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Goto, Minoru; Demachi, Kazuyuki*; Ueta, Shohei; Nakano, Masaaki*; Honda, Masaki*; Tachibana, Yukio; Inaba, Yoshitomo; Aihara, Jun; Fukaya, Yuji; Tsuji, Nobumasa*; et al.
Proceedings of 21st International Conference & Exhibition; Nuclear Fuel Cycle for a Low-Carbon Future (GLOBAL 2015) (USB Flash Drive), p.507 - 513, 2015/09
A concept of a plutonium burner HTGR named as Clean Burn, which has a high nuclear proliferation resistance, had been proposed by Japan Atomic Energy Agency. In addition to the high nuclear proliferation resistance, in order to enhance the safety, we propose to introduce PuO
-YSZ TRISO fuel with ZrC coating to the Clean Burn. In this study, we conduct fabrication tests aiming to establish the basic technologies for fabrication of PuO-YSZ TRISO fuel with ZrC coating. Additionally, we conduct a quantitative evaluation of the security for the safety, a design of the fuel and the reactor core, and a safety evaluation for the Clean Burn to confirm the feasibility. This study is conducted by The University of Tokyo, Japan Atomic Energy Agency, Fuji Electric Co., Ltd., and Nuclear Fuel Industries, Ltd. It was started in FY2014 and will be completed in FY2017, and the first year of the implementation was on schedule.
Koizumi, Yasuo; Takahashi, Kazuki*; Uesawa, Shinichiro; Yoshida, Hiroyuki; Takase, Kazuyuki
Dai-52-Kai Nihon Dennetsu Shimpojiumu Koen Rombunshu (CD-ROM), P. 2, 2015/06
Pool nucleate boiling heat transfer experiments were performed for water at 0.101 MPa to examine the elementary process of the nucleate boiling. The copper printed circuit board of a 1.57 mm thick bakelite plate coated with a 0.035 mm thick copper membrane was used for a heat transfer surface. The size of the heat transfer surface was 10 mm 
10 mm. direct current was supplied to it to heat it up. The bakelite plate of the backside of the copper layer was taken by 7 mm 10 mm. The instantaneous variation of the backside temperature of the heat transfer surface was measured with an infrared radiation camera. The time and the space resolution of the infrared cameras used in experiments were 120 Hz and 0.315 mm 0.315 mm, respectively. Surface temperatures just before the burn-out measured with 120 Hz suggest that the surface temperature was steadily low at a large part of the heat transfer surface. A small hot-dry area came out at the critical heat flux condition. Then, this small hot-dry area iterated to expand and shrink and gradually grew. Other area was still wetted and kept at low temperature. Eventually the small hot-dry area started to grow continuously and a whole part of the heat transfer surface became hot-dry to reach the physical burn-out. The heat transfer surface was divided into two large areas; the hot-dry area and the low-temperature wetted area until the physical burn-out. The local surface heat flux variation derived from measured surface temperature variation clearly illustrated that the boundary between the dried area and the wetted area moved back and forth and the dried arear gradually grew to reach physical bourn-out at the critical heat flux condition.
Koizumi, Yasuo; Takahashi, Kazuki*; Uesawa, Shinichiro; Yoshida, Hiroyuki; Takase, Kazuyuki
Proceedings of 9th International Conference on Boiling and Condensation Heat Transfer (Boiling & Condensation 2015) (DVD-ROM), 10 Pages, 2015/04
Pool nucleate boiling heat transfer experiments were performed for water at 0.101 MPa to examine the elementary process of the nucleate boiling. The copper printed circuit board of a 1.57 mm thick Bakelite plate coated with a 0.035 mm thick copper membrane was used for a heat transfer surface. The size of the heat transfer surface was 10 mm 10 mm. Direct current was supplied to it to heat it up. The Bakelite plate of the backside of the copper layer was taken by 7 mm 10 mm. The instantaneous variation of the backside temperature of the heat transfer surface was measured with an infrared radiation camera. The time and the space resolution of the infrared cameras used in experiments were 120 Hz and 0.315 mm 0.315 mm, respectively. Surface temperatures just before the burn-out measured with 120 Hz suggest that the surface temperature was steadily low at a large part of the heat transfer surface. A small hot-dry area came out at the critical heat flux condition. Then, this small hot-dry area iterated to expand and shrink and gradually grew. Other area was still wetted and kept at low temperature. Eventually the small hot-dry area started to grow continuously and a whole part of the heat transfer surface became hot-dry to reach the physical burn-out. The heat transfer surface was divided into two large areas; the hot-dry area and the low-temperature-wetted area until the physical burn-out. The local surface heat flux variation derived from measured surface temperature variation clearly illustrated that the boundary between the dried area and the wetted area moved back and forth and the dried arear gradually grew to reach physical bourn-out at the critical heat flux condition.
Makino, Takahiro; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi
IEEE Transactions on Nuclear Science, 56(6), p.3180 - 3184, 2009/12
Times Cited Count：13 Percentile：64.74(Engineering, Electrical & Electronic)SET-induced soft-error rates (
s) of logic LSIs are estimated from SET pulse-widths measured in logic cells used in logic LSIs. The estimated rates are consistent with directly measured s for logic LSIs.
Makino, Takahiro*; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Yanagawa, Yoshimitsu*; Saito, Hirobumi*; Ikeda, Hirokazu*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; et al.
IEEE Transactions on Nuclear Science, 56(1), p.202 - 207, 2009/02
Times Cited Count：36 Percentile：90.64(Engineering, Electrical & Electronic)SET pulse-widths were measured as a function of LET by using pulse capture circuits and were simulated with mixed-mode 3-D device simulations. We found that the carrier recombination process dominates LET dependence of SET pulse-widths.
Makino, Takahiro*; Yanagawa, Yoshimitsu*; Kobayashi, Daisuke*; Fukuda, Seisuke*; Hirose, Kazuyuki*; Ikeda, Hirokazu*; Saito, Hirobumi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; et al.
Shingaku Giho, 108(100), p.67 - 72, 2008/06
SET pulse-widths were measured as a function of LET by using pulse capture circuits. In addition, a scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI system.
Amano, Hikaru; *; Uchida, Shigeo*; Tsuzuki, Katsunori; Matsuoka, Shungo*; Ikeda, Hiroshi*; Matsubara, Takeshi*; Kurosawa, Naohiro*
KURRI-KR-80, p.48 - 49, 2001/12
no abstracts in English
Makino, Takahiro*; Kobayashi, Daisuke*; Hirose, Kazuyuki*; Yanagawa, Yoshimitsu*; Saito, Hirobumi*; Ikeda, Hirokazu*; Takahashi, Daisuke*; Ishii, Shigeru*; Kusano, Masaki*; Onoda, Shinobu; et al.
no journal, ,
no abstracts in English
Oshima, Akihiro*; Shiraki, Fumiya*; Takasawa, Yuya*; Fujita, Hajime*; Yoshikawa, Taeko*; Tatsumi, Takahiro*; Tsubokura, Hidehiro*; Takahashi, Tomohiro*; Gowa, Tomoko*; Sakaue, Kazuyuki*; et al.
no journal, ,
no abstracts in English
