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Journal Articles

Measurement of internal strain in materials using high energy synchrotron radiation white X-rays

Shibano, Junichi*; Shobu, Takahisa; Suzuki, Kenji*; Hirata, Tomoyuki*; Kaneko, Hiroshi; Kobayashi, Michiaki*

Zairyo, 56(10), p.985 - 992, 2007/10

This paper presents a basic research on a measurement of strain in the bulk of materials by using high energy white X-rays from a synchrotron radiation source of SPring-8. WEL-TEN780E (JIS G3128 SHY685) whose grain size was 0.013 mm was used as a specimen. The specimen was loaded with four point bending. The white X-ray beam, which has a height of 0.05 mm and width of 0.03 mm, was incident in it. Bending strain at the surface of specimen was measured by a strain gauge. The internal strain of SHY685 of 5 mm thickness could be evaluated using white X-rays which range of energy from 60 keV to 150 keV. Furthermore, the measurement error of strain could be decreased by using the diffracted X-rays with high energy, high peak count and the profile which is close to Gaussian curve. The results showed that the high energy white X-ray is effective for internal strain measurements.

Journal Articles

Strain measurements using high energy white X-rays at SPring-8

Shobu, Takahisa; Kaneko, Hiroshi; Mizuki, Junichiro; Konishi, Hiroyuki; Shibano, Junichi*; Hirata, Tomoyuki*; Suzuki, Kenji*

AIP Conference Proceedings 879, p.1581 - 1585, 2007/01

The third generation synchrotron X-ray source such as SPring-8 provides us intense beams of high energy X-rays. The techniques of non-destructive internal residual stress measurement for industrial applications are well established by angle dispersive diffractometry with high energy synchrotron radiation and provide valuable information. The energy dispersive diffraction techniques using white radiation is the advantage of a stress measurement compared with the angular dispersive one. For example, the multitudes of reflections recorded in one spectrum offers additional information that can be used for stress gradient evaluation. The purpose of present study is to apply high energy white X-rays to the measurement of the residual strain in the bulk specimen. The experiment was carried out on the beamline BL14B1 at SPring-8. A diffraction pattern was collected by a Ge Solid State Detector (SSD) mounted on the arm of a 2-axes diffractometer behind two sets of secondary collimating slits. The beam size of white X-rays was 0.05 $$times$$ 0.3 mm$$^{2}$$. The specimens were JIS-S45C carbon steel and JIS-SUS304 austenitic stainless steel with a thickness of 5mm. The bending stress was applied with the four-point bending and the strain at the surface of the specimen was measured by a strain gauge as shown in the figure. X-rays diffraction measurement was carried out simultaneously. The figure shows each diffraction profile of SUS304 taken with white X-rays. The strain was calculated by the ratio of the energy shift to the peak energy. Though many peaks appeared in every measured positions Y, each diffraction pattern depended on the number and the orientation of crystal grains in irradiated volume by X-rays. The calculated strain by using a single peak is depending on peak quality. The accurate internal stress can be obtained with white X-rays by selecting the peak at high energy, high peak counts and close to Gaussian peak profile.

Oral presentation

Study on stress measurement using high energy white synchrotron radiation on BL28B2 at SPring-8

Kiriyama, Koji; Shibano, Junichi*; Hirata, Tomoyuki*; Kajiwara, Kentaro*; Shobu, Takahisa; Suzuki, Kenji*

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