatus for polarimetric and ellipsometric measurements based on the rotating-analyzer method in the soft X-ray region has been designed, constructed, and installed in the soft X-ray beamline BL-11 at the SR Center of Ritsumeikan University, Shiga, Japan. It can realize the optical configurations for the complete polarization analysis by using six independently movable drive shafts. A demonstration of the capabilities of the apparatus has been performed using Mo/Si multilayer polarizers deposited by an ion beam sputtering method. It is for the first time shown that the degree of linear polarization of monochromatized light from the BL-11 is approximately 87% at 92 eV since the beamline has been constructed.
Ochi, Yoshihiro; Hasegawa, Noboru; Suzuki, Yoji; Sukegawa, Kota*; Kawachi, Tetsuya; Kishimoto, Maki; Nagashima, Keisuke
JAERI-Tech 2004-062, 32 Pages, 2004/11
JAERI-Tech-2004-062.pdf:1.84MB
We have designed new chirp-pulse amplification (CPA) laser system for 0.1 Hz repetition rate soft X-ray laser system. We adopted the optical parametric chirped pulse amplifier (OPCPA) for a pre-amplifier because of its pulse controllability. For a main-amplifier, we decided to use a zigzag-slab amplifier because of its thermal radiation ability. In order to avoid the inhomogeneous spatial profile of the amplified laser beam, the image of the incident laser light created by a serrated aperture is transferred by use of an image relay system. In this report, we will show the preliminary test of each amplifier using a prototype system and the details of the final system design.
Ozu, Akira; Suzuki, Yoji; Maruyama, Yoichiro; Arisawa, Takashi
Applied Physics Letters, 76(14), p.1822 - 1824, 2000/04
Times Cited Count：7 Percentile：35.11(Physics, Applied)no abstracts in English
Ozu, Akira; Suzuki, Yoji; Maruyama, Yoichiro; Arisawa, Takashi
Physics of Plasmas, 7(2), p.770 - 772, 2000/02
Times Cited Count：4 Percentile：14.51(Physics, Fluids & Plasmas)no abstracts in English
Maruyama, Yoichiro; Suzuki, Yoji; Kato, Masaaki; Ozu, Akira; Sugiyama, Akira; Arisawa, Takashi
Laser Advanced Materials Processing,Vol. 2, p.1251 - 1256, 1992/06
no abstracts in English
; ; ; Shiba, Koreyuki
Chemical Physics, 81(3), p.473 - 479, 1983/11
Times Cited Count：6 Percentile：28.88(Chemistry, Physical)no abstracts in English
; ; ; ; Naruse, Yuji
JAERI-M 83-124, 30 Pages, 1983/08
no abstracts in English
; ; ; Naruse, Yuji
J.Phys.,D, 16, p.2415 - 2424, 1983/00
no abstracts in English
; ; ; Shiba, Koreyuki
J.Phys.,D, 15, p.1955 - 1962, 1982/00
no abstracts in English
Imazono, Takashi; Suzuki, Yoji; Sano, Kazuo*; Koike, Masato
no journal, ,
no abstracts in English
Imazono, Takashi; Suzuki, Yoji; Sano, Kazuo*; Koike, Masato
no journal, ,
no abstracts in English
Imazono, Takashi; Suzuki, Yoji; Sano, Kazuo*; Koike, Masato
no journal, ,
In magnetic science such as magnetic circular dichroism measurement, core electrons are excited by polarized soft X-ray. Experimenters using polarized soft X-rays as the incident light need the information on its polarization state, so that it is useful for them to evaluate it in advance. In the energy range from 0.7 to 0.9 keV, which is in the vicinity of the absorption edges of 3
transition metals, it makes impossible to perform the polarization measurement. It is because existing polarizing elements are unusable in this energy region. In order to develop new polarizing elements and evaluate the polarization state, an apparatus for soft X-ray ellipsometry based on the rotating-analyzer method has been designed and installed to the SR Center of Ritsumeikan University. We discuss the specification and the result of the preliminary performance test of this apparatus.
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
no journal, ,
It is important for studies using polarized soft X-rays to obtain the information on the polarization state of polarized light in advance. No supply of polarizing element practicable in the energy region of 0.7-0.9 keV, which is in the vicinity of the L-edges of 3d transition metals, makes it difficult to evaluate the polarization state of the actual light so far. In order to perform polarization measurement, a soft X-ray ellipsometer equipped with six drive shafts for measurement and three ones for alignment has been designed newly and installed to BL-11 beamline, Evaluation System for Soft X-ray Optical Elements, at SR Center, Ritsumeikan University. A result of reflection measurement carried out as a performance test, the reflection profile, peak position, and reflection width of Mo/SiO
multilayer polarizer, which has been fabricated newly in this study, obtained by the ellipsometer is well agree with those of the existing reflectometer.
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
no journal, ,
no abstracts in English
Imazono, Takashi; Sano, Kazuo*; Suzuki, Yoji; Kawachi, Tetsuya; Koike, Masato
no journal, ,
no abstracts in English
